JPH03116559U - - Google Patents

Info

Publication number
JPH03116559U
JPH03116559U JP2219790U JP2219790U JPH03116559U JP H03116559 U JPH03116559 U JP H03116559U JP 2219790 U JP2219790 U JP 2219790U JP 2219790 U JP2219790 U JP 2219790U JP H03116559 U JPH03116559 U JP H03116559U
Authority
JP
Japan
Prior art keywords
sample
fine movement
holder
tensile
exchange
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2219790U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2219790U priority Critical patent/JPH03116559U/ja
Publication of JPH03116559U publication Critical patent/JPH03116559U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を説明するための試
料微動装置の微動台構成図、第2図は微動台の詳
細図、第3図は試料ホルダの詳細断面図である。 1……電子ビーム、2……対物レンズ、3……
試料、4……試料支持棒A、5……試料支持棒B
、6……回転防止板、7……試料棒、8……試料
ホルダ、9……ロツクナツト、10……R動作機
構、11……X動作機構、12……Y動作機構、
13……Z動作機構、14……T動作機構、15
……ストツパー棒A、16……ストツパー棒B、
17……ウオームギア。
FIG. 1 is a configuration diagram of a fine movement table of a sample fine movement device for explaining an embodiment of the present invention, FIG. 2 is a detailed view of the fine movement table, and FIG. 3 is a detailed sectional view of a sample holder. 1...Electron beam, 2...Objective lens, 3...
Sample, 4... Sample support rod A, 5... Sample support rod B
, 6... Rotation prevention plate, 7... Sample rod, 8... Sample holder, 9... Lock nut, 10... R operating mechanism, 11... X operating mechanism, 12... Y operating mechanism,
13...Z movement mechanism, 14...T movement mechanism, 15
...stopper rod A, 16...stopper rod B,
17...worm gear.

Claims (1)

【実用新案登録請求の範囲】 1 試料室の高真空をリークすることなく試料交
換可能な試料交換装置と試料の回転ができる試料
微動装置より成る走査形電子顕微鏡の試料ホルダ
において、試料ホルダ上の試料支持棒に回転防止
板を設けたことを特徴とする引張試料ホルダ。 2 請求項第1項において、水平X,Y、傾斜T
、垂直Z及び回転R機構より成る前記試料微動装
置において、水平動作機構に2本のストツパー棒
を設けたことを特徴とする引張試料ホルダ。
[Scope of Claim for Utility Model Registration] 1. In a sample holder for a scanning electron microscope consisting of a sample exchange device that can exchange the sample without leaking the high vacuum of the sample chamber and a sample fine movement device that can rotate the sample, A tensile sample holder characterized in that a rotation prevention plate is provided on the sample support rod. 2 In claim 1, horizontal X, Y, inclination T
. A tensile sample holder, characterized in that, in the sample fine movement device comprising a vertical Z and rotation R mechanism, two stopper rods are provided on the horizontal movement mechanism.
JP2219790U 1990-03-07 1990-03-07 Pending JPH03116559U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2219790U JPH03116559U (en) 1990-03-07 1990-03-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2219790U JPH03116559U (en) 1990-03-07 1990-03-07

Publications (1)

Publication Number Publication Date
JPH03116559U true JPH03116559U (en) 1991-12-03

Family

ID=31525215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2219790U Pending JPH03116559U (en) 1990-03-07 1990-03-07

Country Status (1)

Country Link
JP (1) JPH03116559U (en)

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