JPH0234956A - Method for breaking semiconductor substrate - Google Patents
Method for breaking semiconductor substrateInfo
- Publication number
- JPH0234956A JPH0234956A JP63184989A JP18498988A JPH0234956A JP H0234956 A JPH0234956 A JP H0234956A JP 63184989 A JP63184989 A JP 63184989A JP 18498988 A JP18498988 A JP 18498988A JP H0234956 A JPH0234956 A JP H0234956A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- semiconductor substrate
- grooves
- deionized water
- breaking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 33
- 239000004065 semiconductor Substances 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 19
- 239000008367 deionised water Substances 0.000 claims abstract description 10
- 229910021641 deionized water Inorganic materials 0.000 claims abstract description 10
- 239000007788 liquid Substances 0.000 claims 2
- 229920000728 polyester Polymers 0.000 abstract description 5
- 230000005611 electricity Effects 0.000 abstract description 4
- 230000003068 static effect Effects 0.000 abstract description 4
- 239000003795 chemical substances by application Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 229920006267 polyester film Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】 産業上の利用分野 本発明は半導体基板のブレーク方法に関する。[Detailed description of the invention] Industrial applications The present invention relates to a method for breaking a semiconductor substrate.
従来の技術
半導体基板のブレークは、半導体基板表面をダイシング
ソーなる、ソーイングマシン等を用い半導体基板表面よ
り垂直方向に所定のピッチで溝をつける。BACKGROUND ART To break a semiconductor substrate, grooves are formed on the surface of the semiconductor substrate at a predetermined pitch in a direction perpendicular to the surface of the semiconductor substrate using a sawing machine such as a dicing saw.
この時の溝の深さは半導体基板厚みの約80%位である
。その後、前述のソーイングによって溝を形成した半導
体基板をポリエステル等の薄い絶縁膜のもつ静電気を利
用して同ポリエステル膜上に貼りつける。The depth of the groove at this time is about 80% of the thickness of the semiconductor substrate. Thereafter, the semiconductor substrate in which the grooves have been formed by the aforementioned sawing is attached onto the polyester film using the static electricity of the thin insulating film made of polyester or the like.
前述のポリエステルに貼り付けられた半導体基板表面よ
りローラーと称するゴム系の円筒状の治具等を用いて押
えながら回転させてブレークする。A rubber-based cylindrical jig called a roller is used to press and rotate the surface of the semiconductor substrate attached to the above-mentioned polyester to break it.
発明が解決しようとする課題
ところがこのローラーで半導体基板表面を押えるために
半導体表面の保護膜にキズを与えたり、また、内部にス
トレスを導入して特性的2品質的にトラブルの原因とな
っている。The problem that the invention aims to solve: However, since this roller presses the surface of the semiconductor substrate, it can damage the protective film on the semiconductor surface, and also introduce stress inside, which can cause problems in terms of quality. There is.
課題を解決するための手段
本発明は、要約するに半導体基板を必要な大きさにブレ
ークする際に、予め形成された溝に脱イオン水を浸透さ
せて後凝固させる工程を有するものである。Means for Solving the Problems To summarize, the present invention includes a step of infiltrating deionized water into pre-formed grooves and post-solidifying it when breaking a semiconductor substrate into a required size.
作用
本発明によると、半導体基板を必要とする寸法にブレー
クする際に、予め形成された溝に脱イオン水を浸透させ
、前述の脱イオン水を凝固させることによりその体積膨
張を利用してブレークするものであり、基板全面を押え
る必要がな(なり、ダメージやキズがな(特性及び品質
面で大幅に改善できる。According to the present invention, when breaking a semiconductor substrate into required dimensions, deionized water is infiltrated into the pre-formed grooves, and the above-mentioned deionized water is solidified, thereby making use of its volumetric expansion to break the semiconductor substrate into required dimensions. There is no need to press the entire surface of the board, and there is no damage or scratches (it can be greatly improved in terms of characteristics and quality).
実施例 以下、本発明の実施例を図面を用いて説明する。Example Embodiments of the present invention will be described below with reference to the drawings.
第1図〜第3図に示す様に半導体基板のブレークプロセ
スにおいて、まず第1図のように半導体基板1の表面に
必要とするピッチにソーインク装置によって同基板厚さ
の80%位の深さまでソーイングを行い、溝2を形成す
る。As shown in FIGS. 1 to 3, in the breaking process of a semiconductor substrate, first, as shown in FIG. Perform sawing to form grooves 2.
