JPH0247483Y2 - - Google Patents
Info
- Publication number
- JPH0247483Y2 JPH0247483Y2 JP1982046574U JP4657482U JPH0247483Y2 JP H0247483 Y2 JPH0247483 Y2 JP H0247483Y2 JP 1982046574 U JP1982046574 U JP 1982046574U JP 4657482 U JP4657482 U JP 4657482U JP H0247483 Y2 JPH0247483 Y2 JP H0247483Y2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- test chamber
- environment test
- temperature environment
- control device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007613 environmental effect Effects 0.000 claims description 30
- 238000001816 cooling Methods 0.000 claims description 13
- 239000003507 refrigerant Substances 0.000 claims description 11
- 238000005192 partition Methods 0.000 claims description 9
- 230000005855 radiation Effects 0.000 claims description 4
- 230000017525 heat dissipation Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005057 refrigeration Methods 0.000 description 2
- 238000004378 air conditioning Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
Landscapes
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Tests Of Electronic Circuits (AREA)
- Control Of Temperature (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4657482U JPS58148650U (ja) | 1982-03-30 | 1982-03-30 | 高温環境試験室の温度制御装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4657482U JPS58148650U (ja) | 1982-03-30 | 1982-03-30 | 高温環境試験室の温度制御装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58148650U JPS58148650U (ja) | 1983-10-05 |
| JPH0247483Y2 true JPH0247483Y2 (US20020128544A1-20020912-P00008.png) | 1990-12-13 |
Family
ID=30057563
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4657482U Granted JPS58148650U (ja) | 1982-03-30 | 1982-03-30 | 高温環境試験室の温度制御装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58148650U (US20020128544A1-20020912-P00008.png) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4813415B2 (ja) * | 2007-04-19 | 2011-11-09 | 三菱電機株式会社 | 電子部品の温度試験装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS548379B2 (US20020128544A1-20020912-P00008.png) * | 1974-07-05 | 1979-04-14 | ||
| JPS56106139A (en) * | 1980-01-28 | 1981-08-24 | Fujitsu Ltd | Environmental testing apparatus |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS548379U (US20020128544A1-20020912-P00008.png) * | 1977-06-20 | 1979-01-19 |
-
1982
- 1982-03-30 JP JP4657482U patent/JPS58148650U/ja active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS548379B2 (US20020128544A1-20020912-P00008.png) * | 1974-07-05 | 1979-04-14 | ||
| JPS56106139A (en) * | 1980-01-28 | 1981-08-24 | Fujitsu Ltd | Environmental testing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58148650U (ja) | 1983-10-05 |
