JPH03113111U - - Google Patents

Info

Publication number
JPH03113111U
JPH03113111U JP2090190U JP2090190U JPH03113111U JP H03113111 U JPH03113111 U JP H03113111U JP 2090190 U JP2090190 U JP 2090190U JP 2090190 U JP2090190 U JP 2090190U JP H03113111 U JPH03113111 U JP H03113111U
Authority
JP
Japan
Prior art keywords
ray
microfocus
rays
inspection
destructive inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2090190U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2090190U priority Critical patent/JPH03113111U/ja
Publication of JPH03113111U publication Critical patent/JPH03113111U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2090190U 1990-02-28 1990-02-28 Pending JPH03113111U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2090190U JPH03113111U (enrdf_load_stackoverflow) 1990-02-28 1990-02-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2090190U JPH03113111U (enrdf_load_stackoverflow) 1990-02-28 1990-02-28

Publications (1)

Publication Number Publication Date
JPH03113111U true JPH03113111U (enrdf_load_stackoverflow) 1991-11-19

Family

ID=31523984

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2090190U Pending JPH03113111U (enrdf_load_stackoverflow) 1990-02-28 1990-02-28

Country Status (1)

Country Link
JP (1) JPH03113111U (enrdf_load_stackoverflow)

Similar Documents

Publication Publication Date Title
US6731783B2 (en) Image processing apparatus and method
JPS63140907U (enrdf_load_stackoverflow)
JP2002125963A (ja) コンピュータ断層撮影装置及びコンピュータ断層撮影装置の作動方法
AU2003225836A8 (en) Systems and methods for quasi-simultaneous multi-planar x-ray imaging
JP3230618B2 (ja) 放射線立体像撮影装置
FI20070850A7 (fi) Röntgensädekuva-anturi ja sitä käyttävä röntgensädekuvauslaite
JPH0370435B2 (enrdf_load_stackoverflow)
JPH11226004A (ja) X線検査装置及びx線像の撮像方法
JPS5932852A (ja) 非破壊検査法及びダイアフアノスコピイ装置
CA2228325A1 (en) X-ray image intensifier
JPH0575419B2 (enrdf_load_stackoverflow)
CN212415753U (zh) 一种dr融合成像系统
JPH03113111U (enrdf_load_stackoverflow)
JPS62123341A (ja) タイヤのスチ−ルコ−ドのx線検査装置
JPS6480346A (en) X-ray imaging apparatus
JP2009131563A (ja) X線ct装置
JP4363689B2 (ja) X線診断装置
JPH04183443A (ja) X線のct装置のプリアンプ増幅率設定方法
JPH062370Y2 (ja) 濃度校正用x線量検出器
JP2001037748A (ja) X線撮影装置
KR100442325B1 (ko) 방사선투과검사용 센터링디바이스
JP2003033343A5 (enrdf_load_stackoverflow)
JP2003033344A (ja) 2次元x線検出器を用いたx線回転撮影装置
JPS61172539A (ja) X線診断装置
JPH09327450A (ja) X線撮影装置