JPH03104863A - Electron beam evaporating source - Google Patents

Electron beam evaporating source

Info

Publication number
JPH03104863A
JPH03104863A JP24046489A JP24046489A JPH03104863A JP H03104863 A JPH03104863 A JP H03104863A JP 24046489 A JP24046489 A JP 24046489A JP 24046489 A JP24046489 A JP 24046489A JP H03104863 A JPH03104863 A JP H03104863A
Authority
JP
Japan
Prior art keywords
vapor deposition
electron beam
evaporation
deposition material
elevating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24046489A
Other languages
Japanese (ja)
Inventor
Masaru Kitamura
優 北村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP24046489A priority Critical patent/JPH03104863A/en
Publication of JPH03104863A publication Critical patent/JPH03104863A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To efficiently replenish a material for vapor deposition and to allow the adjustment in the height of the surface layer part of the material for vapor deposition by constituting the bottom of a part for housing the material for vapor deposition of a lifting base and providing a means for adjusting the lifting quantity thereof. CONSTITUTION:An electron beam evaporating source 10 is constituted of the cylindrical housing part 11 of the material for vapor deposition and a cylindrical part 12 for holding this part. The disk-shaped lifting base 22 is provided along the inner peripheral wall surface of the part 11 for housing the material for vapor deposition and a supporting shaft 23 is provided in the central part of the bottom of the lifting base 22. An annular magnet 24 is provided on the outer periphery of the cylindrical part 12 and an operating pin 25 is coupled thereto. A guide rail 26 is provided in the interme diate part of the operating pin 25 and an operating knob 27 is provided in the front end part of the operating pin 25. The operating knob 27 is raised to move the material 28 for vapor deposition upward when the material 28 is decreased by the repetition of the vapor deposition operation. The material 28 for vapor deposition is brought to the finest position where the material is irradiated with the electron bean E in this way.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、真空蒸着に使用される電子ビーム蒸発源に関
する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to an electron beam evaporation source used for vacuum evaporation.

(従来の技術) 一般に材質的に高純度の蒸着膜が要求される場合に、多
く用いられる電子ビーム蒸発源は話本的に第4図に示さ
れるように構成されている。この電子ビーム蒸発源1は
上部が磁極2、下部は冷却水が循環される基部3とから
構成され、この基部3の上部にはるつぼ4が設けられて
いる。また、上記基部3の側面にはフィラメント5と、
このフィラメント5に電流を流す電源装置6が設けられ
ている。そして、上記基部3の上部に設けられたるつぼ
4には、タンタル皿7が載置される。このタンタル皿7
には蒸着材8が盛られており、上記フィラメント5から
の電子ビームEがこの蒸着材8に照射されることで真空
中に蒸着材8の一部を蒸発させるようになっている。
(Prior Art) Generally, when a deposited film of high purity is required, an electron beam evaporation source that is often used is constructed as shown in FIG. 4. The electron beam evaporation source 1 is comprised of a magnetic pole 2 at the top and a base 3 at the bottom through which cooling water is circulated, and a crucible 4 is provided above the base 3. Further, a filament 5 is provided on the side surface of the base 3,
A power supply device 6 is provided to cause current to flow through the filament 5. A tantalum plate 7 is placed on the crucible 4 provided on the top of the base 3. This tantalum plate 7
A evaporation material 8 is placed in the evaporation material 8, and by irradiating the evaporation material 8 with the electron beam E from the filament 5, a part of the evaporation material 8 is evaporated in a vacuum.

このように構成された電子ビーム蒸発源1は連続して蒸
着作業を繰り返すと、上記タンタル皿7に盛られた蒸着
材8の量が減少し、次第に安定した蒸着ができなくなっ
てしまうものであった。そして、蒸着作業は図示しない
真空容器中で行われるため、蒸着室を大気開放し、蒸着
材8を補給して、再度真空状態にしこの状態でベーキン
グ作業を行い、電子ビーム蒸発IW1の作動を安定させ
た後に蒸着作業を再開するという作業性の悪いものであ
った。
When the electron beam evaporation source 1 configured in this way repeats the evaporation operation continuously, the amount of the evaporation material 8 placed in the tantalum dish 7 decreases, and stable evaporation gradually becomes impossible. Ta. Since the evaporation work is performed in a vacuum container (not shown), the evaporation chamber is opened to the atmosphere, the evaporation material 8 is replenished, the vacuum state is again established, and the baking work is performed in this state to stabilize the operation of the electron beam evaporation IW1. The workability was poor because the vapor deposition work had to be restarted after the process had been completed.

