JPH0321462A - Thermal head substrate and production thereof - Google Patents
Thermal head substrate and production thereofInfo
- Publication number
- JPH0321462A JPH0321462A JP15769189A JP15769189A JPH0321462A JP H0321462 A JPH0321462 A JP H0321462A JP 15769189 A JP15769189 A JP 15769189A JP 15769189 A JP15769189 A JP 15769189A JP H0321462 A JPH0321462 A JP H0321462A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- electrode body
- film
- lower electrode
- body layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 23
- 238000004519 manufacturing process Methods 0.000 title description 5
- 239000002184 metal Substances 0.000 claims abstract description 14
- 238000005530 etching Methods 0.000 claims abstract description 8
- 239000000463 material Substances 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000004020 conductor Substances 0.000 abstract description 8
- 238000010438 heat treatment Methods 0.000 abstract description 6
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract description 3
- 238000001312 dry etching Methods 0.000 abstract description 3
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 3
- 229910017604 nitric acid Inorganic materials 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 2
- XMPZTFVPEKAKFH-UHFFFAOYSA-P ceric ammonium nitrate Chemical compound [NH4+].[NH4+].[Ce+4].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O XMPZTFVPEKAKFH-UHFFFAOYSA-P 0.000 description 2
- VNNRSPGTAMTISX-UHFFFAOYSA-N chromium nickel Chemical compound [Cr].[Ni] VNNRSPGTAMTISX-UHFFFAOYSA-N 0.000 description 2
- 229910052681 coesite Inorganic materials 0.000 description 2
- 229910052906 cristobalite Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910001120 nichrome Inorganic materials 0.000 description 2
- VLTRZXGMWDSKGL-UHFFFAOYSA-N perchloric acid Chemical compound OCl(=O)(=O)=O VLTRZXGMWDSKGL-UHFFFAOYSA-N 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229910052682 stishovite Inorganic materials 0.000 description 2
- 229910052905 tridymite Inorganic materials 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Landscapes
- Electronic Switches (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はサーマルヘッド基板およびその製造方法に関し
、特に電極体の膜構或に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a thermal head substrate and a method for manufacturing the same, and particularly to the film structure of an electrode body.
サーマルヘッド基板は、一般に絶縁基板上に抵抗体や、
それに接続する金属配線パターンを膜技術で形成してい
る.
第4図(a)及び(b)は従来のサーマルヘッド基板の
一例の電極構造の一部の平面図及びA−A’線断面図で
ある。A thermal head board generally has a resistor on an insulating board,
The metal wiring pattern connected to it is formed using film technology. FIGS. 4(a) and 4(b) are a plan view and a sectional view taken along the line AA' of a part of the electrode structure of an example of a conventional thermal head substrate.
サーマルヘッド基板は、グレーズドアルミナ基板1上に
抵抗体層2が設けられ、この表面両端に接続して電力を
供給するための電極体14a,14bが設けられている
。The thermal head substrate has a resistor layer 2 provided on a glazed alumina substrate 1, and electrode bodies 14a and 14b connected to both ends of this surface for supplying power.
電極体14a,14bがエッチング除去された抵抗体層
2の領域は発熱部3となる。The region of the resistor layer 2 from which the electrode bodies 14a and 14b have been etched away becomes the heat generating portion 3.
発熱部3と電極体14a,14bの表面には耐摩耗層1
7が設けられている。A wear-resistant layer 1 is provided on the surfaces of the heat generating part 3 and the electrode bodies 14a and 14b.
7 is provided.
上述した従来のサーマルへ,ド基板を用いて印字を行う
場合、発熱部3が感熱紙8を介してプラテン9に押しつ
けられる。When printing is performed using the conventional thermal substrate described above, the heat generating section 3 is pressed against the platen 9 via the thermal paper 8.
この種のサーマルヘッド基板に於いては、電極体14a
,14bの厚み分だけドット状の発熱部l3が下方に位
置しているので、リード状の電極体14a,14bの発
熱部3近傍の左右端縁Pが感熱紙8に接触し、発熱部3
が確実に感熱8紙に接触しないおそれがあり、十分な印
字濃度が得られない場合が生じる.
また、無理な力が電極体14a,14bの左右端縁に付
加される結果、耐摩耗層17が電極耐の左右端部Pに於
いて引き剥がされるおそれもある。In this type of thermal head substrate, the electrode body 14a
, 14b, the dot-shaped heat-generating portion l3 is located below, so that the left and right edges P of the lead-shaped electrode bodies 14a, 14b near the heat-generating portion 3 come into contact with the thermal paper 8, and the heat-generating portion 3
There is a risk that the paper may not come into contact with the thermosensitive paper, and sufficient print density may not be obtained. Moreover, as a result of applying excessive force to the left and right edges of the electrode bodies 14a and 14b, there is a possibility that the wear-resistant layer 17 may be peeled off at the left and right edges P of the electrode bodies.
