JPH0262949B2 - - Google Patents
Info
- Publication number
- JPH0262949B2 JPH0262949B2 JP15990285A JP15990285A JPH0262949B2 JP H0262949 B2 JPH0262949 B2 JP H0262949B2 JP 15990285 A JP15990285 A JP 15990285A JP 15990285 A JP15990285 A JP 15990285A JP H0262949 B2 JPH0262949 B2 JP H0262949B2
- Authority
- JP
- Japan
- Prior art keywords
- test
- burn
- block
- high temperature
- under test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000012360 testing method Methods 0.000 claims description 152
- 239000004065 semiconductor Substances 0.000 claims description 39
- 238000000034 method Methods 0.000 claims description 11
- 238000010998 test method Methods 0.000 claims description 10
- 238000009423 ventilation Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005111 flow chemistry technique Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005192 partition Methods 0.000 description 2
- 101100493711 Caenorhabditis elegans bath-41 gene Proteins 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15990285A JPS6221236A (ja) | 1985-07-19 | 1985-07-19 | 半導体ボ−ドのダイナミツクバ−イン試験方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15990285A JPS6221236A (ja) | 1985-07-19 | 1985-07-19 | 半導体ボ−ドのダイナミツクバ−イン試験方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6221236A JPS6221236A (ja) | 1987-01-29 |
| JPH0262949B2 true JPH0262949B2 (online.php) | 1990-12-27 |
Family
ID=15703666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15990285A Granted JPS6221236A (ja) | 1985-07-19 | 1985-07-19 | 半導体ボ−ドのダイナミツクバ−イン試験方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6221236A (online.php) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5077740B2 (ja) * | 2007-03-29 | 2012-11-21 | Ｎｌｔテクノロジー株式会社 | エージング装置 |
-
1985
- 1985-07-19 JP JP15990285A patent/JPS6221236A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6221236A (ja) | 1987-01-29 |
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