このため蒸着材8の補給作業の作業性は蒸着作業の効率
に大きな影響を与えてしまうものであつた。
For this reason, the workability of replenishing the vapor deposition material 8 has had a large effect on the efficiency of the vapor deposition work.

また、蒸着作業中に蒸着材8が次第に減少していくが、
蒸着材8の電子ビームEが照射される表層部分の高さを
調整できないので、安定した蒸着ができる時間が短く、
品質の高い蒸着膜を形成するためには装置の調整に非常
な峙間と労力を要するという問題があった。
In addition, although the vapor deposition material 8 gradually decreases during the vapor deposition process,
Since the height of the surface layer of the vapor deposition material 8 that is irradiated with the electron beam E cannot be adjusted, the time for stable vapor deposition is short.
There is a problem in that in order to form a deposited film of high quality, a great deal of time and effort is required to adjust the apparatus.

(発明が解決しようとする課+XJ) 一般的な電子ビーム蒸発源は蒸着材の補給構遣が設けら
れておらず、連続して蒸着作業を行う場合には、極めて
作業性の悪いものであった。電子ビームが照射される蒸
着材の表層位置の調整ができないので、安定した蒸着を
連続して行うことができなかった。
(Problem to be solved by the invention + Ta. Since the position of the surface layer of the vapor deposition material that is irradiated with the electron beam cannot be adjusted, stable vapor deposition cannot be performed continuously.

本発明は上記課題に着目してなされたものであり、蒸着
材の補給を効率よく行うことができ、かつ、電子ビーム
が照射される蒸着材の表層部分の高さ調節ができる電子
ビーム蒸発源を提供することを目的とする。
The present invention has been made in view of the above-mentioned problems, and provides an electron beam evaporation source that can efficiently replenish vapor deposition material and that can adjust the height of the surface layer of the vapor deposition material that is irradiated with the electron beam. The purpose is to provide

[発明の構成コ (課題を解決するための手段) (1)真空状態に保持される蒸着室を設け、この蒸着室
に蒸着材収容部を開口し、この蒸着月収容部に収容され
た蒸着材に電子ビームを照射する電子ビームガンを設け
、上記蒸着材収容部の底部を上記開口に向かって進退す
る昇降台で構成し、この昇降台を真空状態を保持して昇
降移動力を伝達する昇降調節機構を設け、この昇降調整
機構を調節する調節手段を設けた電子ビーム蒸発源。
[Configuration of the Invention (Means for Solving the Problems) (1) A vapor deposition chamber maintained in a vacuum state is provided, a vapor deposition material storage section is opened in this vapor deposition chamber, and a vapor deposition material accommodated in the vapor deposition material storage section is provided. An elevating platform is provided with an electron beam gun that irradiates the material with an electron beam, and the bottom of the vapor deposition material storage section is configured with an elevating platform that moves forward and backward toward the opening. An electron beam evaporation source provided with an adjustment mechanism and adjustment means for adjusting the elevation adjustment mechanism.

(2)真空状態に保持される蒸着室を設け、この蒸着室
に蒸着材収容部を開口し、この蒸着材収容部に収容され
た蒸着材に対して電子ビームを照1・tする電子ビーム
ガンを設け、上記蒸着材収容部内に開口に向けて進退自
在かつ神脱自在に蒸着材収容器を挿入し、この蒸着材収
容器の底部を昇降自在に保持する昇降台を設け、真空状
態を保持して上記昇降台を保持して上記昇降台を保持し
かつ昇降移動ノノを伝達する昇降調節機構を設け、この
昇降調節機構を調節する調節手段を設けた電子ビム蒸発
源。
(2) An electron beam gun that provides an evaporation chamber maintained in a vacuum state, opens a evaporation material storage section in the evaporation chamber, and illuminates the evaporation material accommodated in the evaporation material storage section with an electron beam. A vapor deposition material container is inserted into the vapor deposition material container so as to be able to move forward and backward toward the opening and can be freely removed, and an elevating platform is provided to hold the bottom of the vapor deposition material container so that it can be raised and lowered to maintain a vacuum state. An electron beam evaporation source comprising: an elevating adjustment mechanism for holding the elevating table and transmitting an elevating movement; and an adjusting means for adjusting the elevating adjusting mechanism.