このおそれをなくすため電極体の膜厚を薄くすれば良い
が、膜厚は電極体の導体抵抗値の増加を最小限に保つ必
要があるので、薄くするには限界がある。In order to eliminate this fear, the film thickness of the electrode body can be reduced, but there is a limit to how thin the film thickness can be because it is necessary to keep the increase in the conductor resistance value of the electrode body to a minimum.
本発明のサーマルヘッド基板は、絶縁基板の表面に形成
されかつ一部に発熱部を有する抵抗体層と、前記発熱部
以外の前記抵抗体層の表面に形成された下電極体層と、
前記発熱部を含みその周縁部を除いて、前記下電極体層
の上に形成された上電極体層とを有して構或されている
。The thermal head substrate of the present invention includes: a resistor layer formed on the surface of an insulating substrate and having a heat generating part in a part; a lower electrode layer formed on the surface of the resistor layer other than the heat generating part;
An upper electrode body layer is formed on the lower electrode body layer, including the heat generating part and excluding the peripheral edge thereof.
また本発明のサーマルヘッド基板の製造方法は、絶縁基
板上に抵抗体層を形成後、下電極体層と選択エッチング
可能な中間金属層と前記下電極体層と同材質からなる上
電極体層を順次積層して形成し、次に前記抵抗体層の一
部の発熱部を含み該発熱部領域の面積よりも広い面積に
わたって前記上電極体層をエッチング除去し、次に中間
金属層をエッチング除去した後、前記下電極体層と前記
抵抗体層とからなる導体回路を形成し、次に前記発熱部
表面の前記下電極体層を除去する工程とを有している,
〔実施例〕
第1図(a)及び(b)は本発明の第1の実施例の導体
配置を示す部分平面図及びA−A’線断面図、第2図(
a)〜(e)は第1図のサーマAtへ,ド基板の電極体
構造及びその製造方法を説明するための工程順に示した
仕掛基板の断面図である。Further, in the method for manufacturing a thermal head substrate of the present invention, after forming a resistor layer on an insulating substrate, an intermediate metal layer that can be selectively etched with a lower electrode layer, and an upper electrode layer made of the same material as the lower electrode layer. are sequentially laminated, and then the upper electrode layer is etched away over an area larger than the area of the heat generating part including part of the heat generating part of the resistor layer, and then the intermediate metal layer is etched. After the removal, a conductive circuit including the lower electrode layer and the resistor layer is formed, and then the lower electrode layer on the surface of the heat generating part is removed. [Example] 1(a) and 1(b) are a partial plan view and a cross-sectional view taken along the line A-A' of the first embodiment of the present invention, and FIG.
1A to 1E are cross-sectional views of the in-process substrate shown in the order of steps for explaining the electrode structure of the substrate and its manufacturing method for the Therma At shown in FIG. 1;
まず、第2図(a)に示すように、グレーズドアルミナ
基板1上に抵抗体層2としてT.Si02膜を約0.1
〜0.2μm厚に或膜し次に下電極体層4としてAIl
膜を約0.3μm厚に成膜後、中間金属層5としてT.
SiO2約0. 1 〜0. 2 p m厚に或膜後、
更に上電極体層6として、AA膜を約0.7μm厚にそ
れぞれスパッタリング法により或膜する.次に第2図(
b)に示すように、ホトレジスト処理技術によりA[膜
の上電極体層6の一部として発熱領域3.含みかつその
面積よりも広い面積をリン酸と硝酸系のエッチャントで
エッチング除去してT.SiOz膜の中間金属層5の露
出した上電極体層6のAAパターンを形成する。First, as shown in FIG. 2(a), a T.sub.2 resistor layer 2 is formed on a glazed alumina substrate 1. Si02 film about 0.1
A film was formed to a thickness of ~0.2 μm, and then an Al film was formed as the lower electrode body layer 4.
After forming the film to a thickness of approximately 0.3 μm, T.
SiO2 approx. 0. 1 ~ 0. After coating to a thickness of 2 pm,
Further, as the upper electrode body layer 6, an AA film having a thickness of approximately 0.7 μm is formed by sputtering. Next, Figure 2 (
As shown in b), a photoresist processing technique is used to form a heating region 3. The area including the T.I. An AA pattern of the exposed upper electrode body layer 6 of the intermediate metal layer 5 of the SiOz film is formed.
