JPH0273659A - Lead frame for semiconductor device - Google Patents

Lead frame for semiconductor device

Info

Publication number
JPH0273659A
JPH0273659A JP22613688A JP22613688A JPH0273659A JP H0273659 A JPH0273659 A JP H0273659A JP 22613688 A JP22613688 A JP 22613688A JP 22613688 A JP22613688 A JP 22613688A JP H0273659 A JPH0273659 A JP H0273659A
Authority
JP
Japan
Prior art keywords
lead frame
semiconductor device
silver plating
plating
frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22613688A
Other languages
Japanese (ja)
Inventor
Seiji Takao
誠二 高尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP22613688A priority Critical patent/JPH0273659A/en
Publication of JPH0273659A publication Critical patent/JPH0273659A/en
Pending legal-status Critical Current

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To prevent silver plating from leaking from its side face, to easily manufacture to finish solder plating in a sheath plating step, and to improve the reliability of a lead frame by forming at least one protrusion on two side face of the inner leads of a frame for a resin-sealed semiconductor device. CONSTITUTION:Protrusions 6 are formed on the side faces of the inner leads 2 of a lead frame for a semiconductor device, and formed by pressing or etching at the time of manufacture of the frame. The protrusions 6 are provided at the leads 2 thereby to shut OFF the leakage of the silver plating by the protrusions 6 to prevent a silver plating film 5 from forming to the side face of outer leads 3. This process prevents the silver plating from leaking to the side face to easily manufacture solder plating finish in a sheath plating step, thereby improving the reliability of the frame.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置用のリードフレームに関し、特に樹
脂封止型半導体装置用のリードフレームに関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a lead frame for a semiconductor device, and particularly to a lead frame for a resin-sealed semiconductor device.

〔従来の技術〕[Conventional technology]

従来、樹脂封止型半導体装置用のリードフレーム(以下
リードフレームと記す)のインナーリードは、第4図に
示す様に、先端部にはアイランド部1に搭載される半導
体素子の電極とワイヤボンディングで結線する際、ボン
ディングを容易ならしめるため、数μmの厚さの銀めっ
き膜5が被着されている。
Conventionally, the inner leads of lead frames (hereinafter referred to as lead frames) for resin-sealed semiconductor devices have wire bonding at their tips to the electrodes of the semiconductor elements mounted on the island section 1, as shown in FIG. In order to facilitate bonding when connecting wires, a silver plating film 5 with a thickness of several μm is deposited.

インナーリード22に部分銀めっき膜5を被着するとき
、通常はマスキングをして必要な部分のみに銀めっき膜
5を形成するが、インナーリード22の側面にはマスキ
ングをしていないため、従来のインナーリード22の形
状では、銀めっきがもれて、タイバー4まで銀めつき膜
5が形成されていた。
When applying the partial silver plating film 5 to the inner lead 22, masking is normally performed to form the silver plating film 5 only on the necessary parts, but since the sides of the inner lead 22 are not masked, conventional In the shape of the inner lead 22, the silver plating leaked and a silver plating film 5 was formed up to the tie bar 4.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来のリードフレームは、タイバー近辺の側面
に薄い銀めっき膜があると、アウターリードに半田めっ
き等の外装めっきを施こす際に、外装めっき工程での前
処理に於いてリードフレームから銀めっき膜がはがれ・
て、半田めっきが異常成長し、隣接したアウターリード
間がショートしてしまうという欠点がある。
In the conventional lead frame described above, if there is a thin silver plating film on the side surface near the tie bar, when applying exterior plating such as solder plating to the outer lead, the silver will be removed from the lead frame during pretreatment in the exterior plating process. The plating film peels off.
However, there is a drawback that the solder plating grows abnormally and short-circuits occur between adjacent outer leads.

本発明の目的は、隣接したアウターリード間がショート
することのない、信頼性の高い半導体装置用のリードフ
レームを提供することにある。
An object of the present invention is to provide a highly reliable lead frame for a semiconductor device that does not cause short-circuits between adjacent outer leads.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、樹脂封止型半導体装置用のリードフレームに
おいて、インナーリードの2つの側面にそれぞれ少なく
とも1個の凸部を有している。
The present invention provides a lead frame for a resin-sealed semiconductor device, in which an inner lead has at least one protrusion on each of two side surfaces.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の第1の実施例の要部平面図、第2図は
第1図のインナーリードの拡大斜視図である。
FIG. 1 is a plan view of essential parts of a first embodiment of the present invention, and FIG. 2 is an enlarged perspective view of the inner lead shown in FIG. 1.