(作 用) 〈1)調節手段によって昇降調節機構を調節することで
、昇降台を蒸着室側の開口に向けて上昇させることで、
連続して蒸着ができ、かつ、電子ビームガンからの最良
の電子ビーム照射位置に蒸着材の表層部分を位置させる
ことができる。
(Function) <1) By adjusting the elevation adjustment mechanism using the adjustment means, the elevation platform is raised toward the opening on the side of the deposition chamber,
Vapor deposition can be performed continuously, and the surface layer portion of the vapor deposition material can be positioned at the best position for irradiation of the electron beam from the electron beam gun.

(2)調節手段によって昇降調節機構を調節することで
、昇降台を蒸着室側の開口に向けて上昇させることで、
蒸着材収容器を上昇させ蒸着材の表層部分を電子ビーム
に対して最良の位置に維持できる。また、蒸着財収容器
は揮脱自在なので、蒸着材の補給、交換および装置の洗
浄が極めて容易にできる。
(2) By adjusting the elevation adjustment mechanism using the adjustment means, the elevation platform is raised toward the opening on the deposition chamber side,
By raising the vapor deposition material container, the surface layer of the vapor deposition material can be maintained in the best position relative to the electron beam. Furthermore, since the vapor deposition material container is volatilizable, replenishment and replacement of the vapor deposition material and cleaning of the apparatus are extremely easy.

(実施例) 本発明の第1実施例を第1図を参!1Gして説明する。(Example) Please refer to Figure 1 for the first embodiment of the present invention! I will explain using 1G.

図中に示される電子ビーム蒸発源10は蒸谷材収容部1
1と、この蒸着材収容部11のF部に一体に形成され下
端が閉鎖された筒状部12とを備えている。ここで、蒸
着収容部11およびこれに密閉状態を保持するように一
体に形或された筒状部12は例えば非磁性金属からなる
非磁性体からなっている。
The electron beam evaporation source 10 shown in the figure is an evaporation material storage section 1.
1, and a cylindrical part 12 which is integrally formed with the F part of this vapor deposition material storage part 11 and whose lower end is closed. Here, the evaporation storage section 11 and the cylindrical section 12 formed integrally therewith so as to maintain a sealed state are made of a nonmagnetic material such as a nonmagnetic metal.

この、蒸着材収容部11はほぼ円筒状に形成されており
、外側壁の一部にはフランジ部13が形成されている。
This vapor deposition material storage section 11 is formed into a substantially cylindrical shape, and a flange section 13 is formed in a part of the outer wall.

そして、この電子ビーム蒸発源10は蒸着装置14の蒸
着室15の底部壁面に貫通状態で揮着されており、上記
フランジ部13が蒸着室15の内壁而に接合し、この内
壁面に対してねじaにより結合されている。
The electron beam evaporation source 10 is evaporated through the bottom wall of the evaporation chamber 15 of the evaporation apparatus 14, and the flange 13 is joined to the inner wall of the evaporation chamber 15. They are connected by screw a.

この電子ビーム蒸発源10の蒸着材収容部11の開口1
7は上記蒸着室側に開口している。また、上記フランジ
部13が設けられた位置に対向する蒸着材収容部11の
外周部には電子ビームガン18が設けられている。この
電子ビームガン18にはマグネット18aが設けられて
おり、電子ビム18の照射位置を変化させるようになっ
ている。
Opening 1 of evaporation material storage section 11 of this electron beam evaporation source 10
7 opens to the vapor deposition chamber side. Further, an electron beam gun 18 is provided on the outer periphery of the vapor deposition material accommodating portion 11 opposite to the position where the flange portion 13 is provided. This electron beam gun 18 is provided with a magnet 18a, so that the irradiation position of the electron beam 18 can be changed.

また、上記電子ビーム蒸発源10の神着部には蒸着室1
5の外壁面に接合しねじaで結合される環状のシールプ
レート20が設けられており、このシールプレート20
の内周縁と上記蒸着室15の外壁面との間にはシール材
21が挟み込まれ、上記電子ビーム蒸発源10の挿着部
分をシールするようになっている。
Further, a deposition chamber 1 is provided at the deposition part of the electron beam evaporation source 10.
An annular seal plate 20 is provided which is joined to the outer wall surface of 5 and connected with screws a, and this seal plate 20
A sealing material 21 is sandwiched between the inner peripheral edge of the evaporation chamber 15 and the outer wall surface of the vapor deposition chamber 15 to seal the insertion portion of the electron beam evaporation source 10.

