JPH03170006A - Testing method for multilayer printed wiring board - Google Patents

Testing method for multilayer printed wiring board

Info

Publication number
JPH03170006A
JPH03170006A JP30984589A JP30984589A JPH03170006A JP H03170006 A JPH03170006 A JP H03170006A JP 30984589 A JP30984589 A JP 30984589A JP 30984589 A JP30984589 A JP 30984589A JP H03170006 A JPH03170006 A JP H03170006A
Authority
JP
Japan
Prior art keywords
printed wiring
wiring board
multilayer printed
marks
deviation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP30984589A
Other languages
Japanese (ja)
Inventor
Nobuyuki Minami
宣行 南
Masaki Tamamizu
玉水 雅樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP30984589A priority Critical patent/JPH03170006A/en
Publication of JPH03170006A publication Critical patent/JPH03170006A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/46Manufacturing multilayer circuits
    • H05K3/4611Manufacturing multilayer circuits by laminating two or more circuit boards
    • H05K3/4638Aligning and fixing the circuit boards before lamination; Detecting or measuring the misalignment after lamination; Aligning external circuit patterns or via connections relative to internal circuits

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

PURPOSE:To detect the deviation and the direction of each printed wiring board with respect to a set reference layer without a counterbore by projecting marks for measuring the sizes of respective printed wiring boards en bloc by an X-ray projector and measuring the size. CONSTITUTION:The mark 1 for measuring the size is provided on the printed wiring board 2 before it is laminated and stuck. The marks for measuring the size 3-8 having different shapes respectively are provided on six printed wiring boards 2. By projecting the multilayer printed wiring board with an X-ray, the synthesized pattern image of the marks 3-8 is obtained. A reference layer is set by using the synthesized pattern so as to measure the magnitude of deviation 9 and 10 with respect to the reference layer. Thus, the deviation between the layers of the multilayer printed wiring board is accurately quantitively obtained without the counterbore.

Description

【発明の詳細な説明】 (産業」二の利用分野) 本発明は、多層プリント配線板の試験方法、特に積層接
着時の層間ずれ量を求めるのに適した多層プリント配線
板の試験方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Application in Industry) The present invention relates to a method for testing multilayer printed wiring boards, and particularly to a testing method for multilayer printed wiring boards suitable for determining the amount of interlayer deviation during lamination and bonding.

(従来技術) 従来の多層プリント配線板の試験方法として、特開昭5
6−30793号公報に示されるように多層プリント配
線板に位置ずれ検出用パターンを設け、該銅箭パターン
間の静電容量を測定することにより層間位置ずれ竜を検
出する方法が知られているが、この方法ではずれの方向
がわからなかった。また、特開昭62−86795号に
示された方法では、ずれ量と方向はわかるが寸法測定用
マークを座ぐり出さねばならず手間がかかった。
(Prior art) As a conventional test method for multilayer printed wiring boards,
As shown in Japanese Patent No. 6-30793, there is a known method of detecting interlayer misalignment by providing misalignment detection patterns on a multilayer printed wiring board and measuring the capacitance between the copper wire patterns. However, with this method, the direction of the deviation could not be determined. Further, in the method disclosed in Japanese Patent Application Laid-open No. 62-86795, although the amount and direction of deviation can be determined, it is necessary to counterbore the dimension measurement mark, which is time-consuming.

(発明が解決しようとする課題) 本発明は、多層プリント配線板の層間ずれ量を座ぐりな
しで定量的に得られる多層プリント配線板の試験方法を
提供するものである。
(Problems to be Solved by the Invention) The present invention provides a method for testing a multilayer printed wiring board that can quantitatively determine the amount of interlayer misalignment of the multilayer printed wiring board without counterboring.

《課題を解決するための手段} 本発門は(a)各プリント配線板の同一位置にそれぞれ
形状または大きさの異なる寸法測定用のマークを設ける
工程と、(b)マークの設けられたプリント配線板を積
層接着する工程と、(c)プリント基板はそのままでX
線投影機により該マークを一括投影寸法測定を行い各プ
リント配線板の層間ずれ量を求める工程とを有すること
を特徴とするものである。
《Means for solving the problem》 The present invention consists of (a) the process of providing dimensional measurement marks of different shapes or sizes at the same position on each printed wiring board; and (b) the process of placing marks on the printed circuit board on which the marks are provided. (c) The process of laminating and bonding the wiring boards, and (c)
This method is characterized by comprising the step of projecting the marks all at once using a line projector and measuring the dimensions to determine the amount of interlayer misalignment of each printed wiring board.

《作用) 本発門の方法においては、各プリント配線板の寸法測定
用マークを、X線投影機によって一括投影寸法測定する
ことにより、設定基準層に対する各プリント配線板のず
れ量および方向を座ぐりなしで検出できるようになる。
<<Operation>> In the method of this invention, the amount and direction of deviation of each printed wiring board with respect to the set reference layer can be calculated by projecting the dimension measurement marks on each printed wiring board at once using an X-ray projector. It becomes possible to detect without drilling.

(実施例の説Iv1) 以下、本発明の一実施例について図面を用いて説門する
(Description of Embodiment Iv1) Hereinafter, one embodiment of the present invention will be explained using the drawings.

