JPS58148650U - Temperature control device for high temperature environment test chamber - Google Patents

Temperature control device for high temperature environment test chamber

Info

Publication number
JPS58148650U
JPS58148650U JP4657482U JP4657482U JPS58148650U JP S58148650 U JPS58148650 U JP S58148650U JP 4657482 U JP4657482 U JP 4657482U JP 4657482 U JP4657482 U JP 4657482U JP S58148650 U JPS58148650 U JP S58148650U
Authority
JP
Japan
Prior art keywords
control device
temperature
test chamber
environment test
high temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4657482U
Other languages
Japanese (ja)
Other versions
JPH0247483Y2 (en
Inventor
上野　基男
星原　博文
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP4657482U priority Critical patent/JPS58148650U/en
Publication of JPS58148650U publication Critical patent/JPS58148650U/en
Application granted granted Critical
Publication of JPH0247483Y2 publication Critical patent/JPH0247483Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Control Of Temperature (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来の温度環境試験室の模式平面図、第２図は
本考案による高温環境試験室の温度制御装置の構成の模
式正面図を示したものである。 図においては１は外壁、２は隔壁、３は低温室、４は高
温ｇ、５ｃｔエヤコンユニツトの冷却器、６は冷媒コン
デンサ、７は冷却ファン、８はヒーータユニット、９は
吸気ダクト、１０は自動シャッタ、１１は排気口、１２
は温度センサ、１３はシャッタ制御装置、１４は制御信
号線を示したものであスFIG. 1 is a schematic plan view of a conventional temperature environment test chamber, and FIG. 2 is a schematic front view of the configuration of a temperature control device for a high temperature environment test chamber according to the present invention. In the figure, 1 is the outer wall, 2 is the partition wall, 3 is the cold room, 4 is the high temperature g, the cooler of the 5ct air conditioner unit, 6 is the refrigerant condenser, 7 is the cooling fan, 8 is the heater unit, 9 is the intake duct, and 10 is the automatic Shutter, 11 is exhaust port, 12
13 is a temperature sensor, 13 is a shutter control device, and 14 is a control signal line.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 室内に配設したユニットクーラの空冷コンデンサを加熱
源と（−だ高温環境試験室の温度制御装置であって、該
試験室の隔壁に排気口と室内温度センサによって開閉制
御可能なシャッタとを設けてなり、室温が所定温度以上
上昇した際に、前記温度センサの出力により前記シャッ
ターを開いて外気を取り入れ、室温を所定の高温度に保
持するようにしたとき特徴とする高温環境試験室の温度
制御装置。The air-cooled condenser of a unit cooler installed in the room is used as a heat source (-) The temperature control device for a high-temperature environment test chamber includes an exhaust port and a shutter that can be opened and closed by an indoor temperature sensor in the partition wall of the test chamber. When the room temperature rises above a predetermined temperature, the shutter is opened according to the output of the temperature sensor to take in outside air and maintain the room temperature at a predetermined high temperature. Control device.
JP4657482U 1982-03-30 1982-03-30 Temperature control device for high temperature environment test chamber Granted JPS58148650U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4657482U JPS58148650U (en) 1982-03-30 1982-03-30 Temperature control device for high temperature environment test chamber

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4657482U JPS58148650U (en) 1982-03-30 1982-03-30 Temperature control device for high temperature environment test chamber

Publications (2)

Publication Number Publication Date
JPS58148650U true JPS58148650U (en) 1983-10-05
JPH0247483Y2 JPH0247483Y2 (en) 1990-12-13

Family

ID=30057563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4657482U Granted JPS58148650U (en) 1982-03-30 1982-03-30 Temperature control device for high temperature environment test chamber

Country Status (1)

Country Link
JP (1) JPS58148650U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008267945A (en) * 2007-04-19 2008-11-06 Mitsubishi Electric Corp Temperature testing device for electronic component

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS548379U (en) * 1977-06-20 1979-01-19
JPS56106139A (en) * 1980-01-28 1981-08-24 Fujitsu Ltd Environmental testing apparatus

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS516237A (en) * 1974-07-05 1976-01-19 Tokyo Shibaura Electric Co TOFUHOSHIKI

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS548379U (en) * 1977-06-20 1979-01-19
JPS56106139A (en) * 1980-01-28 1981-08-24 Fujitsu Ltd Environmental testing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008267945A (en) * 2007-04-19 2008-11-06 Mitsubishi Electric Corp Temperature testing device for electronic component

Also Published As

Publication number Publication date
JPH0247483Y2 (en) 1990-12-13

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