一方、上記電子ビーム蒸発源10の上記蒸着材収容部1
1は、その開口17に続く内周壁面が円筒状に形成され
ており、この内周壁面に沿って形成された円盤状の昇降
台22が上下方向に摺動自在に設けられている。
On the other hand, the evaporation material storage section 1 of the electron beam evaporation source 10
1 has a cylindrical inner circumferential wall surface following the opening 17, and a disk-shaped lifting platform 22 formed along this inner circumferential wall surface is provided to be slidable in the vertical direction.

この昇降台22の底部中央部には上記筒状部12に同心
状に挿入される支持軸23が設けられている。この支持
軸23は例えば磁性金属等の磁性体から形成されている
A support shaft 23 that is inserted concentrically into the cylindrical portion 12 is provided at the center of the bottom of the lifting platform 22 . The support shaft 23 is made of a magnetic material such as a magnetic metal.

そして、上記筒状部12の外周部には環状磁石24が設
けられている。この環状磁石24には径方向に突出する
操作ピン25が結合されている。
An annular magnet 24 is provided on the outer periphery of the cylindrical portion 12. An operating pin 25 that projects in the radial direction is coupled to this annular magnet 24.

この操作ビン25の中途部は上記筒状部12に沿ってガ
イドレール26が設けられており、このガイドレール2
6は上記操作ビン25を保持する抵抗力をもって摺動自
在にガイドするようになっている。そして、この操作ピ
ン25の先端部には操作ノブ27が設けられている。こ
の操作ノブ27を操作することで、環状磁石24を矢印
A方向に移動することができるようになっている。そし
て、この環状磁石24の移動に従って、筒状部12内の
支持輔23が移動し、上記昇降台22が矢印A方向に移
動する。ここで、上記昇降台22、支持軸23および環
状磁石24とにより昇降調節機構が形成されている。ま
た、操作ビン25、ガイドレール26および操作ノブ2
7とにより調節手段が形成されている。
A guide rail 26 is provided along the cylindrical portion 12 in the middle of the operation bin 25.
6 is adapted to slidably guide the operation bin 25 with a resistance force that holds it. An operating knob 27 is provided at the tip of the operating pin 25. By operating this operating knob 27, the annular magnet 24 can be moved in the direction of arrow A. As the annular magnet 24 moves, the support member 23 within the cylindrical portion 12 moves, and the elevating table 22 moves in the direction of arrow A. Here, the elevating table 22, the support shaft 23, and the annular magnet 24 form an elevating adjustment mechanism. In addition, the operation bin 25, the guide rail 26, and the operation knob 2
7 forms an adjusting means.

このように構成した電子ビーム蒸発源10の上記蒸着材
収容部11には蒸着材28が収容される。
The vapor deposition material 28 is accommodated in the vapor deposition material storage section 11 of the electron beam evaporation source 10 configured in this manner.

つまり、上記昇降台22を上記環状磁石24が最下位の
位置で保持し、この状態で蒸着材28を収容する。そし
て、上記電子ビームガン18により蒸着材28に対して
電子ビームEを照射する。この電子ビームEはマグネッ
ト18aによって蒸着材28の上部のほぼ全域に電子ビ
ームEを揺動するように構成されており、開口17から
露出された蒸着材28をほぼ均一に蒸発させる。
That is, the lifting platform 22 is held at the lowest position by the annular magnet 24, and the vapor deposition material 28 is accommodated in this state. Then, the electron beam gun 18 irradiates the vapor deposition material 28 with the electron beam E. This electron beam E is configured to be oscillated over almost the entire upper part of the vapor deposition material 28 by a magnet 18a, and the vapor deposition material 28 exposed from the opening 17 is evaporated almost uniformly.

