JPH0311109B2 - - Google Patents

Info

Publication number
JPH0311109B2
JPH0311109B2 JP5651285A JP5651285A JPH0311109B2 JP H0311109 B2 JPH0311109 B2 JP H0311109B2 JP 5651285 A JP5651285 A JP 5651285A JP 5651285 A JP5651285 A JP 5651285A JP H0311109 B2 JPH0311109 B2 JP H0311109B2
Authority
JP
Japan
Prior art keywords
insulating film
optical path
path material
light
material layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP5651285A
Other languages
Japanese (ja)
Other versions
JPS61214585A (en
Inventor
Ikuo Fukuda
Keiji Kamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP60056512A priority Critical patent/JPS61214585A/en
Publication of JPS61214585A publication Critical patent/JPS61214585A/en
Publication of JPH0311109B2 publication Critical patent/JPH0311109B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/12Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は半導体発光素子と半導体受光素子とを
同一の外囲器内に封止すると共に、両者を電気的
には絶縁し且つ光学的に結合した光結合半導体装
置、特に、一般にフオトアイソレータ(通称フオ
トカプラ)と称される光結合半導体装置の改良に
関する。
Detailed Description of the Invention [Technical Field of the Invention] The present invention seals a semiconductor light emitting device and a semiconductor light receiving device in the same envelope, electrically insulating them and optically coupling them. The present invention relates to improvements in optically coupled semiconductor devices, particularly optically coupled semiconductor devices generally referred to as photoisolators (commonly known as photocouplers).

〔発明の技術的背景〕[Technical background of the invention]

第2図は従来の代表的なフオトアイソレータの
構造を示す断面図である。同図において、1は発
光素子用リードである。該リード1には半導体発
光素子2がマウントされ、該発光素子には図示し
ないワイヤボンデイングが施されている。3は受
光素子用リードで、該リードには半導体受光素子
4がマウントされ、且つ図示しないワイヤボンデ
イングが施されている。図示のように発光素子2
および受光素子4は対向して配置され、両素子間
には透明な絶縁性フイルム5が介在されている。
そして、該フイルム5が介在された状態で前記発
光素子2および受光素子4間の空隙は透明なシリ
コーン樹脂層6で満たされ、このシリコーン樹脂
層により両素子2,4は光学的に結合されてい
る。更に、その外側はトランスフアー成形された
エポキシ樹脂層7で封止され、前記発光素子用リ
ード1および受光素子用リード3は夫々エポキシ
樹脂層7の対向側壁から外方に延出されて下方に
折曲げられている。
FIG. 2 is a sectional view showing the structure of a typical conventional photo isolator. In the figure, 1 is a lead for a light emitting element. A semiconductor light emitting element 2 is mounted on the lead 1, and wire bonding (not shown) is applied to the light emitting element. Reference numeral 3 denotes a lead for a light receiving element, on which a semiconductor light receiving element 4 is mounted and wire bonding (not shown) is performed. Light emitting element 2 as shown
The light receiving elements 4 are arranged facing each other, and a transparent insulating film 5 is interposed between both elements.
Then, with the film 5 interposed, the gap between the light emitting element 2 and the light receiving element 4 is filled with a transparent silicone resin layer 6, and both elements 2 and 4 are optically coupled by this silicone resin layer. There is. Furthermore, the outside thereof is sealed with a transfer-molded epoxy resin layer 7, and the light-emitting element lead 1 and the light-receiving element lead 3 are respectively extended outward from the opposing sidewalls of the epoxy resin layer 7 and downward. It is bent.

上記構造からなる従来のオプトアイソレータに
おいて、絶縁性フイルム5は発光素子および受光
素子間の絶縁耐圧を向上させるために用いられる
もので、通常は第2図Bに示すように四弗化エチ
レンと六弗化プロピレンとの共重合体樹脂(以下
FEP樹脂と略称する)からなる単層膜が用いら
れている。周知のようにFEP等のフツ素樹脂は
優れた絶縁破壊特性を有しており、その単層膜6
を介在させることで、オプトアイソレータの絶縁
耐圧は平均3〜4kV向上することが実験により明
かにされている。
In the conventional opto-isolator having the above structure, the insulating film 5 is used to improve the dielectric strength between the light-emitting element and the light-receiving element, and is usually made of tetrafluoroethylene and hexafluoroethylene as shown in FIG. 2B. Copolymer resin with propylene fluoride (hereinafter referred to as
A single-layer film made of FEP resin (abbreviated as FEP resin) is used. As is well known, fluororesin such as FEP has excellent dielectric breakdown properties, and its single layer film6
Experiments have shown that by interposing the dielectric strength of the opto-isolator, it is improved by an average of 3 to 4 kV.

