JPH0293317A - Optical displacement measuring apparatus - Google Patents

Optical displacement measuring apparatus

Info

Publication number
JPH0293317A
JPH0293317A JP24618488A JP24618488A JPH0293317A JP H0293317 A JPH0293317 A JP H0293317A JP 24618488 A JP24618488 A JP 24618488A JP 24618488 A JP24618488 A JP 24618488A JP H0293317 A JPH0293317 A JP H0293317A
Authority
JP
Japan
Prior art keywords
measured
light
reflected
displacement
isolator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24618488A
Other languages
Japanese (ja)
Other versions
JP2573673B2 (en
Inventor
Kenji Matsumaru
松丸 憲司
Atsuro Tanuma
敦郎 田沼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP63246184A priority Critical patent/JP2573673B2/en
Publication of JPH0293317A publication Critical patent/JPH0293317A/en
Application granted granted Critical
Publication of JP2573673B2 publication Critical patent/JP2573673B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To measure the displacement of an object to be measured with high accuracy by cutting the return beam from the object to be measured by arranging a beam isolator on the beam path between a beam source and the object to be measured. CONSTITUTION:The laser beam emitted from an LD 11 is applied to an object 4 to be measured through a collimator lens 12, a beam isolator 22 and a projection lens 13. A part of the laser beam reflected and scattered from the surface of the object 14 to be measured is incident to a beam detector 16 through an image forming lens 15 and also incident to the beam isolator 22 through the projection lens 13. The reflected beam incident to the beam isolator 22 passes through a 1/4 wavelength plate 20 to be incident to a polarizing beam splitter 21 but, since the reflected beam passed through the 1/4 wavelength plate 20 crosses the polarizing direction of the laser beam from the LD 11 at a right angle, said beam is reflected by the polarizing surface of the polarizing beam splitter 20. By this method, the return beam from the object 4 to be measured is cut by the beam isolator 22 to control the oscillation state of the LD 11 stably to make it possible to measure the displacement of the object 4 to be measured with high accuracy.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、肢8−1定対象物の変位を光学的にilN定
する光学式変位apl定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an optical displacement apl determination device for optically determining the displacement of a limb 8-1 constant object.

〔従来の技術〕[Conventional technology]

近年、レーザ光等を用いて被測定対象物の変位を高精度
にfl?J定する光学式変位測定装置が開発され、様々
な分野で使用されている。この種の非接触型変位FAI
I定装置は測定方式により種々のものがあり、例えば1
1?1定原理として三角fil ffl法を用いた光学
式変位測定装置は第2図に示すような構成となっている
。同図において、1は光源としてのレーザダイオード(
以下LDと略称する)で、このLDIから出射したレー
ザ光(測定光)はコリメータレンズ2および投光レンズ
3を介して被Jll+定対象物4の表面に照射されるよ
うになっている。
In recent years, the displacement of the object to be measured has been measured with high precision using laser light, etc. Optical displacement measuring devices that determine J have been developed and are used in various fields. This kind of non-contact displacement FAI
There are various types of I-determining devices depending on the measurement method.For example, 1
An optical displacement measuring device using the triangular fil ffl method as a 1?1 constant principle has a configuration as shown in FIG. In the figure, 1 is a laser diode (
(hereinafter abbreviated as LD), the laser light (measuring light) emitted from this LDI is irradiated onto the surface of a target object 4 via a collimator lens 2 and a projection lens 3.

また、6は彼71−1定対象物4の表面で反射・散乱し
たレーザ光の一部を結像レンズ5を介して受光する光検
出器で、この光検出器6で検出された反射光は電気信号
に変換され、図示しない演算部へ入力されるようになっ
ている。
Further, 6 is a photodetector that receives a part of the laser beam reflected and scattered on the surface of the target object 4 of 71-1 through an imaging lens 5, and the reflected light detected by this photodetector 6 is is converted into an electrical signal and input to a calculation section (not shown).

このように構成される光学式変位測定装置は、結像レン
ズ5を通して光検出器6の受光面上に結像された反射光
の光点が破線で示す如く被測定対象物4の変位量に応じ
て移動する。したがって、前記演算部では光検出器6の
両側から流れ出す電流11+12を電圧V 1 、 V
 2に変換し、(Vt−V2 ) / (Vl +V2
 )を演算することにより被測定対象物4の変位Elx
を求めている。また、図中7はLDIのレーザ出力を検
出するフォトディテクタ、8はLDIのレーザ出力を駆
動回路9ヲ介して制御するコントローラで、このコント
ローラ8には前記フォトデイチクタフの出力が入力され
ている。
The optical displacement measuring device configured as described above is configured so that the light spot of the reflected light formed on the light receiving surface of the photodetector 6 through the imaging lens 5 corresponds to the amount of displacement of the object to be measured 4 as shown by the broken line. Move accordingly. Therefore, in the calculation section, the currents 11+12 flowing from both sides of the photodetector 6 are converted into voltages V 1 and V
2, (Vt-V2) / (Vl +V2
) by calculating the displacement Elx of the object to be measured 4
I'm looking for. Further, in the figure, 7 is a photodetector that detects the laser output of the LDI, and 8 is a controller that controls the laser output of the LDI via a drive circuit 9. The output of the photodetector is input to this controller 8. .

