JPS56106139A - Environmental testing apparatus - Google Patents

Environmental testing apparatus

Info

Publication number
JPS56106139A
JPS56106139A JP918380A JP918380A JPS56106139A JP S56106139 A JPS56106139 A JP S56106139A JP 918380 A JP918380 A JP 918380A JP 918380 A JP918380 A JP 918380A JP S56106139 A JPS56106139 A JP S56106139A
Authority
JP
Japan
Prior art keywords
temp
heat insulating
low
partition wall
directed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP918380A
Other languages
Japanese (ja)
Other versions
JPS6161339B2 (en
Inventor
Motoo Ueno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP918380A priority Critical patent/JPS56106139A/en
Publication of JPS56106139A publication Critical patent/JPS56106139A/en
Publication of JPS6161339B2 publication Critical patent/JPS6161339B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N17/00—Investigating resistance of materials to the weather, to corrosion, or to light

Abstract

PURPOSE:To make possible temp. cycle testing with simple constitution by providing a partition wall consisting of a heat insulating material between a high-temp. room and a low-temp. room, and mounting a cooling unit to this. CONSTITUTION:Between test chambers 20 and 30 are partitioned by a partition wall 2 consisting of a heat insulating material, and a cooling unit 1 permitting alternate changing of a heat radiating surface and a heat absorbing surface 3 by changing-over of the built-in valve and other means is mounted to this partition wall 2. The surface 3 of the unit 1 is directed to one of the test chambers 20, 30 which are delineated by the heat insulating walls supported by foldable frames 7, 8 and freely attachable and detachable curtainlike heat insulating walls 5, 6. The surface 4 is directed to the other chamber and the surface 3 and the surface 4 are changed over alternately. Thereby, the temp. testing of high temp. and low temp. is carried out simultaneously, and the temp. cycle testing repeated from high temp. to low temp. and from low temp. to high temp. is easily executed.
JP918380A 1980-01-28 1980-01-28 Environmental testing apparatus Granted JPS56106139A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP918380A JPS56106139A (en) 1980-01-28 1980-01-28 Environmental testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP918380A JPS56106139A (en) 1980-01-28 1980-01-28 Environmental testing apparatus

Publications (2)

Publication Number Publication Date
JPS56106139A true JPS56106139A (en) 1981-08-24
JPS6161339B2 JPS6161339B2 (en) 1986-12-25

Family

ID=11713429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP918380A Granted JPS56106139A (en) 1980-01-28 1980-01-28 Environmental testing apparatus

Country Status (1)

Country Link
JP (1) JPS56106139A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58148650U (en) * 1982-03-30 1983-10-05 富士通株式会社 Temperature control device for high temperature environment test chamber
JPH11105800A (en) * 1997-10-01 1999-04-20 Nec Eng Ltd Thermal vacuum chamber

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58148650U (en) * 1982-03-30 1983-10-05 富士通株式会社 Temperature control device for high temperature environment test chamber
JPH0247483Y2 (en) * 1982-03-30 1990-12-13
JPH11105800A (en) * 1997-10-01 1999-04-20 Nec Eng Ltd Thermal vacuum chamber

Also Published As

Publication number Publication date
JPS6161339B2 (en) 1986-12-25

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