JPH0317093B2 - - Google Patents
Info
- Publication number
- JPH0317093B2 JPH0317093B2 JP57157587A JP15758782A JPH0317093B2 JP H0317093 B2 JPH0317093 B2 JP H0317093B2 JP 57157587 A JP57157587 A JP 57157587A JP 15758782 A JP15758782 A JP 15758782A JP H0317093 B2 JPH0317093 B2 JP H0317093B2
- Authority
- JP
- Japan
- Prior art keywords
- electric field
- ion
- ions
- mass spectrometry
- precursor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 150000002500 ions Chemical class 0.000 claims description 76
- 230000005684 electric field Effects 0.000 claims description 30
- 239000002243 precursor Substances 0.000 claims description 23
- 238000004949 mass spectrometry Methods 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 description 10
- 238000001228 spectrum Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 6
- 238000004885 tandem mass spectrometry Methods 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- 238000001819 mass spectrum Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 102100027340 Slit homolog 2 protein Human genes 0.000 description 2
- 101710133576 Slit homolog 2 protein Proteins 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010408 sweeping Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57157587A JPS5946550A (ja) | 1982-09-09 | 1982-09-09 | 質量分析装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57157587A JPS5946550A (ja) | 1982-09-09 | 1982-09-09 | 質量分析装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5946550A JPS5946550A (ja) | 1984-03-15 |
| JPH0317093B2 true JPH0317093B2 (cs) | 1991-03-07 |
Family
ID=15652959
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57157587A Granted JPS5946550A (ja) | 1982-09-09 | 1982-09-09 | 質量分析装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5946550A (cs) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62274544A (ja) * | 1986-05-15 | 1987-11-28 | フィソンス・ピーエルシー | 二重集中質量分析計 |
| JP2616970B2 (ja) * | 1988-07-15 | 1997-06-04 | 日本電子株式会社 | Ｍｓ／ｍｓ装置 |
| US8048086B2 (en) * | 2004-02-25 | 2011-11-01 | Femasys Inc. | Methods and devices for conduit occlusion |
-
1982
- 1982-09-09 JP JP57157587A patent/JPS5946550A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5946550A (ja) | 1984-03-15 |
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