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところで、このような従来の光学式変位測定装置では、
彼71P1定対象物4の表面で反射・散乱したレーザ光
の一部が投光レンズ3、コリメータレンズ2を通ってL
DIに戻ることがあり、被測定対象物4からの反射光が
LDIに戻るとLDlの出力が見掛は上大きくなる。そ
して、これをフォトディテクタ7がLDIの出力として
検出しまうため、コントローラ8が作動し、LDIの出
力が変動して7IN定誤差が生じるという問題があった
。なお、これは被測定対象物4の表面が鏡面に近いもの
ほど影響を受けやすかった。
By the way, in such conventional optical displacement measuring devices,
Part of the laser beam reflected and scattered on the surface of the target object 4 passes through the projection lens 3 and the collimator lens 2.
When the reflected light from the object to be measured 4 returns to the LDI, the output of the LDl becomes apparently larger. Then, since the photodetector 7 detects this as the output of the LDI, the controller 8 is activated, causing the output of the LDI to fluctuate, resulting in a 7IN constant error. Note that this effect was more likely to occur as the surface of the object to be measured 4 was closer to a mirror surface.

本発明はこのような問題点を解消するためになされたも
ので、その目的とするところは、披AH定対象物からの
戻り光をカットでき、被測定対象物の変位を高精度に測
定可能な光学式変位i’l11定装置を提供しようとす
るものである。
The present invention has been made to solve these problems, and its purpose is to cut the return light from the object to be measured and to measure the displacement of the object with high precision. The present invention aims to provide an optical displacement i'l11 constant device.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題を解決するために本発明は、披A−1定対象物
に測定光を照射する光源と、前記被測定対象物からの反
射光を結像光学系を介して受光する光検出器と、この光
検出器の受光面上に結像された反射光の光点位置から前
記被測定対象物の変位量を算出する演算部とを具備した
光学式変位測定装置において、前記光源と披71P1定
対象物との間の光路上に光アイソレータを配設したこと
を特徴とするものである。
In order to solve the above problems, the present invention includes a light source that irradiates measurement light onto an object to be measured, and a photodetector that receives reflected light from the object to be measured via an imaging optical system. , an optical displacement measuring device comprising: a calculation unit that calculates the displacement amount of the object to be measured from the light spot position of the reflected light imaged on the light receiving surface of the photodetector; This is characterized by an optical isolator disposed on the optical path between the target and the target object.

〔作 用〕[For production]

本発明においては、光源と披A>1定対象物との間の光
路上に光アイソレータを配設することにより、被測定対
象物からの戻り光を光アイソレータでカットすることが
できる。
In the present invention, by disposing an optical isolator on the optical path between the light source and the object with A>1, the optical isolator can cut the return light from the object to be measured.

〔実施例〕〔Example〕

以下、図面を参照して本発明の一実施例を説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示す光学式変位iljl装
定の概略構成図で、この光学式変位allJ定装置はL
Dllから出射したレーザ光をコリメータレンズ12お
よび集光レンズ13を介して披M1定対象物14に照射
し、被測定対象物14の表面で反射・散乱したレーザ光
の一部を結像レンズ15を介して光検出器16で受光す
る構成となっている。
FIG. 1 is a schematic configuration diagram of an optical displacement iljl setting showing an embodiment of the present invention.
The laser beam emitted from the Dll is irradiated onto the M1 constant object 14 via the collimator lens 12 and the condensing lens 13, and a part of the laser beam reflected and scattered on the surface of the object to be measured 14 is transferred to the imaging lens 15. The configuration is such that the light is received by the photodetector 16 via the photodetector 16.

そして、光検出器16で受光した反射光を電気信号に変
換して図示しない演算部へ入力し、前述した如く結像レ
ンズ15を通して光検出器16の受光面上に結像された
反射光の光点位置から被測定対象物14の変位aXを算
出するように構成されている。
Then, the reflected light received by the photodetector 16 is converted into an electrical signal and inputted to a calculation section (not shown), and the reflected light is imaged on the light receiving surface of the photodetector 16 through the imaging lens 15 as described above. It is configured to calculate the displacement aX of the object to be measured 14 from the light spot position.

