JPH03141658A - Detection of floating of lead of surface-mounting type ic element - Google Patents

Detection of floating of lead of surface-mounting type ic element

Info

Publication number
JPH03141658A
JPH03141658A JP28085889A JP28085889A JPH03141658A JP H03141658 A JPH03141658 A JP H03141658A JP 28085889 A JP28085889 A JP 28085889A JP 28085889 A JP28085889 A JP 28085889A JP H03141658 A JPH03141658 A JP H03141658A
Authority
JP
Japan
Prior art keywords
lead
contact
floating
liquid
leads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP28085889A
Other languages
Japanese (ja)
Inventor
Hisashi Mochida
久 持田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP28085889A priority Critical patent/JPH03141658A/en
Publication of JPH03141658A publication Critical patent/JPH03141658A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To facilitate the discrimination of the floating of a lead on the surface of a liquid or solidlike material whose contact surface is selectively deformed due to the contact of the lead, by optically detecting the deformation of a contact surface due to the contact of the lead. CONSTITUTION:A required surface-mounting type IC element 4 is supported approximately horizontally. A lead 5 is made to face or brought into contact with the surface of a liquid 14 which is contained in a cell 10a of a transparent container 10. When the lead 5 is floated by the contact, the surface tension is not applied on this part since the tip side of the lead 5 is separated from the liquid 14. Therefore, a lower sloped part 14a is not formed at a corresponding boundary surface. Therefore, this state is picked up with a TV camera 11, and the image is processed in an image processing device 12. Thus it can be decided that the lead is not normal.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は面実装型IC素子のリード浮き検出方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a method for detecting floating leads of a surface-mounted IC element.

(従来の技術) たとえばQFPパッケージIC素子などの面実装型IC
素子を配線基板に搭載・実装して、回路構成ないし回路
部品の小形化を図ることが行われている。ところで、前
記QFPパッケージIC素子などの配線基板面に対する
搭載・実装(マウント)は、一般に第6図(a) 、 
(b)にその実施態様を模式的に示すように行われてい
る。すなわち、配線基板1の所定領域面に設けられてい
る所要のパッド2面上に、たとえば半田ペースト3を印
刷法などにより被着しておき、QFPパッケージIC素
子4を位置決め(リード5の位置決めも含む)配置した
後、半田ペースト3のリフローによってリード5を所定
のパッド2面上に半田付けし、マウントしている。しか
して、上:己QFPパッケージIC素子4のマウントに
おいて、マウントすべきQFPパッケージIC素子4の
リード5が浮いていると、第7図に示すように、マウン
トしたQFPパッケージIC素子4のリード5が、所定
のパッド2面上に確実に半田付けし得ない場合が起る。
(Prior art) Surface-mounted ICs such as QFP package IC elements
BACKGROUND ART Elements are mounted and mounted on wiring boards to reduce the size of circuit configurations or circuit components. By the way, mounting/mounting (mounting) of the QFP package IC element etc. on the wiring board surface is generally performed as shown in FIG. 6(a).
The embodiment is schematically shown in (b). That is, for example, solder paste 3 is applied by printing on the surface of 2 required pads provided on a predetermined region of the wiring board 1, and the QFP package IC element 4 is positioned (also the position of the leads 5 is determined). After the lead 5 is placed on the surface of the predetermined pad 2 by reflowing the solder paste 3, the lead 5 is mounted on the predetermined pad 2 surface. Above: When mounting the own QFP package IC element 4, if the leads 5 of the QFP package IC element 4 to be mounted are floating, as shown in FIG. However, there are cases where it is not possible to reliably solder onto two predetermined pads.

したがって、前記QFPパッケージIC素子などのマウ
ントに当っては、マウントに先立ちQFPパッケージI
C素子のリード浮きの有無を、予め次のような方法で検
出し選別している。
Therefore, when mounting the QFP package IC device, etc., the QFP package I
The presence or absence of floating leads of the C element is detected and selected in advance by the following method.

第一の方法は、第8図に模式的に示すように、ファイバ
ープレート6上に、所定の面実装型IC素子4をほぼ水
平に配置し、これにミラー7で反射させた光を斜め上方
からリード5部に照射して、形成される影によってリー
ド5の浮きを検出する。
The first method, as schematically shown in FIG. The lead 5 is irradiated with light, and lifting of the lead 5 is detected from the shadow formed.