そして、連続的に蒸着作業を繰り返していくと次第に蒸
着材28が減少していく。この蒸着材28を図示しない
観察窓から確認し、減少している場合には上記操作ノブ
27を必要分上昇させ、蒸着材28を上方に移動させる
。これにより電子ビームEの照射される最良の位置に蒸
着材28を位置させることができる。この蒸着材28は
図中の寸法Bの範囲で移動できるので、従来構造に比較
して、蒸着材28の補給の頻度を減少し、連続して安定
した良質の蒸着作業を効率的に行うことができる。
Then, as the vapor deposition operation is continuously repeated, the vapor deposition material 28 gradually decreases. This vapor deposition material 28 is checked through an observation window (not shown), and if the amount has decreased, the operation knob 27 is raised by the necessary amount to move the vapor deposition material 28 upward. This allows the vapor deposition material 28 to be positioned at the best position to be irradiated with the electron beam E. Since this vapor deposition material 28 can be moved within the range of dimension B in the figure, compared to the conventional structure, the frequency of replenishment of the vapor deposition material 28 is reduced, and continuous, stable, and high-quality vapor deposition work can be performed efficiently. I can do it.

以下、本発明の第2実施例を第2図および第3図を参照
して説明する。図中に示される電子ビーム発生源30は
蒸着収容部31と、この蒸着収容部31の下部に一体に
形成され下端が閉鎖された筒状部32とを備えている。
A second embodiment of the present invention will be described below with reference to FIGS. 2 and 3. The electron beam generation source 30 shown in the figure includes a vapor deposition housing section 31 and a cylindrical section 32 that is integrally formed under the vapor deposition housing section 31 and whose lower end is closed.

ここで、上記筒状部32は非磁性材料からなっている。Here, the cylindrical portion 32 is made of a non-magnetic material.

この電子ビーム発生源30は蒸着装置33の蒸着室34
の底部壁面に貫通した状態で設けられている。上記蒸着
収容部31の外周部には一体にフランジ部36が設けら
れており、このフランジ部36は上記蒸着室34の底部
内壁面に接合され、ねじaにより結合されている。また
、上記蒸着収容部31が貫通された蒸着室34の底壁面
は高い精度で形成されており、外側部には、蒸着収容部
31の外周部に沿って環状のシール材37が挿着されて
おり、この外側からさらに環状のシールプレート38が
接合され、上記蒸着室34の外壁面にねじaにより結合
されている。これにより上記シール材37は蒸着収容部
31と蒸着室34の縁部との間に挾み込まれシールされ
ている。
This electron beam generation source 30 is a vapor deposition chamber 34 of a vapor deposition apparatus 33.
It is provided so as to penetrate through the bottom wall of the. A flange portion 36 is integrally provided on the outer peripheral portion of the vapor deposition storage portion 31, and this flange portion 36 is joined to the bottom inner wall surface of the vapor deposition chamber 34 by screws a. Further, the bottom wall surface of the vapor deposition chamber 34 through which the vapor deposition storage section 31 is penetrated is formed with high precision, and an annular sealing material 37 is inserted along the outer circumference of the vapor deposition storage section 31 on the outer side. An annular seal plate 38 is further joined from the outside and connected to the outer wall surface of the vapor deposition chamber 34 by screws a. As a result, the sealing material 37 is sandwiched between the vapor deposition housing portion 31 and the edge of the vapor deposition chamber 34 and sealed.

さらに、蒸着収容部31の上記蒸着室34に面する開口
35に連続する内周面は円筒状に形成されており、この
円筒の軸心に沿って昇降移動する円盤状の昇降台39が
形成されている。この昇降台39は下面中央部に上記筒
状部32に同心状かつ軸心方向に{a動自在に挿入され
る支持軸40が一体に設けられている。この支持軸40
は磁性材料からなっている。そして、上記筒状部32に
は同心状の環状磁石41が環装されており、軸心方向に
移動自在になっている。この環状磁石41には径方向か
ら結合する操作ピン42が設けられており、この操作ピ
ン42の中途部は上記筒状部32の軸心にほほ平行に設
けられたガイドレール43が設けられている。このガイ
ドレール43は上記環状磁石41を保持する抵抗力をも
ちかつ{盲動自在に上記操作ピン42をガイドしている
。上記操作ビン42の先端部には操作ノブ44が設けら
れており、この操作ノブ44を矢印A方向に操作するこ
とで環状磁石41を昇降操作し、これにより昇降台3つ
を昇降操作するようになっている。
Further, the inner circumferential surface of the vapor deposition storage section 31 that is continuous with the opening 35 facing the vapor deposition chamber 34 is formed in a cylindrical shape, and a disk-shaped lifting platform 39 that moves up and down along the axis of this cylinder is formed. has been done. A support shaft 40 is integrally provided at the center of the lower surface of the lifting table 39. The support shaft 40 is movably inserted in the cylindrical portion 32 concentrically and in the axial direction. This support shaft 40
is made of magnetic material. A concentric annular magnet 41 is mounted around the cylindrical portion 32 and is movable in the axial direction. This annular magnet 41 is provided with an operating pin 42 that is coupled from the radial direction, and a guide rail 43 that is provided almost parallel to the axis of the cylindrical portion 32 is provided in the middle of this operating pin 42. There is. This guide rail 43 has a resistance force that holds the annular magnet 41 and guides the operating pin 42 in a blindly movable manner. An operation knob 44 is provided at the tip of the operation bin 42, and by operating this operation knob 44 in the direction of arrow A, the annular magnet 41 is raised and lowered, thereby raising and lowering the three lifting platforms. It has become.