〔背景技術の問題点〕[Problems with background technology]

ところが、FEP樹脂等のフツ素樹脂はシリコ
ーン樹脂に体する濡れ性が悪いことから、上記従
来のオプトアイソレータでは光路を形成するシリ
コーン樹脂層7と絶縁性フイルム5の密着性にバ
ラツキを生じ易く、このため次のような問題が発
生していた。
However, since fluorine resins such as FEP resins have poor wettability with silicone resins, in the conventional opto-isolators described above, variations tend to occur in the adhesion between the silicone resin layer 7 forming the optical path and the insulating film 5. This caused the following problems.

第一の問題は、絶縁耐圧のバラツキが生じ、効
率良く所望の絶縁耐圧を得ることができない点で
ある。
The first problem is that variations occur in the dielectric strength voltage, making it impossible to efficiently obtain the desired dielectric strength voltage.

第二の問題は、絶縁性フイルム5とシリコーン
樹脂層6との界面で光が反射されるため光学的ロ
スを生じ、光電変換効率が低下することである。
The second problem is that light is reflected at the interface between the insulating film 5 and the silicone resin layer 6, causing optical loss and reducing photoelectric conversion efficiency.

〔発明の目的〕[Purpose of the invention]

本発明は上記事情に鑑みてなされたもので、透
明な光路物質層を介して発光素子と受光素子とを
光学的に結合した光結合半導体装置において、両
素子間に絶縁性フイルムを介在させることにより
絶縁耐圧を向上させると共に、光路物質層と絶縁
性フイルムとの密着性を改善して絶縁耐圧の均一
性および光伝達特性を更に改善することを目的と
するものである。
The present invention has been made in view of the above circumstances, and provides an optically coupled semiconductor device in which a light emitting element and a light receiving element are optically coupled via a transparent optical path material layer, in which an insulating film is interposed between the two elements. The purpose of this invention is to improve the dielectric strength voltage and to improve the adhesion between the optical path material layer and the insulating film, thereby further improving the uniformity of the dielectric strength voltage and the light transmission characteristics.

〔発明の概要〕[Summary of the invention]

本発明による光結合半導体装置は、透光性の光
路物質層により光学的に結合された半導体発光素
子および半導体受光素子と、これら両素子間を横
切つて前記光路物質層中に埋設された絶縁性フイ
ルムと、前記光路物質の外側を覆つて形成された
遮光性の封止樹脂層と、一端が前記半導体発光素
子または半導体受光素子の夫々対応する素子に接
続されると共に他端部が前記封止樹脂層から外部
に延出されたリードとを具備し、前記絶縁性フイ
ルムとして絶縁性には優れるが前記光路物質層と
の濡れ性に劣る第一の絶縁性フイルムの両面に、
前記光路物質層に対して良好な濡れ性を有する第
二の絶縁性フイルムを積層した積層絶縁性フイル
ムを用いたことを特徴とするものである。
The optically coupled semiconductor device according to the present invention includes a semiconductor light-emitting element and a semiconductor light-receiving element that are optically coupled by a light-transmitting optical path material layer, and an insulator that is embedded in the optical path material layer across between these two elements. a transparent film, a light-shielding sealing resin layer formed to cover the outside of the optical path material, one end of which is connected to the corresponding element of the semiconductor light emitting element or the semiconductor light receiving element, and the other end of which is connected to the sealing resin layer. on both sides of the first insulating film, which has leads extending outward from the stopper resin layer, and which has excellent insulating properties as the insulating film but has poor wettability with the optical path material layer;
The present invention is characterized in that a laminated insulating film is used, in which a second insulating film having good wettability with respect to the optical path material layer is laminated.

上記のように、光路物質層との濡れ性の良い第
二の絶縁性フイルムを積層した絶縁性フイルムを
用いることで、第一の絶縁性フイルムの優れた絶
縁性をそのまま生かし、且つ光路物質層と絶縁性
フイルムの密着性を顕著に改善することができ
る。
As mentioned above, by using an insulating film laminated with a second insulating film that has good wettability with the optical path material layer, the excellent insulation properties of the first insulating film can be utilized as is, and the optical path material layer The adhesion of the insulating film can be significantly improved.

本発明において、第一の絶縁性フイルムの両面
に積層される前記第二の絶縁性フイルムは、片面
毎に異なる種類のものを用いてもよく、また両面
とも同じ種類のものを用いてもよい。
In the present invention, the second insulating film laminated on both sides of the first insulating film may be of a different type for each side, or the same type of film may be used for both sides. .

