JPH0319933U - - Google Patents
Info
- Publication number
- JPH0319933U JPH0319933U JP5671689U JP5671689U JPH0319933U JP H0319933 U JPH0319933 U JP H0319933U JP 5671689 U JP5671689 U JP 5671689U JP 5671689 U JP5671689 U JP 5671689U JP H0319933 U JPH0319933 U JP H0319933U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- fabry
- perot etalon
- photodetector
- separating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010521 absorption reaction Methods 0.000 claims description 9
- 239000004065 semiconductor Substances 0.000 claims description 9
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims description 7
- 238000010408 sweeping Methods 0.000 claims description 5
- 230000010355 oscillation Effects 0.000 claims 3
- 238000000926 separation method Methods 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
Landscapes
- Spectrometry And Color Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989056716U JPH0740181Y2 (ja) | 1989-03-30 | 1989-05-17 | レーザ周波数特性測定装置並びに核装置を利用した可変周波数光源 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1-37147 | 1989-02-16 | ||
| JP3714789 | 1989-03-30 | ||
| JP1989056716U JPH0740181Y2 (ja) | 1989-03-30 | 1989-05-17 | レーザ周波数特性測定装置並びに核装置を利用した可変周波数光源 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0319933U true JPH0319933U (US07652168-20100126-C00068.png) | 1991-02-27 |
| JPH0740181Y2 JPH0740181Y2 (ja) | 1995-09-13 |
Family
ID=31717793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989056716U Expired - Lifetime JPH0740181Y2 (ja) | 1989-03-30 | 1989-05-17 | レーザ周波数特性測定装置並びに核装置を利用した可変周波数光源 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0740181Y2 (US07652168-20100126-C00068.png) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004004080A (ja) * | 2002-05-24 | 2004-01-08 | Tektronix Inc | 掃引波長計及び波長校正方法 |
| JP4722110B2 (ja) * | 2001-01-30 | 2011-07-13 | ソルラブス、 インコーポレイテッド | 掃引レーザ用波長校正装置及び方法 |
| JP2017049253A (ja) * | 2015-09-02 | 2017-03-09 | サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー | レーザ吸収分光計のレーザ動作点の最適化 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS48100138A (US07652168-20100126-C00068.png) * | 1972-03-31 | 1973-12-18 | ||
| JPS5812385A (ja) * | 1981-06-26 | 1983-01-24 | Fujitsu Ltd | 波長可変レーザを用いたガス分析装置 |
| JPS60140141A (ja) * | 1983-12-27 | 1985-07-25 | Fujitsu Ltd | 光ガスセンサ |
| JPS62198723A (ja) * | 1986-02-26 | 1987-09-02 | Yokogawa Electric Corp | 可変波長光源 |
-
1989
- 1989-05-17 JP JP1989056716U patent/JPH0740181Y2/ja not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS48100138A (US07652168-20100126-C00068.png) * | 1972-03-31 | 1973-12-18 | ||
| JPS5812385A (ja) * | 1981-06-26 | 1983-01-24 | Fujitsu Ltd | 波長可変レーザを用いたガス分析装置 |
| JPS60140141A (ja) * | 1983-12-27 | 1985-07-25 | Fujitsu Ltd | 光ガスセンサ |
| JPS62198723A (ja) * | 1986-02-26 | 1987-09-02 | Yokogawa Electric Corp | 可変波長光源 |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4722110B2 (ja) * | 2001-01-30 | 2011-07-13 | ソルラブス、 インコーポレイテッド | 掃引レーザ用波長校正装置及び方法 |
| JP2004004080A (ja) * | 2002-05-24 | 2004-01-08 | Tektronix Inc | 掃引波長計及び波長校正方法 |
| JP4667728B2 (ja) * | 2002-05-24 | 2011-04-13 | ソルラブス、 インコーポレイテッド | 掃引波長計及び波長校正方法 |
| JP2017049253A (ja) * | 2015-09-02 | 2017-03-09 | サーモ フィッシャー サイエンティフィック （ブレーメン） ゲーエムベーハー | レーザ吸収分光計のレーザ動作点の最適化 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0740181Y2 (ja) | 1995-09-13 |