ここで、昇降台39、支持軸40および環状磁石41と
により昇降調節機溝を構成している。また、操作ピン4
2、ガイドレール43および操作ノブ44により調節手
段が構成されている。
Here, the elevator table 39, the support shaft 40, and the annular magnet 41 constitute an elevator adjuster groove. In addition, operation pin 4
2. The guide rail 43 and the operating knob 44 constitute an adjusting means.

さらに、上記蒸着収容部31の開口35の内部には蒸着
材収容器45が収容されている。この蒸着材収容器45
は上記蒸着材収容部31の内側壁面に沿った形状になっ
ており、底部は上記昇降台39に支えられている。この
蒸着材収容器45には蒸着材46が収容されている。
Furthermore, a vapor deposition material container 45 is accommodated inside the opening 35 of the vapor deposition storage section 31 . This vapor deposition material container 45
has a shape that follows the inner wall surface of the vapor deposition material storage section 31, and its bottom is supported by the lifting table 39. A vapor deposition material 46 is accommodated in this vapor deposition material container 45 .

そして、上記蒸着収容部31の蒸着室34内側に位置す
る側面には電子ビームガン47が設けられており、この
電子ビームガン47の近傍にはマグネット47aが設け
られており、このマグネット47aにより電子ビームE
の照対位置を連続的に変更して、上記蒸着材46の表層
にほぼ均一に照射されるようになっている。
An electron beam gun 47 is provided on the side of the vapor deposition storage section 31 located inside the vapor deposition chamber 34, and a magnet 47a is provided near the electron beam gun 47.
The target position of the vapor deposition material 46 is continuously changed so that the surface layer of the vapor deposition material 46 is irradiated almost uniformly.

このように横成された電子ビーム蒸発源30により連続
的に蒸着作業を行うと、蒸着材収容器45内に収容され
た蒸着材46が次第に減少していく。このように蒸着材
46が減少したのを図示しない観察窓から確認した場合
には上記操作ノブ44を上昇させ、第3図に示されるよ
うに蒸着材46の表層位置を通常位置に合わせることが
できる。
When the evaporation work is continuously performed using the electron beam evaporation source 30 arranged in this way, the evaporation material 46 accommodated in the evaporation material container 45 gradually decreases. When it is confirmed from the observation window (not shown) that the vapor deposition material 46 has decreased in this way, the operation knob 44 can be raised to adjust the surface layer position of the vapor deposition material 46 to the normal position as shown in FIG. can.

これにより、新たな蒸着材46の補給を必要とせずに、
良質でかつ安定した蒸着作業を続行することができる。
As a result, without the need to replenish new vapor deposition material 46,
High quality and stable vapor deposition work can be continued.

これにより、補給作業の頻度を威少し作業性を向上でき
、かつ品質の高い蒸着が安定して行える。
As a result, workability can be improved by reducing the frequency of replenishment work, and high-quality vapor deposition can be stably performed.

また、上記蒸着材収容器45は蒸着材収容部31に対し
てtlli脱可能に挿入されているので、蒸着中に蒸着
材46が溶融し下層へ流れ、凝固して5 も、蒸着材収容器4合内で凝固する。これにより、蒸る
材収容器4≧ごと交換することにより、蒸i−j材46
の交換、および補給作業が極めて容易にてきる。また、
装置の洗浄作業も容易になる。
Further, since the vapor deposition material container 45 is removably inserted into the vapor deposition material container 31, even if the vapor deposition material 46 melts during vapor deposition, flows to the lower layer, and solidifies, the vapor deposition material container 45 Solidifies within 4 hours. As a result, by replacing the steaming material container 4≧, the steaming material 46
Replacement and replenishment work becomes extremely easy. Also,
Cleaning of the device also becomes easier.