〔発明の実施例〕[Embodiments of the invention]

第1図Aは本発明の一実施例になるフオトカプ
ラの断面図であり、同図Bはこれに用いられてい
る絶縁性フイルムの断面図である。第1図Aから
明らかなように、この実施例における基本的な構
成は第2図の従来のオプトアイソレータと全く同
じである。従つて、図中第2図と同じ部分には同
一の参照番号を付し、その説明は省略する。即
ち、1は発光素子用リード、2は半導体発光素
子、3は受光素子用リード、4は半導体受光素
子、5′は絶縁性フイルム、6はシリコーン樹脂
層、7は封止樹脂層である。
FIG. 1A is a cross-sectional view of a photocoupler according to an embodiment of the present invention, and FIG. 1B is a cross-sectional view of an insulating film used in the photocoupler. As is clear from FIG. 1A, the basic configuration of this embodiment is exactly the same as the conventional opto-isolator shown in FIG. Therefore, the same parts in the figure as in FIG. 2 are given the same reference numerals, and their explanation will be omitted. That is, 1 is a lead for a light emitting element, 2 is a semiconductor light emitting element, 3 is a lead for a light receiving element, 4 is a semiconductor light receiving element, 5' is an insulating film, 6 is a silicone resin layer, and 7 is a sealing resin layer.

他方、この実施例では絶縁性フイルム5′の構
成において第2図の従来例と相違している。即
ち、この実施例に用いられている絶縁性フイルム
5′はFEP樹脂フイルム51と、その両側に積層さ
れたポリイミド樹脂フイムル52,52からなつて
いる。この積層絶縁性フイルム5′は三枚のフイ
ルム51,52,52を接着剤で貼り合わせたもの
でもよく、また、FEP樹脂フイルム51の両面に
ポリイミド樹脂をコーテイングしたものでもよ
い。
On the other hand, this embodiment differs from the conventional example shown in FIG. 2 in the structure of the insulating film 5'. That is, the insulating film 5' used in this embodiment consists of an FEP resin film 51 and polyimide resin films 52 and 52 laminated on both sides thereof. This laminated insulating film 5' may be made by bonding three films 5 1 , 5 2 , 5 2 with an adhesive, or may be made by coating both sides of the FEP resin film 5 1 with polyimide resin.

上記実施例のオプトアイソレータでは、絶縁性
フイルム5′が基材としてFEP樹脂フイルムを具
備しているため、第2図の従来例と同等の良好な
絶縁耐圧が得られる。また、絶縁性フイルム5′
の表面はシリコーン樹脂との間に良好な濡れ性を
有するポリイミド樹脂フイルムで覆われているた
め、光路を形成するシリコーン樹脂層6との間に
均一且つ強固な密着性が得られる。従つて、従来
のように絶縁耐圧のバラツキが生じることはな
く、発光素子と受光素子間の絶縁特性の向上を図
ることができる。また、絶縁性フイルム5とシリ
コーン樹脂層6との界面での光の反射による光学
的ロスが防止されるから、光伝達特性の向上にも
寄与する。
In the opto-isolator of the above embodiment, since the insulating film 5' has an FEP resin film as a base material, a good dielectric strength voltage equivalent to that of the conventional example shown in FIG. 2 can be obtained. In addition, the insulating film 5'
Since its surface is covered with a polyimide resin film that has good wettability with silicone resin, uniform and strong adhesion can be obtained between it and the silicone resin layer 6 that forms the optical path. Therefore, variations in dielectric strength voltage do not occur as in the conventional case, and it is possible to improve the insulation characteristics between the light emitting element and the light receiving element. Further, since optical loss due to reflection of light at the interface between the insulating film 5 and the silicone resin layer 6 is prevented, it also contributes to improvement of light transmission characteristics.

なお、上記実施例における絶縁性フイルム5′
としては、エポキシ樹脂フイルムの両面にポリイ
ミド樹脂フイルムを積層したものを用いてもよ
い。
Note that the insulating film 5' in the above embodiment
Alternatively, an epoxy resin film laminated with polyimide resin films on both sides may be used.