上記コリメータレンズ12と投光レンズ13との間には
、1/4波長板20と偏光ビームスプリッタ21とから
構成される光アイソレータ22が配設されており、この
光アイソレータ22で被71?定対象物4からの戻り光
をカットしている。なお、LDlは駆動回路19を介し
てコントローラ18で制御されており、コントローラ1
8にはフ第1・ディテクタ17の出力が入力されている
An optical isolator 22 composed of a quarter-wave plate 20 and a polarizing beam splitter 21 is disposed between the collimator lens 12 and the projection lens 13. Return light from the fixed object 4 is cut off. Note that the LDl is controlled by the controller 18 via the drive circuit 19, and the controller 1
8, the output of the first detector 17 is input.

次にこのように構成される光学式変位Jl定装置の作用
を説明する。
Next, the operation of the optical displacement Jl determination device configured as described above will be explained.

LDllから出射したレーザ光はコリメータレンズ12
、光アイソレータ22および投光レンズ13を介して彼
/lカ1定対象物14に照射される。そして、被測定対
象物14の表面で反射・散乱したレーザ光の一部は結像
レンズ15を介して光検出器16に入射するとともに、
投光レンズ13を介して光アイソレータ22に入射する
。光アイソレータ22に入射した反射光は1/4波長板
20を通過して偏光ビームスプリッタ21に入射するが
、1/4波長板20を通過した反射光は偏向方向がLD
IIからのレーザ光の偏光方向と直交しているため、偏
光ビームスプリッタ20の偏光面で反射する。これによ
り被71?1定対象物4からの戻り光を光アイソレータ
22でカットできるため、LD11の発振状態を安定に
制御することができ、被測定対象物41の変位を高精度
に8−1定することができる。
The laser beam emitted from the LDll passes through the collimator lens 12.
, is irradiated onto a fixed object 14 via an optical isolator 22 and a projection lens 13. A part of the laser light reflected and scattered by the surface of the object to be measured 14 enters the photodetector 16 via the imaging lens 15, and
The light enters the optical isolator 22 via the projection lens 13. The reflected light that has entered the optical isolator 22 passes through the quarter-wave plate 20 and enters the polarizing beam splitter 21, but the reflected light that has passed through the quarter-wave plate 20 has a polarization direction of LD.
Since it is perpendicular to the polarization direction of the laser beam from II, it is reflected by the polarization plane of the polarization beam splitter 20. As a result, the return light from the object 4 to be measured 41 can be cut off by the optical isolator 22, so the oscillation state of the LD 11 can be stably controlled, and the displacement of the object 41 to be measured can be controlled at 8-1 with high precision. can be determined.

なお、本発明は上記実施例に限定されるものではなく、
特許請求の範囲に記載された要旨を逸脱しない範囲で種
々の設計的変更が可能である。たとえば、上記実施例で
は光アイソレータ22をコリメータレンズ12と投光レ
ンズ13との間に配設したが、投光レンズ13と披11
p1定対象物14との間に配設してもよく、要はLDl
lと被測定対象物14との間の光路上に配設すればよい
。また、前記実施例では測定光としてレーザ光を用いた
が、点光源等の無偏光光源を使用する場合には光源と光
アイソレータとの間に偏光板を配設して偏光ビームスプ
リッタ20に入射する光を偏光光束とすれば、彼、17
1定対象物からの戻り光を光アイソレータλλでカット
することができる。
Note that the present invention is not limited to the above embodiments,
Various design changes are possible without departing from the scope of the claims. For example, in the above embodiment, the optical isolator 22 is disposed between the collimator lens 12 and the light projection lens 13, but the light projection lens 13 and the light projection lens 11 are
It may be arranged between the p1 constant target object 14, in short, the LDl
It is only necessary to dispose it on the optical path between L and the object to be measured 14. In addition, although laser light was used as the measurement light in the above embodiment, when using a non-polarized light source such as a point light source, a polarizing plate is provided between the light source and the optical isolator so that the light enters the polarizing beam splitter 20. If the light is a polarized beam, then he, 17
Return light from a constant object can be cut by an optical isolator λλ.

