JPH0112192Y2 - - Google Patents

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Publication number
JPH0112192Y2
JPH0112192Y2 JP8173981U JP8173981U JPH0112192Y2 JP H0112192 Y2 JPH0112192 Y2 JP H0112192Y2 JP 8173981 U JP8173981 U JP 8173981U JP 8173981 U JP8173981 U JP 8173981U JP H0112192 Y2 JPH0112192 Y2 JP H0112192Y2
Authority
JP
Japan
Prior art keywords
sample
focusing lens
ultrasonic
ultrasound
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8173981U
Other languages
Japanese (ja)
Other versions
JPS57194060U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8173981U priority Critical patent/JPH0112192Y2/ja
Publication of JPS57194060U publication Critical patent/JPS57194060U/ja
Application granted granted Critical
Publication of JPH0112192Y2 publication Critical patent/JPH0112192Y2/ja
Expired legal-status Critical Current

Links

Description

【考案の詳細な説明】 本考案は超音波顕微鏡装置の試料保持台に係
り、その目的とするところは、試料を集束レンズ
に対して容易に水平に保持できるように成した超
音波顕微鏡装置の試料保持台を提供することにあ
る。
[Detailed description of the invention] The present invention relates to a sample holding stand for an ultrasonic microscope device, and its purpose is to easily hold a sample horizontally with respect to a focusing lens for an ultrasonic microscope device. The object of the present invention is to provide a sample holder.

光の代りに超音波を用いて物体の微視的な構造
を観察しようという考えが古くからあり、最近機
械走査型超音波顕微鏡が開発された。この超音波
顕微鏡は、原理的には細く絞つた超高周波ビーム
によつて試料面を機械的に走査し、散乱された超
音波を集音して電気信号に変換し、陰極線管の表
面に二次元的に表示し、顕微鏡像を得るものであ
る。そして、その構成としては超音波の検出の仕
方によつて、すなわち、試料内で散乱あるいは減
衰しながら透過してきた超音波を検出する場合
と、試料内の音響的性質の差によつて反射してき
た超音波を検出する場合とによつて、透過型と反
射型とに分けられる。
The idea of using ultrasound instead of light to observe the microscopic structure of objects has been around for a long time, and recently mechanical scanning ultrasound microscopes have been developed. In principle, this ultrasonic microscope mechanically scans the sample surface with a narrowly focused ultrahigh-frequency beam, collects the scattered ultrasonic waves, converts them into electrical signals, and sends them to the surface of a cathode ray tube. It displays the image dimensionally and obtains a microscopic image. The configuration depends on the method of detecting the ultrasonic waves, that is, detecting the ultrasonic waves that have passed through the sample while being scattered or attenuated, and detecting the ultrasonic waves that have been reflected due to the difference in acoustic properties within the sample. They are divided into transmission type and reflection type, depending on the case in which they detect the transmitted ultrasonic waves.

上述のような構成の超音波顕微鏡によつて、顕
微鏡像を得るのであるが、このとき超音波ビーム
を発生する超音波集束レンズに対して試料を水平
に保持し、駆動走査する必要がある。このため、
試料を試料保持台の載置したのちに、試料を水平
に保持するための操作が必要であつた。第1図は
反射型の超音波顕微鏡装置を示すブロツク図で、
1は高周波パルス発振器、2は方向性結合器、3
は超音波集束レンズ、4は超音波媒体となる音場
媒体、5は試料、6は試料保持台、7はゲート回
路、8は増幅器、9は検波器、10はピークホー
ルド回路、11は遅延回路、12はY方向駆動装
置、13はY方向駆動制御回路、14はY方向駆
動装置、15はX方向駆動制御回路、16は陰極
線管、17はスイツチである。
Microscopic images are obtained using the ultrasonic microscope configured as described above, but at this time it is necessary to hold the sample horizontally with respect to the ultrasonic focusing lens that generates the ultrasonic beam and drive and scan it. For this reason,
After placing the sample on the sample holder, an operation was required to hold the sample horizontally. Figure 1 is a block diagram showing a reflection type ultrasound microscope device.
1 is a high frequency pulse oscillator, 2 is a directional coupler, 3
is an ultrasonic focusing lens, 4 is a sound field medium serving as an ultrasonic medium, 5 is a sample, 6 is a sample holding table, 7 is a gate circuit, 8 is an amplifier, 9 is a detector, 10 is a peak hold circuit, and 11 is a delay 12 is a Y-direction drive device, 13 is a Y-direction drive control circuit, 14 is a Y-direction drive device, 15 is an X-direction drive control circuit, 16 is a cathode ray tube, and 17 is a switch.