つまり、上記斜め上方からリード5部に光を照射したと
き、浮いているリード5aの影が正常なリード5bの影
よりも短いことを利用してリード5の浮きを検出してい
る。
That is, when the lead 5 is irradiated with light from diagonally above, floating of the lead 5 is detected by utilizing the fact that the shadow of the floating lead 5a is shorter than the shadow of the normal lead 5b.

第2の方法は、第9図に模式的に示すように、レーザ光
の反射でリード5の浮きを検出するものである。すなわ
ち、面実装型IC素子4をほぼ水平に支持し、各リード
5ごとに一端から他端にレーザ光を照射して、その反射
光(反射光が得られる領域ないし長さ)によって浮いて
いるリードの有無を検出・判別する。なお、第9図にお
いて、8はレーザ光出射部、9はレーザ光(反射光)入
射部である。
The second method, as schematically shown in FIG. 9, is to detect floating of the lead 5 by reflection of laser light. That is, the surface-mounted IC element 4 is supported almost horizontally, a laser beam is irradiated from one end to the other end of each lead 5, and the device is made to float by the reflected light (area or length from which the reflected light can be obtained). Detects and determines the presence or absence of a lead. In addition, in FIG. 9, 8 is a laser beam emitting part, and 9 is a laser beam (reflected light) input part.

(発明が解決しようとする課題) しかし、上記リードの浮き検出方法には、次のような不
都合がある。
(Problems to be Solved by the Invention) However, the above lead floating detection method has the following disadvantages.

先ず第一の方法の場合には、リード5の浮きが微少であ
ると影の長さの違いを検出し難いため、判別が困難とな
る。しかも、前記面実装型IC素子4の各リード5の長
さは、バラツキがあるため、リード5長さのバラツキか
リード5の浮きかを区別し得ないという問題がある。
First, in the case of the first method, if the lead 5 is slightly lifted, it is difficult to detect the difference in the length of the shadow, making it difficult to distinguish. Moreover, since the lengths of the leads 5 of the surface-mounted IC element 4 vary, there is a problem that it is impossible to distinguish between variations in the length of the leads 5 and floating leads 5.

一方、第二の方法の場合は、レーサ発振器8、レーザ検
出器9および面実装型IC素子4を水平に支持しながら
X−Y方向に移動させる機構などを要し装置が複雑化な
いし高価格化するという問題がある。しかも、一般にパ
・ンケージIC素子4においては、パッケージ面と延出
されたリード5とが、常に一定の平行度を有していると
は限らないので検出精度も十分とはいい難い。
On the other hand, in the case of the second method, a mechanism for horizontally supporting the laser oscillator 8, laser detector 9, and surface-mounted IC element 4 and moving them in the X-Y directions is required, making the device complicated or expensive. There is a problem of becoming Furthermore, in the packaged IC element 4, the package surface and the extended leads 5 do not always have a certain level of parallelism, so the detection accuracy cannot be said to be sufficient.

本発明は、上記事情に対処してなされたもので、複雑な
いし高価格な装置を用いずとも容易に面実装型IC素子
のリードの浮きを検出・判別し得る方法の提供を目的と
する。
The present invention has been made in response to the above-mentioned circumstances, and it is an object of the present invention to provide a method for easily detecting and determining floating leads of surface-mounted IC elements without using complicated or expensive equipment.

[発明の構成] (課題を解決するための手段) 本発明は、面実装型IC素子のリード接触でその接触部
面が選択的に変形する液体ないし半固体状物面上に、前
記面実装型IC素子のリードが接するように面実装型I
C素子をほぼ水平に支持し、前記リードの接触で生じた
接触部面の変形を光学的に検出して前記リードの浮きの
有無を判別することを特徴とする。
[Structure of the Invention] (Means for Solving the Problems) The present invention provides a surface-mounted IC device on a liquid or semi-solid object surface whose contact portion surface selectively deforms upon contact with a lead of a surface-mounted IC device. Surface mount type I so that the leads of the type IC element are in contact with each other.
The present invention is characterized in that the C element is supported substantially horizontally, and the deformation of the contact surface caused by the contact of the leads is optically detected to determine whether or not the leads are floating.