〔発明の効果〕〔Effect of the invention〕

以」二説明したように本発明は、被測定対象物に測定光
を照射する光源と、前記被測定対象物がらの反射光を結
像光学系を介して受光する光検出器と、この光検出器の
受光面上に結像された反射光の光点位置から前記被測定
対象物の変位量を算出する演算部とを具備した光学式変
位測定装置において、前記光源と被測定対象物との間の
光路上に光アイソレータを配設したので、被測定対象物
からの戻り光をカットでき、被測定対象物の変位を高精
度に測定可能な光学式変位測定装置を提供できる。
As explained above, the present invention includes a light source that irradiates measurement light onto an object to be measured, a photodetector that receives reflected light from the object to be measured via an imaging optical system, and a photodetector that receives the light reflected from the object to be measured via an imaging optical system. In an optical displacement measuring device, the light source and the object to be measured are provided with an arithmetic unit that calculates the amount of displacement of the object to be measured from the position of a light spot of reflected light that is imaged on a light receiving surface of a detector. Since the optical isolator is disposed on the optical path between the two, it is possible to cut the return light from the object to be measured, and it is possible to provide an optical displacement measuring device that can measure the displacement of the object to be measured with high precision.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す光学式変位3−1定装
置の概略構成図、第2図は従来の光学式変位i1?1定
装置の概略構成図である。 11・・・L D (光源)   12 ・・・コリメ
ータレンズ、13・・・投光レンズ、14・・・被測定
対象物、15・・・結像レンズ、16・・・光検出器、
17・・・フォトディテクタ、18・・・コントローラ
、19・・・駆動回路、20・・・1/4波長板、21
・・・偏光ビームスプリッタ、22・・・光アイソレー
FIG. 1 is a schematic diagram of an optical displacement 3-1 fixing device showing an embodiment of the present invention, and FIG. 2 is a schematic diagram of a conventional optical displacement i1-1 fixing device. 11...LD (light source) 12...Collimator lens, 13...Light projection lens, 14...Measurement object, 15...Imaging lens, 16...Photodetector,
17... Photodetector, 18... Controller, 19... Drive circuit, 20... 1/4 wavelength plate, 21
...Polarizing beam splitter, 22...Optical isolator

Claims (1)

【特許請求の範囲】[Claims] 被測定対象物(14)に測定光を照射する光源(11)
と、前記被測定対象物(14)からの反射光を結像光学
系(15)を介して受光する光検出器(16)と、この
光検出器(16)の受光面上に結像された反射光の光点
位置から前記被測定対象物(14)の変位量を算出する
演算部とを具備した光学式変位測定装置において、前記
光源(11)と被測定対象物(14)との間の光路上に
光アイソレータ(¥22¥)を配設したことを特徴とす
る光学式変位測定装置。
A light source (11) that irradiates measurement light onto the object to be measured (14)
a photodetector (16) that receives reflected light from the object to be measured (14) via an imaging optical system (15); In the optical displacement measuring device, the optical displacement measuring device is equipped with an arithmetic unit that calculates the amount of displacement of the object to be measured (14) from the light spot position of the reflected light. An optical displacement measurement device characterized by having an optical isolator (¥22) disposed on the optical path between them.
JP63246184A 1988-09-30 1988-09-30 Optical displacement measuring device of triangulation method Expired - Lifetime JP2573673B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63246184A JP2573673B2 (en) 1988-09-30 1988-09-30 Optical displacement measuring device of triangulation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63246184A JP2573673B2 (en) 1988-09-30 1988-09-30 Optical displacement measuring device of triangulation method

Publications (2)

Publication Number Publication Date
JPH0293317A true JPH0293317A (en) 1990-04-04
JP2573673B2 JP2573673B2 (en) 1997-01-22

Family

ID=17144762

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63246184A Expired - Lifetime JP2573673B2 (en) 1988-09-30 1988-09-30 Optical displacement measuring device of triangulation method

Country Status (1)

Country Link
JP (1) JP2573673B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0928092A3 (en) * 1997-12-29 2004-06-30 SAMSUNG ELECTRONICS Co. Ltd. Flip-up type portable phone and hinge mechanism thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55119006A (en) * 1979-03-09 1980-09-12 Anritsu Corp Displacement measuring instrument
JPS60135713A (en) * 1983-12-23 1985-07-19 Honda Motor Co Ltd Optical distance measuring device
JPS614907A (en) * 1984-06-19 1986-01-10 Matsushita Electric Ind Co Ltd Detector for sectional area of welding groove
JPS625104A (en) * 1985-07-01 1987-01-12 Omron Tateisi Electronics Co Waveguide type photo-displacement sensor
JPS63154912A (en) * 1986-12-19 1988-06-28 Tokyo Keiki Co Ltd Apparatus for measuring road surface

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55119006A (en) * 1979-03-09 1980-09-12 Anritsu Corp Displacement measuring instrument
JPS60135713A (en) * 1983-12-23 1985-07-19 Honda Motor Co Ltd Optical distance measuring device
JPS614907A (en) * 1984-06-19 1986-01-10 Matsushita Electric Ind Co Ltd Detector for sectional area of welding groove
JPS625104A (en) * 1985-07-01 1987-01-12 Omron Tateisi Electronics Co Waveguide type photo-displacement sensor
JPS63154912A (en) * 1986-12-19 1988-06-28 Tokyo Keiki Co Ltd Apparatus for measuring road surface

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0928092A3 (en) * 1997-12-29 2004-06-30 SAMSUNG ELECTRONICS Co. Ltd. Flip-up type portable phone and hinge mechanism thereof

Also Published As

Publication number Publication date
JP2573673B2 (en) 1997-01-22

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