なお、本発明は上記各実施例にのみ限定されない。例え
ば、昇降調節機構の1凋節手段は模作ノブ27.44を
操作するものであるが、これに限定されず、蒸着材28
.46の減少を自動検知し、これに応じて環状磁石24
.41等の昇降調節機構を駆動する自動調節装置を設け
ることも考えられる。
Note that the present invention is not limited to the above embodiments. For example, one step of the elevation adjustment mechanism is to operate the imitation knob 27.44, but is not limited to this, and the vapor deposition material 28
.. 46 is automatically detected, and the annular magnet 24 is automatically detected accordingly.
.. It is also conceivable to provide an automatic adjustment device for driving the elevation adjustment mechanism such as 41.

[発明の効果] (1)蒸着材収容部の底部を昇降自在な昇降台によって
構成することで、蒸着月の減少にともない蒸着材を上昇
させ、広着材の表層レベルを^七子ビームの照射に適し
たレベルに保つことかできる。
[Effects of the invention] (1) By configuring the bottom of the vapor deposition material storage section with a lifting platform that can be raised and lowered, the vapor deposition material is raised as the amount of vapor deposition decreases, and the surface layer level of the wide deposit material is irradiated with the Nanako beam. Can be maintained at an appropriate level.

これにより、従来{114造に比較して蒸着材の収容瓜
を堆大でき、連続して蒸着作朶をする場合には特に蒸着
材の補給頻度を減少できるとともに、蒸着材の減少に即
座に対応できるので、常に良質な蒸着膜を安定して得る
ことのできる蒸着作業を実現できる。
As a result, the capacity for storing vapor deposition material can be increased compared to the conventional {114 structure, and the frequency of replenishment of vapor deposition material can be particularly reduced when continuous vapor deposition is performed, and the reduction in vapor deposition material can be immediately dealt with. As a result, it is possible to realize a vapor deposition operation that can always consistently obtain a high-quality vapor deposited film.

(2)蒸着材収容部の底部を昇降自在な昇降台で形成し
、この昇降台の上部に蒸着材収容器を挿脱自在に挿入し
たことにより、蒸着材の補給および交換時には上記蒸着
材収容器ごと交換することで、極めて容易に補給および
交換作業ができる。
(2) The bottom of the evaporation material storage section is formed with a lifting platform that can be raised and lowered, and the evaporation material container is removably inserted into the upper part of the elevator, so that the evaporation material can be stored when replenishing or replacing the evaporation material. Replenishment and replacement work is extremely easy by replacing the entire container.

また、上記昇降台を上昇させることにより、蒸着材が減
少した際に容易に蒸着材の表層レベルを上昇できるので
、連続した蒸着作業に極めて高い効果を発生し良質な蒸
着膜を連続かつ安定して得ることができる。また、蒸着
材収容器ごと交換する構遣なので、洗浄作業を簡単にし
、総合的な作業効率を高めることかできる。
In addition, by raising the above-mentioned lifting platform, the surface layer level of the evaporation material can be easily raised when the amount of evaporation material decreases, which is extremely effective for continuous evaporation work and ensures continuous and stable high-quality evaporation films. You can get it. In addition, since the entire vapor deposition material container can be replaced, cleaning work can be simplified and overall work efficiency can be improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明における第1実施例の電子ビム蒸発源を
示す正断面図、第2図および第3図は本発明の第2実施
例であり、第2図は電子ビーム蒸発源を示す正断面図、
第3図は昇降台を上昇させた電子ビーム蒸発源を示す正
断面図、第4図は従来の電子ビーム蒸発源の正面図であ
る。 10・・・電子ビーム蒸発源、11・・・蒸着材収容部
、22・・・昇降台(昇降調節機構)、23・・・支持
軸(昇降一節機構)、24・・・環状磁石(昇降調節機
+Ak)、25・・・操作ピン(213m手段)、26
・・・ガイドレール(調節手段)、27・・・操作ノブ
(調節手段)、28・・・蒸着材、E・・・電子ビーム
、45・・・蒸着材収容器。
FIG. 1 is a front cross-sectional view showing an electron beam evaporation source according to a first embodiment of the present invention, FIGS. 2 and 3 are a second embodiment of the present invention, and FIG. 2 shows an electron beam evaporation source. Front sectional view,
FIG. 3 is a front sectional view showing the electron beam evaporation source with the lifting platform elevated, and FIG. 4 is a front view of the conventional electron beam evaporation source. DESCRIPTION OF SYMBOLS 10... Electron beam evaporation source, 11... Evaporation material storage part, 22... Lifting table (lifting/lowering adjustment mechanism), 23... Support shaft (lifting/lowering joint mechanism), 24... Annular magnet (lifting/lowering adjustment mechanism) Adjuster +Ak), 25... Operation pin (213m means), 26
...Guide rail (adjustment means), 27.. Operation knob (adjustment means), 28.. Vapor deposition material, E.. Electron beam, 45.. Vapor deposition material container.