(作 用) 本発明においては、面実装型IC素子をほぼ水平に支持
してリード部を、液体ないし半固体状物面に接触させる
。このリード部の接触により液体の場合には、その液体
の表面張力によって液体面とリードとの間に接触状態に
対応した裾を生じるので、この裾の生じた状態を光学的
に検出することにより、また半固体状物の場合は、リー
ド部の接触状態に対応して半固体状物面に凹凸が生じる
ので、この生じた凹凸の状態を光学的に検出することに
よりリードの浮き程度などが検出される。
(Function) In the present invention, the surface-mounted IC element is supported substantially horizontally, and the lead portion is brought into contact with the surface of a liquid or semi-solid object. In the case of liquid, due to the contact of the lead part, a skirt is created between the liquid surface and the lead due to the surface tension of the liquid, which corresponds to the contact state. In addition, in the case of a semi-solid object, unevenness occurs on the surface of the semi-solid object depending on the contact state of the lead part, so the degree of floating of the lead can be determined by optically detecting the state of the unevenness. Detected.

(実施例) 以下第1図ないし第4図を参照して本発明の詳細な説明
する。第1図は本発明方法の実施に用いた装置の概略構
成を示めす一部断面図で、10は透明性容器、11は前
記透明性容器上をほぼ水平方向に移動可能に配設された
テレビカメラ、12は前記テレビカメラ11による撮像
を画像処理する装置、13は前記透明性容器上を照射す
る光源である。しかして、前記透明性容器10は被検査
体である面実装型IC素子4のリード5部に対応する領
域に、液体14を所要の深さで収容し得るIel 0 
aを備えており、またこの[10aの内側にはリード5
を載置し、得るよう構成しである。
(Example) The present invention will be described in detail below with reference to FIGS. 1 to 4. FIG. 1 is a partial cross-sectional view showing a schematic configuration of an apparatus used to carry out the method of the present invention, in which 10 is a transparent container, and 11 is a transparent container disposed so as to be movable in a substantially horizontal direction on the transparent container. A television camera, 12 is a device for image processing the image taken by the television camera 11, and 13 is a light source that illuminates the transparent container. Therefore, the transparent container 10 can contain the liquid 14 to a required depth in the region corresponding to the lead 5 portion of the surface-mounted IC device 4 which is the object to be inspected.
a, and there is also a lead 5 inside this [10a].
It is configured so that it can be placed and obtained.

次に上記構成の装置によるリードの浮きを検出する手段
を説明する。所要の面実装型IC素子4、たとえばQF
PパッケージIC素子をほぼ水平に支持して、そのQF
PパッケージIC素子4のリード5部を、前記透明性容
器10のtfl 10 aに収容した液体14面に対接
ないし接触させる。このリード5と液体14而との接触
により、前記り一ド5が正常なときには、第2図(a)
に断面的に、また第2図(b)に平面的にそれぞれ示す
ような状態を呈する。つまり、前記リード5が正常な状
態にあると、リード5の先端側は液体14の表面張力(
付着力)によってそれらの境界面に全体的にWi14a
が形成される。しかして、この状態はテレビカメラ11
により撮像され、画像処理装置12での画像処理によっ
て的確にリードらが正常であると判定し得る。
Next, a means for detecting lead floating using the apparatus having the above configuration will be explained. Required surface mount IC element 4, for example QF
The P package IC element is supported almost horizontally, and its QF
The lead 5 portion of the P package IC element 4 is brought into contact with the surface of the liquid 14 contained in the TFL 10 a of the transparent container 10 . Due to the contact between the lead 5 and the liquid 14, when the lead 5 is normal, as shown in FIG. 2(a).
The state shown in FIG. 2(b) is shown in cross section and in plan view in FIG. 2(b). In other words, when the lead 5 is in a normal state, the surface tension of the liquid 14 (
Wi14a entirely on their interfaces (adhesive force)
is formed. However, in this state, the TV camera 11
The image is captured by the image processor 12, and through image processing, it can be accurately determined that the lead and the like are normal.

一方、リード5に浮きがある場合は、第3図(a)に断
面的に、また第3図(b)に平面的にそれぞれ示すよう
な状態を呈する。つまり、前記リード5が正常でない状
態(浮いている)にあると、リド5の先端側は液体14
と離隔しているためその部分(領域)には表面張力(付
着力)が及ばないので、対応する境界面に裾14aが形
成されない。しかして、この状態はテレビカメラ11に
より撮像され、画像処理装置12での画像処理によって
的確にリード5が正常でないと判定し得る。
On the other hand, if the lead 5 is floating, it will exhibit a state as shown in cross section in FIG. 3(a) and in plan view in FIG. 3(b). In other words, when the lead 5 is in an abnormal state (floating), the tip side of the lead 5 is exposed to the liquid 14.
Since the surface tension (adhesive force) does not reach that portion (region) because it is separated from the surface, the hem 14a is not formed on the corresponding boundary surface. Therefore, this state is imaged by the television camera 11, and through image processing by the image processing device 12, it can be accurately determined that the lead 5 is not normal.

