JPH0271278U - - Google Patents
Info
- Publication number
- JPH0271278U JPH0271278U JP14998088U JP14998088U JPH0271278U JP H0271278 U JPH0271278 U JP H0271278U JP 14998088 U JP14998088 U JP 14998088U JP 14998088 U JP14998088 U JP 14998088U JP H0271278 U JPH0271278 U JP H0271278U
- Authority
- JP
- Japan
- Prior art keywords
- board
- test probe
- unit
- pin
- pin board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 9
- 230000003028 elevating effect Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 239000000463 material Substances 0.000 description 9
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14998088U JPH0714927Y2 (ja) | 1988-11-17 | 1988-11-17 | 回路基板検査装置におけるピンボード構造 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14998088U JPH0714927Y2 (ja) | 1988-11-17 | 1988-11-17 | 回路基板検査装置におけるピンボード構造 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0271278U true JPH0271278U (nl) | 1990-05-30 |
JPH0714927Y2 JPH0714927Y2 (ja) | 1995-04-10 |
Family
ID=31422706
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14998088U Expired - Lifetime JPH0714927Y2 (ja) | 1988-11-17 | 1988-11-17 | 回路基板検査装置におけるピンボード構造 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0714927Y2 (nl) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020190439A (ja) * | 2019-05-20 | 2020-11-26 | 新光電気工業株式会社 | 半導体装置 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5244288B2 (ja) * | 2005-06-08 | 2013-07-24 | 日本発條株式会社 | 検査装置 |
-
1988
- 1988-11-17 JP JP14998088U patent/JPH0714927Y2/ja not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020190439A (ja) * | 2019-05-20 | 2020-11-26 | 新光電気工業株式会社 | 半導体装置 |
US11630010B2 (en) | 2019-05-20 | 2023-04-18 | Shinko Electric Industries Co., Ltd. | Semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPH0714927Y2 (ja) | 1995-04-10 |
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