Claims (2)

【特許請求の範囲】[Claims] (1)真空状態に保持される蒸着室内に開口される蒸着
材収容部と、この蒸着材収容部に収容された蒸着材に対
して電子ビームを照射する電子ビームガンとを具備した
電子ビーム蒸発源において、上記蒸着材収容部の底部を
上記開口に向かって進退する昇降台によって構成し、上
記蒸着室の真空状態を保持し上記昇降台に昇降移動力を
伝達する昇降調節機構を設け、この昇降調節機構の昇降
移動量を調節する調節手段を設けたことを特徴とする電
子ビーム蒸発源。
(1) An electron beam evaporation source comprising an evaporation material accommodating section opened into a evaporation chamber maintained in a vacuum state, and an electron beam gun that irradiates the evaporation material accommodated in the evaporation material accommodating section with an electron beam. The bottom of the vapor deposition material storage section is configured with an elevating table that advances and retreats toward the opening, and an elevating adjustment mechanism is provided that maintains the vacuum state of the vapor deposition chamber and transmits an elevating force to the elevating table. An electron beam evaporation source characterized by being provided with an adjustment means for adjusting the amount of vertical movement of the adjustment mechanism.
(2)真空状態に保持される蒸着室内に開口された蒸着
材収容部と、この蒸着材収容部に収容された蒸着材に対
して電子ビームを照射する電子ビームガンとを具備した
電子ビーム蒸発源において、上記蒸着材収容部の開口に
向けて進退自在に蒸着材収容器を挿脱自在に挿入し、こ
の蒸着材収容器の底部を昇降自在に保持する昇降台を設
け、真空状態を保持して上記昇降台を保持しかつ昇降移
動力を伝達する昇降調節機構を設け、この昇降調節機構
を調節する調節手段を設けたことを特徴とする電子ビー
ム蒸発源。
(2) An electron beam evaporation source comprising an evaporation material accommodating part opened in a evaporation chamber maintained in a vacuum state and an electron beam gun that irradiates the evaporation material housed in the evaporation material accommodating part with an electron beam. In this method, a vapor deposition material container is removably inserted into the opening of the vapor deposition material container so as to move forward and backward toward the opening of the vapor deposition material container, and a lifting platform is provided to hold the bottom of the vapor deposition material container so that it can be raised and lowered to maintain a vacuum state. An electron beam evaporation source characterized in that an elevating adjustment mechanism for holding the elevating table and transmitting an elevating and lowering movement force is provided, and an adjusting means for adjusting the elevating adjustment mechanism.
JP24046489A 1989-09-16 1989-09-16 Electron beam evaporating source Pending JPH03104863A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24046489A JPH03104863A (en) 1989-09-16 1989-09-16 Electron beam evaporating source

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24046489A JPH03104863A (en) 1989-09-16 1989-09-16 Electron beam evaporating source

Publications (1)

Publication Number Publication Date
JPH03104863A true JPH03104863A (en) 1991-05-01

Family

ID=17059897

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24046489A Pending JPH03104863A (en) 1989-09-16 1989-09-16 Electron beam evaporating source

Country Status (1)

Country Link
JP (1) JPH03104863A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011053035A (en) * 2009-08-31 2011-03-17 Toshiba Corp Board inspection apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011053035A (en) * 2009-08-31 2011-03-17 Toshiba Corp Board inspection apparatus
US8106672B2 (en) 2009-08-31 2012-01-31 Kabushiki Kaisha Toshiba Substrate inspection apparatus

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