上述のような構成の超音波顕微鏡装置におい
て、その動作を説明すると、まず高周波パルス発
振器1によつて発生された高周波パルス信号は、
方向性結合器2を介して電気音響変換素子(図示
せず)を具備する超音波集束レンズ3に印加され
る。
To explain the operation of the ultrasonic microscope device configured as described above, first, the high frequency pulse signal generated by the high frequency pulse oscillator 1 is as follows.
The signal is applied via a directional coupler 2 to an ultrasonic focusing lens 3 equipped with an electroacoustic transducer (not shown).

該集束レンズ3によつて発生された超音波ビー
ムは音場媒体4を介して試料5に照射される。照
射された超音波ビームは試料5内の音響的性質の
差によつて反射され、該反射された超音波ビーム
は再び前記集束レンズ3で集められ、電気信号に
変換される。該変換された電気信号は前記方向性
結合器2によつて、ゲート回路7に入力される。
該ゲート回路7によつて不要信号が除去され、増
幅器8によつて増幅された後、検波器9によつて
検波される。これによつて試料5からの反射信号
の強度が電圧として取り出される。なお、この検
波器9からの出力はパルス状の信号であるため、
ピークホールド回路10によつてアナログ信号に
変換し、該アナログ信号を陰極線管16の輝度信
号aとして該陰極線管16に入力する。また、た
とえば直流モーター等によつて構成されるY方向
駆動装置12によつて試料を一走査当り1〜60秒
でY方向に駆動走査し、この走査はY方向駆動制
御回路13によつて制御される。そして、該Y方
向駆動制御回路13からの出力を陰極線管16に
に入力し、Y方向制御信号cとする。なお、たと
えばボイスコイル等によつて構成されるX方向駆
動装置14によつて試料を10〜200Hz程度の比較
的高速でX方向に駆動走査し、この走査はX方向
駆動制御回路15によつて制御される。そして、
前記と同様に陰極線管16のX方向制御信号bと
する。
The ultrasonic beam generated by the focusing lens 3 is irradiated onto the sample 5 via the sound field medium 4. The irradiated ultrasonic beam is reflected by the difference in acoustic properties within the sample 5, and the reflected ultrasonic beam is again focused by the focusing lens 3 and converted into an electrical signal. The converted electrical signal is input to the gate circuit 7 by the directional coupler 2.
Unnecessary signals are removed by the gate circuit 7, amplified by the amplifier 8, and then detected by the detector 9. As a result, the intensity of the reflected signal from the sample 5 is extracted as a voltage. Note that since the output from this detector 9 is a pulse-like signal,
It is converted into an analog signal by the peak hold circuit 10, and the analog signal is input to the cathode ray tube 16 as the luminance signal a of the cathode ray tube 16. Further, the sample is driven and scanned in the Y direction for 1 to 60 seconds per scan by a Y direction drive device 12 composed of, for example, a DC motor, and this scanning is controlled by a Y direction drive control circuit 13. be done. Then, the output from the Y-direction drive control circuit 13 is input to the cathode ray tube 16, and is used as the Y-direction control signal c. Note that the sample is driven and scanned in the X direction at a relatively high speed of about 10 to 200 Hz by an X direction drive device 14 constituted by a voice coil or the like, and this scanning is controlled by an X direction drive control circuit 15. controlled. and,
Similarly to the above, it is assumed to be the X-direction control signal b for the cathode ray tube 16.

