JPH0311682Y2 - - Google Patents

Description

[Detailed Description of the Invention] (Field of Industrial Application) The present invention relates to an inspection device for determining abnormalities such as bending or missing pins in parallel directions of an IC.

(Prior Art) A DIP type IC has many pins on both sides of the package, and if any of these pins are missing or bent, it will cause problems in subsequent processes. Although pin condition inspection devices are known, there has been no device that can perform accurate inspection at high speed.

(Technical Problem) Therefore, the present invention provides an IC pin inspection device that can accurately detect irregularities such as bending or missing IC pins in the parallel direction at high speed.

(Technical Means) The present invention that achieves the above-mentioned purpose uses a constant-velocity running mechanism consisting of a belt that runs at a constant speed on a guide rail and a driving pulley for the belt, and a belt that runs at a constant speed on a guide rail, and a mechanism that prevents abnormalities such as bending or missing pins in the parallel direction of the IC. In order to identify, there is a projector that emits a beam of light from the side of the pin of an IC running at a constant speed, a member located at the bottom of the rail that reflects the beam, and a signal of the pin status is obtained by receiving the reflected beam. A pin-state detector mechanism consisting of a light receiver, a beam position adjustment mechanism that supports the entire detection mechanism or a projector and a reflecting member, and changes the irradiation position of the beam light to an appropriate position from the base end to the tip of the pin. This is an IC pin inspection device with

(Function of the invention) Since the invention consists of a constant speed traveling mechanism, a pin state detection mechanism, and a beam position adjustment mechanism, the pulse of the beam generated by the pin of the IC traveling at constant speed and received by the light receiver is If the pin spacing is the same, it will always be constant, making it easier to detect abnormalities, and since the position of the beam light projection can be adjusted, the optimum inspection can be performed by selecting the position that is easiest to detect. Therefore, accurate IC can be achieved at the IC movement speed set by the constant speed traveling mechanism.
The condition of the pins can be inspected.

(Example) To explain the present invention in detail using examples, in each figure, 1 is a guide rail installed on the device base 11, 2 is a belt of the constant speed traveling mechanism 4, and 3 is a drive pulley. In order to cause the IC 5, which is fed across the guide rail 1, to run at a constant speed by the belt 2, the embodiment has teeth 3a that mesh with the teeth 2a of the belt 2 of the Kotogg belt type, and a pulse motor. 12. 2b shows a sponge or other flexible material attached to the circumferential surface of the belt to make it easier to move the IC5. 13, 13 and 1
4 and 14 are each pair of sensor bodies, IC5
Entering the area of the detection mechanism 9 and leaving the area are detected.

Reference numerals 6a and 6b are projectors that emit beams of light to the pin 5a of the IC 5 from both the left and right sides, and are arranged facing each other inside the frame 15 formed in the shape of a reverse gate (see FIG. 4). The projectors 6, 6a, and 6b are of a transmission type using optical fibers. 7 and 17 are upper and lower reflective members formed by prisms, 7a and 17a are reflective surfaces that reflect the beam light on one side, 7b and 17b are reflective surfaces that reflect the beam light on the other side, and 8a and 8b are lower reflective members. Member 17
18 is a hood that covers the optical path between the upper and lower prisms.
A detection mechanism 9 for the state is configured.

Reference numeral 10 denotes a beam position adjustment mechanism, which in the embodiment is integrally provided with the reverse gate-shaped frame 15 and a continuous member 19, and the member 19 is connected to a slider 20 of a known fine movement device. 21
is an adjustment knob that moves the slider 20 up and down. Further, in each figure, 22 represents a mounting stay, 23 represents a belt guide, and 24 represents a motor housing.

In the above configuration, the IC 5 is fed to the present device and detected by the sensor body 13, and then enters the constant speed traveling mechanism 4, and is caused to travel on the guide rail 1 at a constant speed by the flexible material 2b, and as a result, If the parallel arrangement of the pins 5a is perfect and not bent, the light beams received by the light receivers 8a and 8b are displayed on the display means as well-aligned pulses, for example. The closer the beam light is irradiated to the tip of the pin 5a, the more accurate the result will be. Therefore, the device of the present invention is equipped with a position adjustment mechanism 10, which makes it easy to adapt to changes in the type of IC, especially ICs with different pin lengths. However, if the pins 5a bend in the pin parallel direction and an IC 5 with an abnormal pitch passes through the detection mechanism 9, the distance between adjacent pins 5a has changed, and the beam light will be blocked compared to the case with a normal pin arrangement. Since the time interval also changes, the pulses are disturbed and it is detected that there is an abnormality in the pin arrangement of the IC5 in the parallel direction.

(Effect of the invention) Therefore, according to the invention, since the IC runs at a constant speed through the pin state detection mechanism, the pulses of the beam light received by the receiver are extremely accurately aligned, and therefore the pin arrangement is very accurate. can be accurately inspected,
In addition, since the detection mechanism can be moved by the beam light position adjustment mechanism, it is possible to align the beam light irradiation position with the tip of the pin that can be inspected most accurately for further accuracy, and even if the type of IC to be tested changes. It has great practical effects, such as being able to perform inspections without any trouble with just a few adjustments.

[Brief explanation of drawings]

The drawings show one embodiment of the IC pin inspection device according to the present invention, in which Fig. 1 is a side view, Fig. 2 is a plan view, Fig. 3 is a perspective view of the main part, and Fig. 4 is a cross-sectional view of the detection mechanism. It is an explanatory diagram. 1... Guide rail, 2... Belt, 3... Driving pulley, 4... Constant speed traveling mechanism, 5... IC,
6... Emitter, 7... Reflective member, 8... Light receiver,
9... Pin state detection mechanism, 10... Beam position adjustment mechanism.

Claims (1)

[Scope of utility model registration request] A constant-velocity running mechanism consists of a belt and its drive pulley that allows the IC to run at a constant speed on a guide rail, and an IC that runs at a constant velocity to detect abnormalities such as bends or missing pins in the parallel direction of the IC.
A projector that emits a beam of light from the side of the pin, a member located at the bottom of the rail that reflects the beam of light,
a pin state detector structure comprising a light receiver that receives the reflected beam light and obtains a pin state signal;
An IC pin inspection device that supports the entire detection mechanism or a projector and a reflection member, and has a beam position adjustment mechanism that changes the irradiation position of the beam light to an appropriate position from the base end to the tip of the pin.