JPH0271278U - - Google Patents
Info
- Publication number
- JPH0271278U JPH0271278U JP14998088U JP14998088U JPH0271278U JP H0271278 U JPH0271278 U JP H0271278U JP 14998088 U JP14998088 U JP 14998088U JP 14998088 U JP14998088 U JP 14998088U JP H0271278 U JPH0271278 U JP H0271278U
- Authority
- JP
- Japan
- Prior art keywords
- board
- test probe
- unit
- pin
- pin board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 9
- 230000003028 elevating effect Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 239000000463 material Substances 0.000 description 9
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は、この考案の一実施例について、測定
作業に入る前の状態を示した正面図である。第２
図は、第１図に示す実施例について、測定時の状
態を示した正面図である。第３図は、従来例を示
す正面図である。
１……上側ユニツト、２……加圧板、３……上
側ピンボード、４……杆材、５……上面用テスト
プローブ、６……通孔、７……杆材、８……介装
板、９……通孔、１０……ストツパ、１１……押
圧棒、１２……軸受材、１３……鍔部、１４……
圧縮ばね材、１５……ブツシユ材、２１……下側
ユニツト、２２……下側ピンボード、２３……下
面用テストプローブ、２４……通孔、２５……穴
部、２６……ブツシユ材、２７……昇降板、２８
……突起材、３０……通孔、３１……案内杆、３
２……上側掛止部、３３……下側掛止部、３４…
…ナツト材、３５……圧縮ばね材、Ｐ……被測定
基板。
FIG. 1 is a front view showing an embodiment of this invention in a state before starting measurement work. Second
The figure is a front view showing the state of the embodiment shown in FIG. 1 at the time of measurement. FIG. 3 is a front view showing a conventional example. 1... Upper unit, 2... Pressure plate, 3... Upper pin board, 4... Rod material, 5... Test probe for top surface, 6... Through hole, 7... Rod material, 8... Intermediate Plate, 9...through hole, 10...stopper, 11...pressing rod, 12...bearing material, 13...flange, 14...
Compression spring material, 15...Bushing material, 21...Lower unit, 22...Lower pin board, 23...Test probe for lower surface, 24...Through hole, 25...Hole part, 26...Bushing material , 27... Elevating plate, 28
... Projection material, 30 ... Through hole, 31 ... Guide rod, 3
2...Upper hook part, 33...Lower hook part, 34...
... Nut material, 35 ... Compression spring material, P ... Board to be measured.
Claims (1)
と、その下方に対向配置され、圧縮力が付与され
て支持された昇降板を有する下側ユニツトとから
なり、 前記上側ユニツトは、昇降可能な加圧板と、こ
の加圧板に対し杆材を介して固着され、かつ、垂
設された上面用テストプローブを有してなる上側
ピンボードと、この上側ピンボードからそれぞれ
の先端部を進退可能に突出させて設けた上側ユニ
ツトの下降を停止させるためのストツパとこのス
トリツパより短い前記昇降板を押し下げるための
押圧棒とを有し、この押圧棒が前記昇降板を押し
下げてその下降を停止した後、予め付与されてい
る圧縮力に抗して上面用テストプロープが被測定
基板の上面と接触するに至るまで前記上側ピンボ
ードの相対下降を可能にして加圧板と上側ピンボ
ードとの間に介装される介装板とで構成し、 前記下側ユニツトは、立設された下面用テスト
プローブを有してなる下側ピンボードに対し、前
記昇降板を被測定基板を水平載置するための突起
材と前記下面用テストプローブを出没させるため
の通孔とを設け、前記押圧棒を介して押圧されて
下側ピンポードに当接し、かつ、下面用テストプ
ローブが被測定基板の下面と接触するに至るまで
の間その下降を可能にして支持させたこと、 を特徴とする回路基板検査装置におけるピンボ
ード構造。[Claims for Utility Model Registration] Consisting of an upper unit that is arranged to be movable up and down on the main body of the device, and a lower unit that is arranged below the upper unit and has an elevating plate that is supported by applying a compressive force, the upper unit The unit consists of a pressure plate that can be raised and lowered, an upper pin board that is fixed to the pressure plate via a rod and has a vertical test probe, and a It has a stopper for stopping the lowering of the upper unit, which is provided with a tip protruding forward and backward, and a push rod for pushing down the elevating plate, which is shorter than the stripper, and this press rod pushes down the elevating plate. After stopping the lowering, the upper pin board is allowed to descend relative to the upper pin board against the pre-applied compressive force until the upper surface test probe comes into contact with the upper surface of the substrate to be measured. The lower unit includes an intervening plate interposed between the board and the lower pin board, which has an upright test probe for the lower surface, and the lower unit connects the elevating plate to the board to be measured. A protruding member for horizontally placing the test probe and a through hole for allowing the lower surface test probe to appear and retract are provided, and the lower surface test probe is pressed through the pressing rod and comes into contact with the lower pin port, and the lower surface test probe is covered. A pin board structure for a circuit board inspection device, characterized in that the pin board structure allows the board to be lowered and is supported until it comes into contact with the bottom surface of the measurement board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14998088U JPH0714927Y2 (en) | 1988-11-17 | 1988-11-17 | Pinboard structure in circuit board inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14998088U JPH0714927Y2 (en) | 1988-11-17 | 1988-11-17 | Pinboard structure in circuit board inspection equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0271278U true JPH0271278U (en) | 1990-05-30 |
| JPH0714927Y2 JPH0714927Y2 (en) | 1995-04-10 |
Family
ID=31422706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14998088U Expired - Lifetime JPH0714927Y2 (en) | 1988-11-17 | 1988-11-17 | Pinboard structure in circuit board inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714927Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020190439A (en) * | 2019-05-20 | 2020-11-26 | 新光電気工業株式会社 | Semiconductor device |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5244288B2 (en) * | 2005-06-08 | 2013-07-24 | 日本発條株式会社 | Inspection device |
-
1988
- 1988-11-17 JP JP14998088U patent/JPH0714927Y2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020190439A (en) * | 2019-05-20 | 2020-11-26 | 新光電気工業株式会社 | Semiconductor device |
| US11630010B2 (en) | 2019-05-20 | 2023-04-18 | Shinko Electric Industries Co., Ltd. | Semiconductor device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0714927Y2 (en) | 1995-04-10 |
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