JPH03119774U - - Google Patents

Info

Publication number
JPH03119774U
JPH03119774U JP3017490U JP3017490U JPH03119774U JP H03119774 U JPH03119774 U JP H03119774U JP 3017490 U JP3017490 U JP 3017490U JP 3017490 U JP3017490 U JP 3017490U JP H03119774 U JPH03119774 U JP H03119774U
Authority
JP
Japan
Prior art keywords
temperature
measurement
contact
handling device
forcibly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3017490U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3017490U priority Critical patent/JPH03119774U/ja
Publication of JPH03119774U publication Critical patent/JPH03119774U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3017490U 1990-03-22 1990-03-22 Pending JPH03119774U (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3017490U JPH03119774U (cs) 1990-03-22 1990-03-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3017490U JPH03119774U (cs) 1990-03-22 1990-03-22

Publications (1)

Publication Number Publication Date
JPH03119774U true JPH03119774U (cs) 1991-12-10

Family

ID=31532903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3017490U Pending JPH03119774U (cs) 1990-03-22 1990-03-22

Country Status (1)

Country Link
JP (1) JPH03119774U (cs)

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