第1の実施例は、第1図及び第2図に示すように、イン
ナーリード2の2つの側面にはそれぞれ凸部6が設けら
れている。この凸部6はプレス加工またはエツチング加
工によるリードフレーム製作時に形成できる。
In the first embodiment, as shown in FIGS. 1 and 2, convex portions 6 are provided on each of the two side surfaces of the inner lead 2. As shown in FIGS. This convex portion 6 can be formed during production of the lead frame by pressing or etching.

このように、インナーリード2に凸部6を設けることに
より、銀めっきのもれは凸部6にて遮蔽され、銀めっき
膜5がアウターリード3の側面にまで形成されるのを防
止することができる。
In this way, by providing the protrusions 6 on the inner leads 2, leakage of silver plating is blocked by the protrusions 6, and it is possible to prevent the silver plating film 5 from forming on the side surfaces of the outer leads 3. Can be done.

第3図は本発明の第2の実施例のインナーリードの拡大
斜視図である。
FIG. 3 is an enlarged perspective view of an inner lead according to a second embodiment of the present invention.

第2の実施例は、第3図に示すように、インナーリード
12の2つの側面にはそれぞれアイランドの方向に曲っ
たかぎ形の凸部16が設けられている。このように凸部
16をかぎ形に成形することにより、銀めっきもれの防
止効果は一層確実となり、銀めっき膜5がアウターリー
ドの側面にまで形成されるのを防止することができる。
In the second embodiment, as shown in FIG. 3, two side surfaces of the inner lead 12 are each provided with a hook-shaped convex portion 16 bent toward the island. By forming the convex portion 16 into a hook shape in this manner, the effect of preventing silver plating leakage is further ensured, and it is possible to prevent the silver plating film 5 from being formed on the side surface of the outer lead.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、リードフレームのインナ
ーリードの2つの側面の一部分に凸部を形成することに
より、銀めっきの側面もれを防止できることにより、外
装めっき工程での半田めっき仕上の製造が容易になり信
頼性が著しく向上する効果がある。
As explained above, the present invention prevents silver plating from leaking from the sides by forming convex portions on a portion of two side surfaces of the inner lead of a lead frame, thereby improving the solder plating finish in the exterior plating process. This has the effect of making it easier and significantly improving reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の第1の実施例の要部平面図、第2図は
第1図のインナーリードの拡大斜視図、第3図は本発明
の第2の実施例のリードフレームのインナーリードの拡
大斜視図、第4図は従来のリードフレームの一例の要部
平面図である。 1・・・アイランド、2,12.22・・・インナーリ
ード、3・・・アウターリード、4・・・タイバー、5
・・・銀めっき膜、6,16・・・凸部、7・・・樹脂
封止ライン。
FIG. 1 is a plan view of main parts of a first embodiment of the present invention, FIG. 2 is an enlarged perspective view of the inner lead of FIG. 1, and FIG. 3 is an inner lead frame of a second embodiment of the present invention. FIG. 4 is an enlarged perspective view of a lead and a plan view of a main part of an example of a conventional lead frame. 1...Island, 2,12.22...Inner lead, 3...Outer lead, 4...Tie bar, 5
...Silver plating film, 6, 16...Convex portion, 7...Resin sealing line.

Claims (1)

【特許請求の範囲】[Claims] 樹脂封止型半導体装置用のリードフレームにおいて、イ
ンナーリードの2つの側面にそれぞれ少なくとも1個の
凸部を有することを特徴とする半導体装置用のリードフ
レーム。
A lead frame for a resin-sealed semiconductor device, characterized in that each of two side surfaces of an inner lead has at least one convex portion.
JP22613688A 1988-09-08 1988-09-08 Lead frame for semiconductor device Pending JPH0273659A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22613688A JPH0273659A (en) 1988-09-08 1988-09-08 Lead frame for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22613688A JPH0273659A (en) 1988-09-08 1988-09-08 Lead frame for semiconductor device

Publications (1)

Publication Number Publication Date
JPH0273659A true JPH0273659A (en) 1990-03-13

Family

ID=16840414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22613688A Pending JPH0273659A (en) 1988-09-08 1988-09-08 Lead frame for semiconductor device

Country Status (1)

Country Link
JP (1) JPH0273659A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7801466B2 (en) 2006-05-19 2010-09-21 Ricoh Company, Limited Developing device and image forming apparatus
JP2011003903A (en) * 2009-06-17 2011-01-06 Lsi Corp Lead frame design for improving reliability

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7801466B2 (en) 2006-05-19 2010-09-21 Ricoh Company, Limited Developing device and image forming apparatus
JP2011003903A (en) * 2009-06-17 2011-01-06 Lsi Corp Lead frame design for improving reliability

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