〔発明の効果〕〔Effect of the invention〕

以上詳述したように、本発明によれば透明な光
路物質層を介して発光素子と受光素子とを光学的
に結合した光結合半導体装置において、両素子間
に絶縁性フイルムを介在させることにより絶縁耐
圧を向上させると共に、光路物質層と絶縁性フイ
ルムとの密着性を改善して絶縁耐圧の均一性およ
び光伝達特性を更に改善できる等、顕著な効果が
得られるものである。
As detailed above, according to the present invention, in an optically coupled semiconductor device in which a light emitting element and a light receiving element are optically coupled via a transparent optical path material layer, an insulating film is interposed between the two elements. In addition to improving the dielectric strength voltage, the adhesion between the optical path material layer and the insulating film can be improved to further improve the uniformity of the dielectric strength voltage and the light transmission characteristics, and other remarkable effects can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図Aは本発明の一実施例になるオプトアイ
ソレータの断面図であり、同図Bはこれに用いら
れている絶縁性フイルムの構造を示す断面図、第
2図Aは従来のオプトアイソレータの断面図であ
り、同図Bはこれに用いられている絶縁性膜の断
面図である。 1……発光素子用リード、2……半導体発光素
子、3……受光素子用リード、4……半導体受光
素子、5,5′……絶縁性フイルム、51……FEP
樹脂フイルム、52,53……ポリイミド樹脂フイ
ルム、6……シリコーン樹脂層、7……封止樹脂
層。
FIG. 1A is a sectional view of an optoisolator according to an embodiment of the present invention, FIG. 1B is a sectional view showing the structure of an insulating film used in the optoisolator, and FIG. Figure B is a cross-sectional view of the insulating film used therein. 1...Lead for light emitting element, 2...Semiconductor light emitting element, 3...Lead for light receiving element, 4...Semiconductor light receiving element, 5,5'...Insulating film, 5 1 ...FEP
Resin film, 5 2 , 5 3 ... polyimide resin film, 6 ... silicone resin layer, 7 ... sealing resin layer.

Claims (1)

【特許請求の範囲】 1 透光性の光路物質層により光学的に結合され
た半導体発光素子および半導体受光素子と、これ
ら両素子間を横切つて前記光路物質層中に埋設さ
れた絶縁性フイルムと、前記光路物質の外側を覆
つて形成された遮光性の封止樹脂層と、一端が前
記半導体発光素子または半導体受光素子の夫々対
応する素子に接続されると共に他端部が前記封止
樹脂層から外部に延出されたリードとを具備し、
前記第一の絶縁性フイルムの両面に、前記光路物
質層に対して良好な濡れ性を有する第二の絶縁性
フイルムを積層した積層絶縁性フイルムを用いた
ことを特徴とする光結合半導体装置。 2 前記光路物質層がシリコーン樹脂層であり、
前記第一の絶縁性フイルムがフツ素樹脂フイル
ム、前記第二の絶縁性フイルムがポリイミド樹脂
フイルムであることを特徴とする特許請求の範囲
第1項記載の光結合半導体装置。
[Scope of Claims] 1. A semiconductor light-emitting element and a semiconductor light-receiving element optically coupled by a light-transmitting optical path material layer, and an insulating film embedded in the optical path material layer across between these two elements. and a light-shielding sealing resin layer formed to cover the outside of the optical path material, one end of which is connected to the corresponding element of the semiconductor light-emitting element or the semiconductor light-receiving element, and the other end of which is connected to the sealing resin. and a lead extending outward from the layer,
An optical coupling semiconductor device characterized in that a laminated insulating film is used, in which a second insulating film having good wettability with respect to the optical path material layer is laminated on both surfaces of the first insulating film. 2. The optical path material layer is a silicone resin layer,
2. The optically coupled semiconductor device according to claim 1, wherein the first insulating film is a fluororesin film, and the second insulating film is a polyimide resin film.
JP60056512A 1985-03-20 1985-03-20 Photocoupling semiconductor device Granted JPS61214585A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60056512A JPS61214585A (en) 1985-03-20 1985-03-20 Photocoupling semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60056512A JPS61214585A (en) 1985-03-20 1985-03-20 Photocoupling semiconductor device

Publications (2)

Publication Number Publication Date
JPS61214585A JPS61214585A (en) 1986-09-24
JPH0311109B2 true JPH0311109B2 (en) 1991-02-15

Family

ID=13029175

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60056512A Granted JPS61214585A (en) 1985-03-20 1985-03-20 Photocoupling semiconductor device

Country Status (1)

Country Link
JP (1) JPS61214585A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766680A (en) * 1980-10-09 1982-04-22 Toshiba Corp Photocoupling semiconductor device
JPS5766679A (en) * 1980-10-09 1982-04-22 Toshiba Corp Photocoupling semiconductor device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766680A (en) * 1980-10-09 1982-04-22 Toshiba Corp Photocoupling semiconductor device
JPS5766679A (en) * 1980-10-09 1982-04-22 Toshiba Corp Photocoupling semiconductor device

Also Published As

Publication number Publication date
JPS61214585A (en) 1986-09-24

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