上述のような動作によつて顕微鏡像が得られる
のであるが、良好な画像を得るために前記のよう
に試料5を集束レンズ3に対して水平に保持し、
試料5上を走査するすべての個所において、集束
レンズ3と試料5とは常に一定の距離に保持する
必要がある。このため、スイツチ17を切換える
ことによつて試料5からの反射信号で陰極線管1
6の輝度信号aを隠極線管16のY方走査信号と
して入力する。これによつて試料5のX方向への
傾斜に対して10〜200Hzで駆動されているために
前記輝度信号aが陰極線管16の一本の走査線上
に表われ、該輝度信号を見視しながら試料保持台
6の傾斜を修正することができた。しかしなが
ら、試料5のY方向への傾斜に対しても同様の修
正を行なうものであるが、Y方向への走査が1〜
60秒と長時間のために修正に非常に時間がかか
り、この修正操作のため良好な顕微鏡像を得るの
に非常に手間がかかるという欠点を有していた。
A microscopic image is obtained by the above-mentioned operation, but in order to obtain a good image, the sample 5 is held horizontally with respect to the focusing lens 3 as described above.
At all locations where the sample 5 is scanned, the focusing lens 3 and the sample 5 must always be kept at a constant distance. Therefore, by changing the switch 17, the reflected signal from the sample 5 can be sent to the cathode ray tube 1.
The brightness signal a of No. 6 is input as a Y-direction scanning signal to the hidden cathode ray tube 16. As a result, the luminance signal a appears on one scanning line of the cathode ray tube 16 because it is driven at 10 to 200 Hz with respect to the tilt of the sample 5 in the X direction. However, the inclination of the sample holding table 6 could be corrected. However, the same correction is made for the tilt of the sample 5 in the Y direction, but if the scan in the Y direction is 1~
It takes a very long time (60 seconds) to make corrections, and this correction operation has the disadvantage that it takes a lot of effort to obtain a good microscopic image.

本考案は上述の欠点に解決を与えるものであ
り、以下、本考案の1実施例を図面によつて詳細
に説明する。第2図は超音波顕微鏡装置における
走査駆動部を示す要部斜視図であり、3は超音波
集束レンズ、5は試料、6は試料保持台であり、
X方向傾斜修正台61とY方向傾斜修正台62と
から成つている。18は回動操作台で、試料保持
台6を載置している。
The present invention provides a solution to the above-mentioned drawbacks, and one embodiment of the present invention will be described in detail below with reference to the drawings. FIG. 2 is a perspective view of the main parts of the scanning drive unit in the ultrasonic microscope device, where 3 is an ultrasonic focusing lens, 5 is a sample, and 6 is a sample holding table.
It consists of an X-direction tilt correction table 61 and a Y-direction tilt correction table 62. Reference numeral 18 denotes a rotating operation table on which the sample holding table 6 is placed.

12はY方向駆動装置で、たとえば直流モータ
ー12aと駆動台12bとで構成されている。1
4はX方向駆動装置で、たとえばボイスコイルか
ら成る。19は集束レンズ3を保持するための保
持棒である。
Reference numeral 12 denotes a Y-direction drive device, which is composed of, for example, a DC motor 12a and a drive stand 12b. 1
Reference numeral 4 denotes an X-direction drive device, which is composed of, for example, a voice coil. 19 is a holding rod for holding the focusing lens 3.

上述のような構成の走査駆動部において、その
動作を説明すると、Y方向駆動装置12を構成す
る直流モータ12aの回転によつて駆動台12b
がY方向に一走査当り1〜60秒かけて走査され、
駆動台12b上に載置されたX方向駆動装置14
も共に走査される。また、これと共にX方向駆動
装置14によつて該装置14に配置された集束レ
ンズ3を保持した保持棒19がX方向に10〜200
Hzで走査される。
To explain the operation of the scanning drive unit configured as described above, the drive base 12b is rotated by the rotation of the DC motor 12a that constitutes the Y direction drive device
is scanned in the Y direction for 1 to 60 seconds per scan,
X-direction drive device 14 placed on drive stand 12b
are also scanned. At the same time, the holding rod 19 holding the focusing lens 3 disposed in the device 14 is moved by the X direction driving device 14 from 10 to 200 degrees in the X direction.
Scanned at Hz.

