JPH0256462U - - Google Patents

Info

Publication number
JPH0256462U
JPH0256462U JP13546088U JP13546088U JPH0256462U JP H0256462 U JPH0256462 U JP H0256462U JP 13546088 U JP13546088 U JP 13546088U JP 13546088 U JP13546088 U JP 13546088U JP H0256462 U JPH0256462 U JP H0256462U
Authority
JP
Japan
Prior art keywords
semiconductor layer
thin film
drain electrode
film transistor
source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13546088U
Other languages
Japanese (ja)
Other versions
JPH0747876Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988135460U priority Critical patent/JPH0747876Y2/en
Publication of JPH0256462U publication Critical patent/JPH0256462U/ja
Application granted granted Critical
Publication of JPH0747876Y2 publication Critical patent/JPH0747876Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Thin Film Transistor (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図〜第3図は本考案の第一実施例を示して
おり、第1図はこの実施例に係る薄膜トランジス
タの構成斜視図、第2図は第1図の―面断面
図を示し、第3図A〜Lは実施例に係る薄膜トラ
ンジスタの製造工程説明図を夫々示し、第4図〜
第5図は本考案の第二実施例を示しており、第4
図はこの実施例に係る薄膜トランジスタの構成斜
視図、第5図は第4図の―面断面図を示し、
第6図〜第7図は本考案の第三実施例を示してお
り、第6図はこの実施例に係る薄膜トランジスタ
の構成斜視図、第7図は第6図の―面断面図
を示し、また、第8図及び第11図は従来におけ
る薄膜トランジスタの構成斜視図、第9図は第8
図の―面断面図、第12図は第11図の
―面断面図、第10図A〜C及び第13
図A〜Cはこれ等薄膜トランジスタの製造工程の
一部を示す説明図である。 符号説明、1……基板、2……ゲート電極、3
……ゲート絶縁膜、4……通電部、5……第一ア
モルフアス半導体層、7……ソース電極、8……
ドレイン電極。
1 to 3 show a first embodiment of the present invention, FIG. 1 is a perspective view of the configuration of a thin film transistor according to this embodiment, and FIG. 2 is a cross-sectional view taken along the plane of FIG. 3A to 3L show explanatory diagrams of the manufacturing process of the thin film transistor according to the example, and FIGS.
FIG. 5 shows a second embodiment of the present invention, and a fourth embodiment of the present invention is shown in FIG.
The figure shows a perspective view of the configuration of a thin film transistor according to this embodiment, and FIG.
6 to 7 show a third embodiment of the present invention, FIG. 6 is a perspective view of the structure of a thin film transistor according to this embodiment, and FIG. 7 is a cross-sectional view taken along the plane of FIG. 8 and 11 are perspective views of the structure of conventional thin film transistors, and FIG. 9 is a perspective view of a conventional thin film transistor.
Figure 12 is a cross-sectional view of Figure 11, Figures 10 A to C and 13 are
Figures A to C are explanatory diagrams showing a part of the manufacturing process of these thin film transistors. Explanation of symbols, 1...Substrate, 2...Gate electrode, 3
...Gate insulating film, 4... Current carrying part, 5... First amorphous semiconductor layer, 7... Source electrode, 8...
drain electrode.

Claims (1)

【実用新案登録請求の範囲】 絶縁性基板と、この基板に設けられた半導体層
と、この半導体層に接続されたソース・ドレイン
電極と、絶縁層を介し上記半導体層に対向して配
置されたゲート電極とを備える薄膜トランジスタ
において、 上記ソース電極とドレイン電極間の半導体層の
一部に良導電性の通電部を積層したことを特徴と
する薄膜トランジスタ。
[Claims for Utility Model Registration] An insulating substrate, a semiconductor layer provided on this substrate, a source/drain electrode connected to this semiconductor layer, and an insulating substrate disposed opposite to the semiconductor layer with an insulating layer interposed therebetween. A thin film transistor comprising a gate electrode, characterized in that a highly conductive current-carrying part is laminated on a part of the semiconductor layer between the source electrode and the drain electrode.
JP1988135460U 1988-10-19 1988-10-19 Thin film transistor Expired - Lifetime JPH0747876Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988135460U JPH0747876Y2 (en) 1988-10-19 1988-10-19 Thin film transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988135460U JPH0747876Y2 (en) 1988-10-19 1988-10-19 Thin film transistor

Publications (2)

Publication Number Publication Date
JPH0256462U true JPH0256462U (en) 1990-04-24
JPH0747876Y2 JPH0747876Y2 (en) 1995-11-01

Family

ID=31395107

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988135460U Expired - Lifetime JPH0747876Y2 (en) 1988-10-19 1988-10-19 Thin film transistor

Country Status (1)

Country Link
JP (1) JPH0747876Y2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009231821A (en) * 2008-02-29 2009-10-08 Semiconductor Energy Lab Co Ltd Thin-film transistor and display device
JP2009239263A (en) * 2008-03-01 2009-10-15 Semiconductor Energy Lab Co Ltd Thin-film transistor and display device
JP2010199566A (en) * 2009-01-30 2010-09-09 Semiconductor Energy Lab Co Ltd Semiconductor device and method for manufacturing the same
US8558236B2 (en) 2007-12-03 2013-10-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2018509761A (en) * 2015-05-11 2018-04-05 深▲セン▼市華星光電技術有限公司 Coplanar oxide semiconductor TFT substrate structure and manufacturing method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235569A (en) * 1985-08-09 1987-02-16 Agency Of Ind Science & Technol Mis type transistor and manufacture thereof
JPS63258072A (en) * 1987-04-15 1988-10-25 Nec Corp Field-effect transistor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6235569A (en) * 1985-08-09 1987-02-16 Agency Of Ind Science & Technol Mis type transistor and manufacture thereof
JPS63258072A (en) * 1987-04-15 1988-10-25 Nec Corp Field-effect transistor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8558236B2 (en) 2007-12-03 2013-10-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2009231821A (en) * 2008-02-29 2009-10-08 Semiconductor Energy Lab Co Ltd Thin-film transistor and display device
JP2009239263A (en) * 2008-03-01 2009-10-15 Semiconductor Energy Lab Co Ltd Thin-film transistor and display device
JP2010199566A (en) * 2009-01-30 2010-09-09 Semiconductor Energy Lab Co Ltd Semiconductor device and method for manufacturing the same
JP2018509761A (en) * 2015-05-11 2018-04-05 深▲セン▼市華星光電技術有限公司 Coplanar oxide semiconductor TFT substrate structure and manufacturing method thereof

Also Published As

Publication number Publication date
JPH0747876Y2 (en) 1995-11-01

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