JPH0262948B2 - - Google Patents

Info

Publication number
JPH0262948B2
JPH0262948B2 JP60271731A JP27173185A JPH0262948B2 JP H0262948 B2 JPH0262948 B2 JP H0262948B2 JP 60271731 A JP60271731 A JP 60271731A JP 27173185 A JP27173185 A JP 27173185A JP H0262948 B2 JPH0262948 B2 JP H0262948B2
Authority
JP
Japan
Prior art keywords
layer
chip
testing
laser
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60271731A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61225830A (ja
Inventor
Jeoruku Beeha Yohanesu
Uooren Doreifuasu Ratsuseru
Maaku Haatsutein Aran
Uein Ruburofu Geirii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS61225830A publication Critical patent/JPS61225830A/ja
Publication of JPH0262948B2 publication Critical patent/JPH0262948B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
JP60271731A 1985-03-29 1985-12-04 集積回路チツプの試験方法 Granted JPS61225830A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/717,409 US4644264A (en) 1985-03-29 1985-03-29 Photon assisted tunneling testing of passivated integrated circuits
US717409 1985-03-29

Publications (2)

Publication Number Publication Date
JPS61225830A JPS61225830A (ja) 1986-10-07
JPH0262948B2 true JPH0262948B2 (cg-RX-API-DMAC7.html) 1990-12-27

Family

ID=24881911

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60271731A Granted JPS61225830A (ja) 1985-03-29 1985-12-04 集積回路チツプの試験方法

Country Status (5)

Country Link
US (1) US4644264A (cg-RX-API-DMAC7.html)
EP (1) EP0196475B1 (cg-RX-API-DMAC7.html)
JP (1) JPS61225830A (cg-RX-API-DMAC7.html)
CA (1) CA1236929A (cg-RX-API-DMAC7.html)
DE (1) DE3675236D1 (cg-RX-API-DMAC7.html)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4786864A (en) * 1985-03-29 1988-11-22 International Business Machines Corporation Photon assisted tunneling testing of passivated integrated circuits
US4755748A (en) * 1985-06-05 1988-07-05 Bell Communications Research, Inc. Method and apparatus for analyzing semiconductor devices using charge-sensitive electron-beam-injected-carrier microscopy
EP0264482B1 (en) * 1986-10-23 1991-12-18 International Business Machines Corporation Method for contactless testing of integrated circuit packaging boards under atmospheric conditions
EP0264481B1 (en) * 1986-10-23 1992-05-13 International Business Machines Corporation Testing method for integrated circuit packaging boards using a laser in vacuum
NL8700933A (nl) * 1987-04-21 1988-11-16 Philips Nv Testmethode voor lcd-elementen.
JP2690908B2 (ja) * 1987-09-25 1997-12-17 株式会社日立製作所 表面計測装置
US5225771A (en) * 1988-05-16 1993-07-06 Dri Technology Corp. Making and testing an integrated circuit using high density probe points
US5034685A (en) * 1988-05-16 1991-07-23 Leedy Glenn J Test device for testing integrated circuits
US5020219A (en) * 1988-05-16 1991-06-04 Leedy Glenn J Method of making a flexible tester surface for testing integrated circuits
US5512397A (en) * 1988-05-16 1996-04-30 Leedy; Glenn J. Stepper scanner discretionary lithography and common mask discretionary lithography for integrated circuits
EP0404970A1 (en) * 1989-06-26 1991-01-02 International Business Machines Corporation Method and system for contactless testing of electronic activity in an integrated circuit chip-to-test after passivation thereof
US5111137A (en) * 1990-10-29 1992-05-05 Hewlett-Packard Company Method and apparatus for the detection of leakage current
DE69118319T2 (de) * 1990-11-06 1996-08-08 Texas Instruments Inc Anwendung eines STM-artigen Systems zur Messung der Knotenspannung in integrierten Schaltungen
US5179279A (en) * 1991-01-25 1993-01-12 Rensselaer Polytechnic Institute Non-contact electrical pathway
US6472889B1 (en) 2000-06-15 2002-10-29 University Of Connecticut Apparatus and method for producing an ion channel microprobe
TWI565119B (zh) * 2011-05-27 2017-01-01 半導體能源研究所股份有限公司 發光裝置的製造方法及發光裝置
FR3112653B1 (fr) * 2020-07-15 2025-10-24 St Microelectronics Alps Sas Circuit intégré et procédé de diagnostic d’un tel circuit intégré

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4051437A (en) * 1976-04-02 1977-09-27 The United States Of America As Represented By The Secretary Of The Navy Method and apparatus for semiconductor profiling using an optical probe
DE2824308A1 (de) * 1978-06-02 1979-12-13 Siemens Ag Verfahren zum einpraegen einer spannung mit einem elektronenstrahl
US4301409A (en) * 1978-06-06 1981-11-17 California Institute Of Technology Solar cell anomaly detection method and apparatus
US4417203A (en) * 1981-05-26 1983-11-22 International Business Machines Corporation System for contactless electrical property testing of multi-layer ceramics
US4415851A (en) * 1981-05-26 1983-11-15 International Business Machines Corporation System for contactless testing of multi-layer ceramics
US4419530A (en) * 1982-02-11 1983-12-06 Energy Conversion Devices, Inc. Solar cell and method for producing same

Also Published As

Publication number Publication date
DE3675236D1 (de) 1990-12-06
JPS61225830A (ja) 1986-10-07
US4644264A (en) 1987-02-17
EP0196475A1 (en) 1986-10-08
EP0196475B1 (en) 1990-10-31
CA1236929A (en) 1988-05-17

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