JPH0289413U - - Google Patents
Info
- Publication number
- JPH0289413U JPH0289413U JP16918088U JP16918088U JPH0289413U JP H0289413 U JPH0289413 U JP H0289413U JP 16918088 U JP16918088 U JP 16918088U JP 16918088 U JP16918088 U JP 16918088U JP H0289413 U JPH0289413 U JP H0289413U
- Authority
- JP
- Japan
- Prior art keywords
- sample surface
- objective lens
- control signal
- control
- reflected light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16918088U JPH0289413U (ko) | 1988-12-28 | 1988-12-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16918088U JPH0289413U (ko) | 1988-12-28 | 1988-12-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0289413U true JPH0289413U (ko) | 1990-07-16 |
Family
ID=31459007
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16918088U Pending JPH0289413U (ko) | 1988-12-28 | 1988-12-28 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0289413U (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009086641A (ja) * | 2007-07-18 | 2009-04-23 | Asml Netherlands Bv | 検査方法および装置、リソグラフィ装置、リソグラフィ処理セル、デバイス製造方法および距離測定システム |
-
1988
- 1988-12-28 JP JP16918088U patent/JPH0289413U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009086641A (ja) * | 2007-07-18 | 2009-04-23 | Asml Netherlands Bv | 検査方法および装置、リソグラフィ装置、リソグラフィ処理セル、デバイス製造方法および距離測定システム |
JP4611407B2 (ja) * | 2007-07-18 | 2011-01-12 | エーエスエムエル ネザーランズ ビー.ブイ. | 検査装置および方法、リソグラフィ装置、リソグラフィ処理セル、並びにデバイス製造方法 |
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