第1図は本実施例で川いる積層接着前のプリント配線板
2を示し、X−Yは寸法測定の座標系、1は寸法測定用
マークの配置を表わしている。第2図(A)〜(F)は
本実施例で用いる寸法測定用マークを表わしており、6
枚のプリント配線板にそれぞれ形状の異なる寸法測定用
マーク3〜8を設ける。これら6枚のプリント配線板を
積層接着し多層プリント配線板を作製する。この多層プ
リント配線板をX線で投影したときの寸法測定用マーク
の一例を第3図に示す。このようにして得られた合戊パ
ターンを用い基準層を設定し、それに対してのずれ量9
,10を寸法測定する。
FIG. 1 shows the printed wiring board 2 of this embodiment before lamination and adhesion, where X-Y represents the coordinate system for dimension measurement, and 1 represents the arrangement of dimension measurement marks. FIGS. 2(A) to 2(F) show the dimension measurement marks used in this example.
Dimensional measurement marks 3 to 8 having different shapes are provided on each printed wiring board. These six printed wiring boards are laminated and bonded to produce a multilayer printed wiring board. FIG. 3 shows an example of a mark for dimension measurement when this multilayer printed wiring board is projected with X-rays. Using the composite pattern obtained in this way, a reference layer is set, and the amount of deviation from it is 9.
, 10 are measured.

本実施例により、多層プリント配線板の層間ずれはを座
ぐりなしで定量的にしかも精度よく求めることができる
According to this embodiment, the interlayer misalignment of a multilayer printed wiring board can be determined quantitatively and accurately without counterbore.

《発明の効果》 以上述べたように本発明によれば、基準のプリント配線
板に対して各プリント配線板のずれ量と方向を座ぐりな
しで容易にかつ定量的に評価できるという効果がある。
<<Effects of the Invention>> As described above, according to the present invention, there is an effect that the amount and direction of deviation of each printed wiring board with respect to a reference printed wiring board can be easily and quantitatively evaluated without counterboring. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例に係る寸法測定用マークの位置
を示す斜視図、第2図(A)〜(F)は本発叩の実施例
に用いられる寸法測定用マークの平面図、第3図は本発
明の実施例に係る多層プリント配線板の寸法測定用パタ
ーンをX線にて投影した平面図である。 符号の説明 1・・・寸法測定用パターン位置 2・・・積層接着前プリント配線板 3・・・寸法測定用マーク 4・・・同上 5・・・1言LL 6・・・同]二 7・・・同−1二 8・・・同」二 9・・・Y方向ずれ量 10・・・X方向ずれ量
FIG. 1 is a perspective view showing the position of the dimension measurement mark according to the embodiment of the present invention, and FIGS. 2(A) to (F) are plan views of the dimension measurement mark used in the embodiment of the present punching. FIG. 3 is a plan view of a dimension measurement pattern of a multilayer printed wiring board according to an embodiment of the present invention projected by X-rays. Explanation of symbols 1...Dimension measurement pattern position 2...Printed wiring board before lamination and adhesion 3...Dimension measurement mark 4...Same as above 5...1 word LL 6...Same] 27 ...Same-128...Same'29...Y-direction deviation amount 10...X-direction deviation amount

Claims (1)

【特許請求の範囲】 1、複数のプリント配線板が積層接着される多層プリン
ト配線板の各プリント配線板の層間ずれ量を求める試験
方法において、 (a)前記各プリント配線板の同一位置にそれぞれ形状
または大きさの異なる寸法測定用のマークを設ける工程
と、 (b)前記マークの設けられたプリント配線板を積層接
着する工程と、 (c)前記プリント配線板はそのままでX線投影機によ
り前記マークを一括投影寸法測定を行い各プリント配線
板の層間ずれ量を求める工程とを有することを特徴とす
る多層プリント配線板の試験方法。
[Claims] 1. In a test method for determining the amount of interlayer deviation of each printed wiring board of a multilayer printed wiring board in which a plurality of printed wiring boards are laminated and bonded, (b) laminating and bonding the printed wiring boards with the marks provided thereon; and (c) applying the printed wiring boards as they are to an X-ray projector. A method for testing a multilayer printed wiring board, comprising the step of performing a collective projection dimension measurement of the marks to determine the amount of interlayer misalignment of each printed wiring board.
JP30984589A 1989-11-29 1989-11-29 Testing method for multilayer printed wiring board Pending JPH03170006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30984589A JPH03170006A (en) 1989-11-29 1989-11-29 Testing method for multilayer printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30984589A JPH03170006A (en) 1989-11-29 1989-11-29 Testing method for multilayer printed wiring board

Publications (1)

Publication Number Publication Date
JPH03170006A true JPH03170006A (en) 1991-07-23

Family

ID=17997976

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30984589A Pending JPH03170006A (en) 1989-11-29 1989-11-29 Testing method for multilayer printed wiring board

Country Status (1)

Country Link
JP (1) JPH03170006A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102291949A (en) * 2010-06-18 2011-12-21 富葵精密组件(深圳)有限公司 Manufacturing method of multi-layer circuit board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102291949A (en) * 2010-06-18 2011-12-21 富葵精密组件(深圳)有限公司 Manufacturing method of multi-layer circuit board

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