次に第2図(C)に示すように、02+CF4ガスを用
いたドライエッチングを行い、T a S iO 2膜
の中関金属層5を除去する。Next, as shown in FIG. 2C, dry etching is performed using 02+CF4 gas to remove the Nakaseki metal layer 5 of the TaSiO2 film.
このときT a S iO 2膜は下電極体M4である
Ai+膜と上電極体層6であるAβ膜を選択分離する。At this time, the T a SiO 2 film selectively separates the Ai+ film, which is the lower electrode body M4, and the Aβ film, which is the upper electrode body layer 6.
次に第2図(d)に示すように、Ano下電極体層4の
一部をリン酸と硝酸系のエッチャントでエッチングして
A[のパターンを形成し、続いてその下の抵抗体層2を
フッ酸と硝酸の混合系エッチャントでエッチングして除
去してAA導体パターンを形成する.
L
次に第オ図(e)に示すうように、上述のAn導体パタ
ーン形成後、同様のホトレジスト処理技術により発熱領
域3.部分以外をホトレジストでマスキングして、リン
酸と硝酸系のエッチャントで除去し発熱部3を形成する
。Next, as shown in FIG. 2(d), a part of the Ano lower electrode body layer 4 is etched with a phosphoric acid and nitric acid-based etchant to form a pattern A[, and then the resistor layer underneath is etched. 2 is removed by etching with a mixed etchant of hydrofluoric acid and nitric acid to form an AA conductor pattern. Next, as shown in FIG. The heat generating part 3 is formed by masking other parts with photoresist and removing it with a phosphoric acid and nitric acid based etchant.
最後に第1図(b)に示すように、発熱部3下電極体層
4.、4,及び上電極体層の6から形成した共通電極6
0個別電極体6,の表面を耐摩耗層7で覆い、サーマル
ヘッド基板が出来上がる。Finally, as shown in FIG. 1(b), the heating section 3 lower electrode body layer 4. , 4, and a common electrode 6 formed from 6 of the upper electrode body layer.
The surface of the individual electrode body 6 is covered with a wear-resistant layer 7, and a thermal head substrate is completed.
第1図(a) , (b)に示すように、サーマルヘッ
ド基板は、抵抗耐層2の発熱部3に通電するための導体
回路10が中間金属層5,をはさんで重膜となっており
、更に抵抗体層2上の発熱部3側の電極体の端縁が二段
構造になている。As shown in FIGS. 1(a) and 1(b), in the thermal head substrate, a conductor circuit 10 for energizing the heat generating part 3 of the resistance layer 2 is formed into a heavy film with an intermediate metal layer 5 sandwiched therebetween. Further, the edge of the electrode body on the heat generating part 3 side on the resistor layer 2 has a two-stage structure.
この様に導体抵抗値を最小限に保ちながら、発熱部3近
傍の電極耐膜厚を下電極体層の1段にして薄くする事に
より、発熱部3と感熱紙8を介したプラテンローラー9
が充分接触でき十分な印字導体配置を示す平面図及びA
−A’線断面図である。In this way, while keeping the conductor resistance value to a minimum, the electrode film resistance near the heat generating part 3 is made thinner by making it one step of the lower electrode body layer.
A plan view showing a sufficient printed conductor arrangement that allows sufficient contact with the
-A' line sectional view.
第3図(a)に示すように、下電極体層4としてAA膜
を約1.0μm厚、中間金属層2として、N i C
r膜を約0. 1μm厚、上電極体層6としてAj7膜
を約3.0μm厚を形成後、共通電極耐6.のみを中間
金属層5,のN i C rをはさんだ下電極体層4,
のAf[と共通電極体6,のA{膜の重膜としたもので
ある。As shown in FIG. 3(a), an AA film with a thickness of about 1.0 μm is used as the lower electrode body layer 4, and a NiC film is used as the intermediate metal layer 2.
r film to about 0. After forming an Aj7 film with a thickness of 1 μm and a thickness of about 3.0 μm as the upper electrode body layer 6, the common electrode resistance was 6.0 μm. Only the intermediate metal layer 5, the lower electrode body layer 4 sandwiching N i Cr,
Af[ of the common electrode body 6 and A{of the common electrode body 6 are made of a heavy film.
