JPH02816B2 - - Google Patents

Info

Publication number
JPH02816B2
JPH02816B2 JP58187392A JP18739283A JPH02816B2 JP H02816 B2 JPH02816 B2 JP H02816B2 JP 58187392 A JP58187392 A JP 58187392A JP 18739283 A JP18739283 A JP 18739283A JP H02816 B2 JPH02816 B2 JP H02816B2
Authority
JP
Japan
Prior art keywords
magnetic pole
excitation
excitation coil
pole piece
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58187392A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6079653A (ja
Inventor
Katsushige Tsuno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP58187392A priority Critical patent/JPS6079653A/ja
Priority to US06/584,712 priority patent/US4585942A/en
Publication of JPS6079653A publication Critical patent/JPS6079653A/ja
Publication of JPH02816B2 publication Critical patent/JPH02816B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/10Lenses
    • H01J37/14Lenses magnetic
    • H01J37/141Electromagnetic lenses

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
JP58187392A 1983-03-17 1983-10-06 電子顕微鏡等の対物レンズ Granted JPS6079653A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP58187392A JPS6079653A (ja) 1983-10-06 1983-10-06 電子顕微鏡等の対物レンズ
US06/584,712 US4585942A (en) 1983-03-17 1984-02-29 Transmission electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58187392A JPS6079653A (ja) 1983-10-06 1983-10-06 電子顕微鏡等の対物レンズ

Publications (2)

Publication Number Publication Date
JPS6079653A JPS6079653A (ja) 1985-05-07
JPH02816B2 true JPH02816B2 (enrdf_load_stackoverflow) 1990-01-09

Family

ID=16205219

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58187392A Granted JPS6079653A (ja) 1983-03-17 1983-10-06 電子顕微鏡等の対物レンズ

Country Status (1)

Country Link
JP (1) JPS6079653A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2644930B1 (fr) * 1989-03-21 1996-04-26 Cameca Lentille electromagnetique composite a focale variable
US6452175B1 (en) * 1999-04-15 2002-09-17 Applied Materials, Inc. Column for charged particle beam device
WO2018189850A1 (ja) * 2017-04-13 2018-10-18 株式会社 日立ハイテクノロジーズ 電子顕微鏡

Also Published As

Publication number Publication date
JPS6079653A (ja) 1985-05-07

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