JPH03128842U - - Google Patents

Info

Publication number
JPH03128842U
JPH03128842U JP40009890U JP40009890U JPH03128842U JP H03128842 U JPH03128842 U JP H03128842U JP 40009890 U JP40009890 U JP 40009890U JP 40009890 U JP40009890 U JP 40009890U JP H03128842 U JPH03128842 U JP H03128842U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP40009890U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPH03128842U publication Critical patent/JPH03128842U/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3148—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59—Transmissivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12723—Self check capacity; automatic, periodic step of checking
JP40009890U 1989-12-06 1990-12-05 Pending JPH03128842U (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19893940386 DE3940386A1 (de) 1989-12-06 1989-12-06 Vorrichtung zum messen der transmission filmartiger folien und dergleichen

Publications (1)

Publication Number Publication Date
JPH03128842U true JPH03128842U (it) 1991-12-25

Family

ID=6394946

Family Applications (1)

Application Number Title Priority Date Filing Date
JP40009890U Pending JPH03128842U (it) 1989-12-06 1990-12-05

Country Status (2)

Country Link
JP (1) JPH03128842U (it)
DE (1) DE3940386A1 (it)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100511367B1 (ko) * 2003-05-12 2005-08-30 주식회사 넥스필 특수 코팅 필름의 파장별 투과율 측정 시스템 및 그 방법
JP2021067457A (ja) * 2019-10-17 2021-04-30 コニカミノルタ株式会社 用紙物性検出装置、用紙情報判別システム、および画像形成システム

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10045645A1 (de) * 2000-09-15 2002-03-28 Bayerische Motoren Werke Ag Vorrichtung zur Qualitätskontrolle bei thermogeformten Kunststoffteilen
DE10326992A1 (de) * 2003-06-12 2005-01-05 Hänsch, Dirk, Dr. Transmissionsmessgerät
JP2021005805A (ja) * 2019-06-26 2021-01-14 パナソニックＩｐマネジメント株式会社 光電センサ、レーザ樹脂溶着における樹脂透過率の測定方法、レーザ樹脂溶着方法、レーザ加工装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60209122A (ja) * 1984-03-29 1985-10-21 Fujitsu Ltd マルチスペクトル光学装置
JPS6189543A (ja) * 1984-09-24 1986-05-07 コルモーゲン　テクノロジイズ　コーポレイシヨン デユアルビームスペクトル透過率の測定方法及び装置
JPS6254129A (ja) * 1985-09-03 1987-03-09 Seiko Epson Corp 紫外線検出器
JPH01287669A (ja) * 1988-05-16 1989-11-20 Fuji Photo Film Co Ltd 画像形成装置の測光装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2705865A1 (de) * 1977-02-11 1978-08-17 Wolfhart Dr Med Weede Verfahren und vorrichtung zum bestimmen des lichttransmissionsgrades und/oder der lichtreduktion von brillenglaesern und dergleichen
DE3535515A1 (de) * 1985-10-04 1987-04-09 Pantuc Ing Buero Verfahren und vorrichtung zur on-line-messung von transmission oder reflexion an bewegten objekten im bereich detektierbarer elektromagnetischer strahlung

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60209122A (ja) * 1984-03-29 1985-10-21 Fujitsu Ltd マルチスペクトル光学装置
JPS6189543A (ja) * 1984-09-24 1986-05-07 コルモーゲン　テクノロジイズ　コーポレイシヨン デユアルビームスペクトル透過率の測定方法及び装置
JPS6254129A (ja) * 1985-09-03 1987-03-09 Seiko Epson Corp 紫外線検出器
JPH01287669A (ja) * 1988-05-16 1989-11-20 Fuji Photo Film Co Ltd 画像形成装置の測光装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100511367B1 (ko) * 2003-05-12 2005-08-30 주식회사 넥스필 특수 코팅 필름의 파장별 투과율 측정 시스템 및 그 방법
JP2021067457A (ja) * 2019-10-17 2021-04-30 コニカミノルタ株式会社 用紙物性検出装置、用紙情報判別システム、および画像形成システム

Also Published As

Publication number Publication date
DE3940386A1 (de) 1991-06-13

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