製造プロセスは第一の実施例と同様であるが、NiCr
膜のエッチング液として、硝酸第2セリウムアンモンと
過塩素酸の混合液を用いてAn膜との選択エッチングを
行う。The manufacturing process is similar to the first example, but NiCr
Selective etching with respect to the An film is performed using a mixed solution of ceric ammonium nitrate and perchloric acid as a film etching solution.
この実施例では発熱部3の周縁の電極体4,,4,の左
右端縁でのプラテンローラとの接触よりも、共通電極部
の導体抵抗値を下げるために共通電極部6.を厚くする
ことを重点におくのに有効である.
また中間金属層5としてNiCrを使用すればドライエ
ッチング装置は不用であり、ウェットエッチングで選択
工,チングが可能であるので簡便である。In this embodiment, in order to lower the conductor resistance value of the common electrode portion, the common electrode portion 6. This is effective in placing emphasis on increasing the thickness of the material. Further, if NiCr is used as the intermediate metal layer 5, a dry etching device is not necessary, and selective etching and etching can be performed by wet etching, which is convenient.
本実施例は、大電流の流れる共通電極体のみを重膜とす
ることで大電流を流した場合にもその電圧降下による基
板の印字位置による印加電圧差を小さくでき、良好な印
字を得る事ができる。In this embodiment, only the common electrode body through which a large current flows is made of a heavy film, so that even when a large current flows, the difference in applied voltage depending on the printing position on the substrate due to the voltage drop can be reduced, and good printing can be obtained. I can do it.
以上説明した本発明は、先ず絶縁基板の表面に形成され
抵抗体層20発熱部以外の表面に下電極体層を設け、発
熱部を含みそれよりも大きい領域を除いて下電極体層の
表面に上電極体層を設け、発熱部周縁の電極体を二段構
造にしてプラテンローラと発熱部との耐摩耗層を介する
接触を良好ならしめる効果がある。In the present invention as described above, first, a lower electrode layer is formed on the surface of an insulating substrate, and a lower electrode layer is provided on the surface of the resistor layer 20 other than the heat generating portion, and the surface of the lower electrode layer is An upper electrode body layer is provided on the heat generating part, and the electrode body on the periphery of the heat generating part has a two-stage structure, which has the effect of making good contact between the platen roller and the heat generating part via the wear-resistant layer.
7・・・・・・耐摩耗層、8感熱紙、9・・・・・・プ
ラテンローラ、10・・・・・・導体回路。7... Abrasion resistant layer, 8 Thermal paper, 9... Platen roller, 10... Conductor circuit.
Claims (2)
する抵抗体層と、前記発熱部以外の前記抵抗体層の表面
に形成された下電極体層と、前記発熱部を含みその周縁
部を除いて、前記下電極体層の上に形成された上電極体
層とを有することを特徴とするサーマルヘッド基板。(1) A resistor layer formed on the surface of an insulating substrate and having a heat generating part in a part, a lower electrode layer formed on the surface of the resistor layer other than the heat generating part, and a lower electrode layer including the heat generating part. A thermal head substrate comprising an upper electrode body layer formed on the lower electrode body layer except for the peripheral portion.
択エッチング可能な中間金属層と前記下電極体層と同材
質からなる上電極体層を順次積層して形成し、次に前記
抵抗体層の一部の発熱部を含み該発熱部領域の面積より
も広い面積にわたって前記上電極体層をエッチング除去
し、次に中間金属層をエッチング除去した後、前記下電
極体層と前記抵抗体層とからなる導体回路を形成し、次
に前記発熱部表面の前記下電極体層を除去する工程とを
含むことを特徴とするサーマルヘッド基板の製造方法。(2) After forming a resistor layer on an insulating substrate, a lower electrode layer, an intermediate metal layer that can be selectively etched, and an upper electrode layer made of the same material as the lower electrode layer are sequentially laminated, and then The upper electrode body layer is etched away over an area larger than the area of the heat generating part region including a part of the heat generating part of the resistor layer, and then the intermediate metal layer is etched away, and then the lower electrode body layer is removed by etching. and the resistor layer, and then removing the lower electrode layer on the surface of the heat generating part.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15769189A JPH0321462A (en) | 1989-06-19 | 1989-06-19 | Thermal head substrate and production thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15769189A JPH0321462A (en) | 1989-06-19 | 1989-06-19 | Thermal head substrate and production thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0321462A true JPH0321462A (en) | 1991-01-30 |
Family
ID=15655278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15769189A Pending JPH0321462A (en) | 1989-06-19 | 1989-06-19 | Thermal head substrate and production thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0321462A (en) |
-
1989
- 1989-06-19 JP JP15769189A patent/JPH0321462A/en active Pending
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