なお、第4図は、上記によりQFPパッケージIC素子
4の一辺に延設されたリード列ついて検出した一例を平
面的に示したものである。
Incidentally, FIG. 4 is a plan view showing an example of the detected lead row extending on one side of the QFP package IC element 4 as described above.

上記では液体を用い、その表面張力を利用してリード5
が正常か浮いているかを検出・判別したが、前記液体の
代りに、たとえばシリコーンゴムゲルなど半固体状物質
を用いても、前記と同様にリード5が正常か浮いている
かを検出・判別し得る。すなわち、第5図に断面的に示
すように表面が平滑化されたシリコーンゴムゲル15面
上に、たとえばQFPパッケージIC素子4をほぼ水平
に支持しながら、そのQFPパッケージIC素子4のリ
ード5部分を一定の圧力で押圧する。このリード5部分
の抑圧によりリード5が正常な場合は、第5図(a)に
断面的に示すようにリード5の先端側を含め、前記シリ
コーンゴムゲル而に対応する窪み(変形)15aが生じ
る。また、リード5が正常でない(浮きがある)場合は
、第5図(b)に断面的に示すように、シリコーンゴム
ゲル15面に対応する窪み(変形)を生じない。このよ
うな変形の有無ないし変形の程度や状態を、たとえばテ
レビカメラにより撮像し、画像処理装置で画像処理する
ことによって的確にリード5が正常であるか否かを判定
し得る。
In the above example, a liquid is used and the lead 5 is
However, even if a semi-solid substance such as silicone rubber gel is used instead of the liquid, it is possible to detect and determine whether the lead 5 is normal or floating in the same way as described above. obtain. That is, as shown in cross section in FIG. 5, while supporting the QFP package IC element 4 almost horizontally on the surface of the silicone rubber gel 15 whose surface is smoothed, the lead 5 portion of the QFP package IC element 4 is placed. Press with constant pressure. If the lead 5 is normal due to this suppression of the lead 5 portion, a depression (deformation) 15a corresponding to the silicone rubber gel is formed, including the tip end side of the lead 5, as shown in cross section in FIG. 5(a). arise. Furthermore, if the lead 5 is not normal (there is some floating), no corresponding depression (deformation) is produced on the surface of the silicone rubber gel 15, as shown in cross section in FIG. 5(b). It is possible to accurately determine whether or not the lead 5 is normal by capturing an image of the presence or absence of such deformation, the degree of deformation, and the state thereof using, for example, a television camera and processing the image using an image processing device.

