JPH02102651U - - Google Patents

Info

Publication number
JPH02102651U
JPH02102651U JP988289U JP988289U JPH02102651U JP H02102651 U JPH02102651 U JP H02102651U JP 988289 U JP988289 U JP 988289U JP 988289 U JP988289 U JP 988289U JP H02102651 U JPH02102651 U JP H02102651U
Authority
JP
Japan
Prior art keywords
dispersive
ray
analysis
sample
solid angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP988289U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP988289U priority Critical patent/JPH02102651U/ja
Publication of JPH02102651U publication Critical patent/JPH02102651U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本案の動作原理を説明する断面図、第
2図は本案の一実施例を示す断面図である。 1……電子ビーム、2……対物レンズ、3……
試料、4……試料台、5……特性X線、6……X
線取出し穴、7……分光結晶、8……非分散形X
線分析装置、9……X線検出器、10……アパー
チヤー、11……立体角、12……X線取出し穴
、13……可動軸、14……試料室、15……フ
ランジ、16……ストツパー、17……ツマミ。
FIG. 1 is a sectional view illustrating the operating principle of the present invention, and FIG. 2 is a sectional view showing an embodiment of the present invention. 1...Electron beam, 2...Objective lens, 3...
Sample, 4...Sample stage, 5...Characteristic X-ray, 6...X
Line extraction hole, 7...Spectroscopic crystal, 8...Non-dispersive type X
Ray analyzer, 9...X-ray detector, 10...aperture, 11...solid angle, 12...X-ray extraction hole, 13...movable axis, 14...sample chamber, 15...flange, 16... ...stopper, 17...knob.

Claims (1)

【実用新案登録請求の範囲】 1 試料微小部の元素分析をする走査形電子顕微
鏡の非分散形X線分析装置において、試料からX
線検出器を見込むX線信号取り込む立体角を可変
できる絞りを設けたことを特徴とする非分散形X
線分析用絞り装置。 2 請求範囲第1項において、真空外より立体角
を可変できる構造を有することを特徴とする非分
散形X線分析用絞り装置。
[Scope of claim for utility model registration] 1. In a non-dispersive X-ray analyzer of a scanning electron microscope that performs elemental analysis of minute parts of a sample,
A non-dispersive type
Squeezing device for line analysis. 2. A diaphragm device for non-dispersive X-ray analysis according to claim 1, characterized in that it has a structure that allows the solid angle to be varied from outside the vacuum.
JP988289U 1989-02-01 1989-02-01 Pending JPH02102651U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP988289U JPH02102651U (en) 1989-02-01 1989-02-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP988289U JPH02102651U (en) 1989-02-01 1989-02-01

Publications (1)

Publication Number Publication Date
JPH02102651U true JPH02102651U (en) 1990-08-15

Family

ID=31217022

Family Applications (1)

Application Number Title Priority Date Filing Date
JP988289U Pending JPH02102651U (en) 1989-02-01 1989-02-01

Country Status (1)

Country Link
JP (1) JPH02102651U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8905844B2 (en) 2007-10-05 2014-12-09 Nintendo Co., Ltd. Storage medium storing load detecting program and load detecting apparatus
US9289680B2 (en) 2007-04-20 2016-03-22 Nintendo Co., Ltd. Game controller, storage medium storing game program, and game apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9289680B2 (en) 2007-04-20 2016-03-22 Nintendo Co., Ltd. Game controller, storage medium storing game program, and game apparatus
US8905844B2 (en) 2007-10-05 2014-12-09 Nintendo Co., Ltd. Storage medium storing load detecting program and load detecting apparatus

Similar Documents

Publication Publication Date Title
JPH0650615B2 (en) Environmental scanning electron microscope
JPH02102651U (en)
JPS583586B2 (en) scanning electron microscope
US2418228A (en) Electronic microanalyzer
JPS6423864U (en)
JPH0424252U (en)
JPH0322352U (en)
JPH0166747U (en)
JPH0119803Y2 (en)
JP3064335B2 (en) Transmission electron microscope
JPS58920Y2 (en) scanning electron microscope
JPH0541397Y2 (en)
JPS61114757U (en)
JPH05182624A (en) Objective diaphragm
JPS6296256U (en)
Hirsch Biological imaging with a new type of soft x‐ray microscope
JPH04190148A (en) Method and apparatus for analyzing surface
JPS55117388A (en) Scanning electronic microscope or its similar device
JP3368643B2 (en) Photoelectron spectrometer
Yasui Characterization Techniques of Ceramics: Scanning Electron Microscopy and X-Ray Micro Analyzer
JPS61186158U (en)
JPH0459942U (en)
JPS6177543U (en)
JPS59148062U (en) Scanning electron microscope sample moving device
JPH0259580B2 (en)