JPS59104549A - Ultrasonic microscope - Google Patents

Ultrasonic microscope

Info

Publication number
JPS59104549A
JPS59104549A JP57214385A JP21438582A JPS59104549A JP S59104549 A JPS59104549 A JP S59104549A JP 57214385 A JP57214385 A JP 57214385A JP 21438582 A JP21438582 A JP 21438582A JP S59104549 A JPS59104549 A JP S59104549A
Authority
JP
Japan
Prior art keywords
sample
ultrasonic
piezoelectric transducer
reflected waves
detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57214385A
Other languages
Japanese (ja)
Inventor
Koji Taguchi
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP57214385A priority Critical patent/JPS59104549A/en
Publication of JPS59104549A publication Critical patent/JPS59104549A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/06Visualisation of the interior, e.g. acoustic microscopy

Abstract

PURPOSE:To adjust automatically a scan plane and a sample surface in parallel, by providing a piezoelectric transducer for position detection so as to surround a piezoelectric transducer and detecting the time difference of sample reflected waves and displacing a sample placing face on a basis of this time difference. CONSTITUTION:An ultrahigh-frequency burst wave electric signal is supplied to a piezoelectric transducer 22 for information detection of an ultrasonic transmitting and receiving part from a high frequency pulse generator 2 through a cir culator 3 under the control of a control part 1, and a sample placed on a sample table 31 is scanned with an ultrasonic spot, and reflected waves are processed to display an ultrasonic image on a display part 13. The burst wave signal from the high frequency pulse generator 2 is supplied to piezoelectric transducers 22a-23d for position detection through a circulator to project ultrasonic waves to the sample, and the difference of reception time of sample reflected waves among transducers 23a, 23b, 23c, and 23d is detected, and X and Y-direction adjusting motors 33 and 34 of a goniometer 32 are driven to displace the sample table 31, thereby adjusting the scan plane and the sample surface in parallel automatically.
JP57214385A 1982-12-07 1982-12-07 Ultrasonic microscope Pending JPS59104549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57214385A JPS59104549A (en) 1982-12-07 1982-12-07 Ultrasonic microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57214385A JPS59104549A (en) 1982-12-07 1982-12-07 Ultrasonic microscope

Publications (1)

Publication Number Publication Date
JPS59104549A true JPS59104549A (en) 1984-06-16

Family

ID=16654907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57214385A Pending JPS59104549A (en) 1982-12-07 1982-12-07 Ultrasonic microscope

Country Status (1)

Country Link
JP (1) JPS59104549A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02140465U (en) * 1989-04-25 1990-11-26
US5050135A (en) * 1989-12-20 1991-09-17 Unico, Inc. Magnetostrictive multiple position sensing device
US5648683A (en) * 1993-08-13 1997-07-15 Kabushiki Kaisha Toshiba Semiconductor device in which a first resin-encapsulated package is mounted on a second resin-encapsulated package

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02140465U (en) * 1989-04-25 1990-11-26
US5050135A (en) * 1989-12-20 1991-09-17 Unico, Inc. Magnetostrictive multiple position sensing device
US5648683A (en) * 1993-08-13 1997-07-15 Kabushiki Kaisha Toshiba Semiconductor device in which a first resin-encapsulated package is mounted on a second resin-encapsulated package

Similar Documents

Publication Publication Date Title
US3794964A (en) Ultrasonic imaging device
JPS58223059A (en) Ultrasonic flaw detector
JPH01229962A (en) Method and apparatus for measuring distribution of crystal grain orientation in directional silicon steel plate
JPS59104549A (en) Ultrasonic microscope
GB2185321A (en) Ultrasonic reflex transmission imaging method and apparatus with external reflector
JPS60146152A (en) Ultrasonic microscope
ES470358A1 (en) Ultrasonic centering apparatus
JPS5883257A (en) Ultrasonic microscope
GB1203854A (en) Material tester
JPS61198056A (en) Ultrasonic flaw detecting method for steel pipe by array type probe
JPS62261955A (en) Ultrasonic flaw detecting device
JPS63221211A (en) Ultrasonic thickness measuring method for laminar body
JPS5618778A (en) Ultrasonic image apparatus
JPS61240158A (en) Ultrasonic flaw detection method and apparatus therefor
JPS57187652A (en) Focus adjusting method and apparatus for ultrasonic microscope
JPS62277556A (en) Electromagnetic ultrasonic probe
JPS61200466A (en) Ultrasonic flaw detection apparatus
SU1422133A1 (en) Method of ultrasonic check by echo method
JPS61256255A (en) Ultrasonic flaw detection apparatus
JPH0235353A (en) Ultrasonic wave microscope
JPS56128472A (en) Ultrasonic pickup device
JPS55129776A (en) Sound field scanning method in phased array sonar
JPS5821178A (en) Ultrasonic detector
JPS597260A (en) Method and device for ultrasonic flaw detection
JPS5944652A (en) Ultrasonic flaw detection method