[発明の効果コ 上記説明したように本発明方法によれば、面実装型IC
素子の横方向に延出した各リードは、液体の表面張力な
いし付着力または半固体状物質の弾性変形を利用し、そ
れらの作用を増幅した形で表現する方式によってリード
の浮き状態など検出される。しかして、上記変形・作用
は増幅して表すことができるため、微少なリード浮きも
十分かつ、高精度に検出できる。しかも、上記増幅した
形での表現は、通常の画像処理技術により容易になし得
るばかりでなく、複雑な処理機構なとも要しないので実
用上多くの利点をもたらすものといえる。
[Effects of the Invention] As explained above, according to the method of the present invention, surface-mounted IC
Each lead extending in the lateral direction of the element uses the surface tension or adhesive force of a liquid or the elastic deformation of a semi-solid material to detect the floating state of the lead by a method that expresses these effects in an amplified form. Ru. Since the above-mentioned deformation and action can be amplified and expressed, even minute lead floating can be detected sufficiently and with high precision. Furthermore, expression in the amplified form can not only be easily achieved using ordinary image processing techniques, but also does not require a complicated processing mechanism, so it can be said to bring about many practical advantages.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明方法の実施に用いた装置の構成例を示す
断面図、第2図〜第5図は本発明に係る方法において面
実装型IC素子のリード浮きを検出した状態を模式的に
示したもので、第2図(a)はリードが正常なときの断
面図、第2図(b)はリードが正常なときの平面図、第
3図(a)はリードが正常でないときの断面図、第3図
(b)はリードが正常でないときの平面図、第4図はリ
ード列の平面図、第5図(a)はリードが正常なときの
断面図、第5図(b)はリードが正常でないときの平面
図、第6図(a) 、 (b)は面実装型IC素子を配
線基板に搭載する状態をそれぞれ示す断面図、第7図は
リード浮きのある面実装型IC素子を配線基板に搭載・
半田付けした状態を示す断面図、第8図および第9図は
それぞれ従来の面実装型IC素子のリード浮き検出方法
の態様を示す模式図である。 1・・・・・・配線基板 2・・・・・・印刷導体ランド 3・・・・・・半田ペースト 4・・・・・・面実装型IC素子 5・・・・・・面実装型IC素子のリード5a・・・・
・・正常でないリード(IV!きかある)5b・・・・
・・正常なリード(浮きがない)10・・・・・・透明
容器 11・・・・・・テレビカメラ 12・・・・・・画像処理装置 13・・・・・・光源 14・・・・・・液体 14a・・・・・・液体が形成した据 15・・・・・・半固体状物 15a・・・・・・半固体状物の変形
FIG. 1 is a cross-sectional view showing an example of the configuration of an apparatus used to carry out the method of the present invention, and FIGS. 2 to 5 schematically show the state in which floating leads of a surface-mounted IC element are detected in the method according to the present invention. Figure 2 (a) is a cross-sectional view when the lead is normal, Figure 2 (b) is a plan view when the lead is normal, and Figure 3 (a) is a cross-sectional view when the lead is not normal. 3(b) is a plan view when the leads are not normal. FIG. 4 is a plan view of the lead row. FIG. 5(a) is a sectional view when the leads are normal. b) is a plan view when the leads are not normal, Figures 6(a) and (b) are cross-sectional views showing the state in which a surface-mounted IC element is mounted on a wiring board, and Figure 7 is a surface with floating leads. Mounting type IC element on wiring board.
A cross-sectional view showing a soldered state, and FIGS. 8 and 9 are schematic diagrams showing aspects of a conventional method for detecting floating leads of a surface-mounted IC element, respectively. 1...Wiring board 2...Printed conductor land 3...Solder paste 4...Surface mount type IC element 5...Surface mount type IC element lead 5a...
・・Unnormal lead (IV! Listening) 5b・・・・
... Normal lead (no floating) 10 ... Transparent container 11 ... Television camera 12 ... Image processing device 13 ... Light source 14 ... ...Liquid 14a...Deformation of the semi-solid object 15a...Semi-solid object formed by the liquid

Claims (1)

【特許請求の範囲】[Claims]  面実装型IC素子のリード接触でその接触部面が選択
的に変形する液体ないし半固体状物面上に、前記面実装
型IC素子のリードが接するように面実装型IC素子を
ほぼ水平に支持し、前記リードの接触で生じた接触部面
変形を光学的に検出して前記リードの浮きの有無を判別
することを特徴とする面実装型IC素子のリード浮き検
出方法。
The surface mount type IC element is placed almost horizontally on a surface of a liquid or semi-solid object whose contact surface is selectively deformed when the lead of the surface mount type IC element contacts. 1. A method for detecting floating leads of a surface-mounted IC element, characterized in that the presence or absence of floating of the leads is determined by optically detecting deformation of a surface of a contact portion caused by the contact of the leads.
JP28085889A 1989-10-26 1989-10-26 Detection of floating of lead of surface-mounting type ic element Pending JPH03141658A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP28085889A JPH03141658A (en) 1989-10-26 1989-10-26 Detection of floating of lead of surface-mounting type ic element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP28085889A JPH03141658A (en) 1989-10-26 1989-10-26 Detection of floating of lead of surface-mounting type ic element

Publications (1)

Publication Number Publication Date
JPH03141658A true JPH03141658A (en) 1991-06-17

Family

ID=17630955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP28085889A Pending JPH03141658A (en) 1989-10-26 1989-10-26 Detection of floating of lead of surface-mounting type ic element

Country Status (1)

Country Link
JP (1) JPH03141658A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107270828A (en) * 2017-07-05 2017-10-20 浙江科技学院 Cytoplasm aligning mechanical distortion measurement method based on microscopic quantity angular image

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107270828A (en) * 2017-07-05 2017-10-20 浙江科技学院 Cytoplasm aligning mechanical distortion measurement method based on microscopic quantity angular image
CN107270828B (en) * 2017-07-05 2019-06-11 浙江科技学院 Cytoplasm aligning mechanical distortion measurement method based on microscopic quantity angular image

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