上記の駆動走査によつて試料5面上を集束レン
ズ3が相対的にX−Y方向に走査することにな
る。そして、試料5を集束レンズ3に対して水平
に保持するために、任意の角度位置に回転固定す
ることのできる回転操作台18上に配置された試
料保持台6を操作するのであるが、このとき、第
1図によつて説明したように、まず、陰極線管1
6への試料5からの反射信号を処理した輝度信号
aを、スイツチ17を切換えることによつてY方
向制御信号cの入力端子に供給し、陰極線管16
の画像を目視しながら、X方向傾斜保持台61を
操作することによつてX方向の水平修正を行な
う。こののち、回転操作台18を90度回転させて
X軸とY軸とを入れ換え、前述と同様に陰極線管
16の画像を目視しながら、Y方向傾斜修正台6
2を操作し水平に修正する。このそれぞれの修正
はX方向駆動装置14によつて集束レンズ3が10
〜200Hzで試料5面上を走査するために、陰極線
管16の画像が安定にかつ容易に得られるために
傾斜修正台61,62による修正操作が非常に容
易にできるものである。
By the above driving scan, the focusing lens 3 relatively scans the surface of the sample 5 in the X-Y direction. Then, in order to hold the sample 5 horizontally with respect to the focusing lens 3, the sample holding table 6 placed on a rotary operation table 18, which can be rotated and fixed at any angular position, is operated. At this time, as explained with reference to FIG.
By switching the switch 17, the luminance signal a obtained by processing the reflected signal from the sample 5 to the cathode ray tube 16 is supplied to the input terminal of the Y direction control signal c.
The horizontal correction in the X direction is performed by operating the X direction tilt holding table 61 while visually viewing the image. Thereafter, rotate the rotary operation table 18 by 90 degrees to exchange the X-axis and Y-axis, and while visually viewing the image on the cathode ray tube 16 as before,
Operate 2 to correct it horizontally. Each of these corrections is carried out by the X-direction drive device 14, which moves the focusing lens 3
Since the surface of the sample 5 is scanned at ~200 Hz, an image of the cathode ray tube 16 can be obtained stably and easily, so that correction operations using the tilt correction tables 61 and 62 can be performed very easily.

上述のように本考案によれば、試料保持台6を
回転操作することのできる回転操作台18に配置
するだけで、試料5を集束レンズ3に対して水平
に修正保持するための操作が非常に容易にできる
ものである。
As described above, according to the present invention, the operation for correcting and holding the sample 5 horizontally with respect to the focusing lens 3 is extremely easy simply by placing the sample holding table 6 on the rotary operation table 18 that can be rotated. This is something that can be done easily.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は超音波顕微鏡装置を示すブロツク図、
第2図は本考案の1実施例を示す超音波顕微鏡装
置の走査駆動部を示す要部斜視図である。 3……超音波集束レンズ、5……試料、6……
試料保持台、61,62……傾斜修正台、12…
…Y方向駆動装置、14……X方向駆動装置、1
8……回転操作台。
Figure 1 is a block diagram showing an ultrasonic microscope device.
FIG. 2 is a perspective view of a main part showing a scanning drive section of an ultrasonic microscope apparatus according to an embodiment of the present invention. 3... Ultrasonic focusing lens, 5... Sample, 6...
Sample holding table, 61, 62... Inclination correction table, 12...
...Y direction drive device, 14...X direction drive device, 1
8...Rotating operation table.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 超音波媒体を介して超音波を超音波集束レンズ
によつて試料面方向に集束させると共に、該試料
面を超音波によつてX−Y走査して試料を検査す
る反射型超音波顕微鏡において、前記試料を保持
し、傾斜を調整しうる機能を有する試料保持台を
X−Y走査平面に対して垂直な軸のまわりに回転
可能に設置したことを特徴とする超音波顕微鏡装
置の試料保持台。
In a reflection-type ultrasound microscope that focuses ultrasound through an ultrasound medium in the direction of a sample surface using an ultrasound focusing lens, and scans the sample surface in X-Y direction with the ultrasound to inspect the sample, A sample holder for an ultrasonic microscope apparatus, characterized in that the sample holder has the function of holding the sample and adjusting the inclination, and is rotatably installed around an axis perpendicular to the X-Y scanning plane. .
JP8173981U 1981-06-03 1981-06-03 Expired JPH0112192Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8173981U JPH0112192Y2 (en) 1981-06-03 1981-06-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8173981U JPH0112192Y2 (en) 1981-06-03 1981-06-03

Publications (2)

Publication Number Publication Date
JPS57194060U JPS57194060U (en) 1982-12-09
JPH0112192Y2 true JPH0112192Y2 (en) 1989-04-10

Family

ID=29877239

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8173981U Expired JPH0112192Y2 (en) 1981-06-03 1981-06-03

Country Status (1)

Country Link
JP (1) JPH0112192Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59225349A (en) * 1983-06-07 1984-12-18 Olympus Optical Co Ltd Apparatus for adjusting inclination of specimen table of ultrasonic microscope

Also Published As

Publication number Publication date
JPS57194060U (en) 1982-12-09

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