その後、第2図のポリエステル絶縁膜3に帯電している
静電気を利用して半導体基板を貼り付ける。次にソーイ
ングされた溝に水質10MΩ以上の脱イオン水4を半導
体基板表面より注ぐ。この水質10MΩ以上を必要とす
るのは帯電している静電気が水を通して外部へ逃げるの
を防止するためである。Thereafter, a semiconductor substrate is attached using static electricity charged on the polyester insulating film 3 shown in FIG. Next, deionized water 4 having a water quality of 10 MΩ or more is poured into the sawn groove from the surface of the semiconductor substrate. The reason why this water quality is required to be 10 MΩ or more is to prevent static electricity from escaping to the outside through the water.
次に、第3図のように、溝及び表面に存在する脱イオン
水4を急速に冷凍し、氷5にする。この時の冷凍温度は
一50℃以下にはしない。この凝固した際の体積膨張に
より溝の底の部より基板底面に向って亀裂6が入り、ブ
レークが可能となり、表面キズが皆無となった。Next, as shown in FIG. 3, the deionized water 4 present in the grooves and on the surface is rapidly frozen to form ice 5. The freezing temperature at this time should not be lower than -50°C. Due to the volumetric expansion upon solidification, cracks 6 were formed from the bottom of the groove toward the bottom surface of the substrate, making it possible to break, and there were no surface scratches.
発明の効果
本発明によれば、ブレークされるべき溝に脱イオン水を
浸透させ量水を凝固させることで体積膨張が基板に亀裂
を生じさせるので、基板表面よりローラー等により押え
つけることがないため基板の表面及び内部にキズやダメ
ージが導入されることがないため、これが起因となる特
性及び品質面で安定性が増大し、その効果は大きい。Effects of the Invention According to the present invention, deionized water is infiltrated into the grooves to be broken and the water is solidified so that the volumetric expansion causes cracks in the substrate, so there is no need to press the substrate from the surface with a roller or the like. As a result, no scratches or damage are introduced to the surface or inside of the substrate, resulting in increased stability in terms of characteristics and quality, which is highly effective.
第1図〜第3図は本発明の実施例を示す工程順断面図で
ある。
1・・・・・・半導体基板、2・・・・・・溝、3・・
・・・・ポリエステル絶縁膜、4・・・・・・脱イオン
水、5・・・・・・氷、6・・・・・・亀裂。
代理人の氏名 弁理士 粟野重孝 ほか1名/−−−シ
リコン脈
2−に
4−・−脱イ七1〉→(FIGS. 1 to 3 are sectional views showing an embodiment of the present invention in the order of steps. 1... Semiconductor substrate, 2... Groove, 3...
...Polyester insulating film, 4...Deionized water, 5...Ice, 6...Crack. Name of agent: Patent attorney Shigetaka Awano and 1 other person
Claims (2)
ングした後、前述の基板表面を凝固し得る液体にて覆い
、同液体を凝固させて、前述の基板をブレークする工程
をそなえたことを特徴とする半導体基板のブレーク方法
。(1) After the semiconductor substrate surface is sawed to a predetermined size and depth, the aforementioned substrate surface is covered with a solidifying liquid, and the liquid is solidified to break the aforementioned substrate. A method for breaking a semiconductor substrate, characterized by:
を浸透させる請求項1記載の半導体基板のブレーク方法
。(2) The method for breaking a semiconductor substrate according to claim 1, wherein deionized water is infiltrated into grooves sawn on the surface of the semiconductor substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63184989A JPH0234956A (en) | 1988-07-25 | 1988-07-25 | Method for breaking semiconductor substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63184989A JPH0234956A (en) | 1988-07-25 | 1988-07-25 | Method for breaking semiconductor substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0234956A true JPH0234956A (en) | 1990-02-05 |
Family
ID=16162846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63184989A Pending JPH0234956A (en) | 1988-07-25 | 1988-07-25 | Method for breaking semiconductor substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0234956A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7294558B2 (en) * | 2004-03-08 | 2007-11-13 | Kabushiki Kaisha Toshiba | Method and apparatus for cleaving a wafer through expansion resulting from vaporization or freezing of liquid |
DE102011119353A1 (en) * | 2011-11-23 | 2013-05-23 | Centrotherm Sitec Gmbh | Crushing semiconductor molding, comprises producing semiconductor molding having cavity, filling cavity with liquid having density anomaly effect, and cooling liquid below freezing point for producing pressure in cavity |
JP2018026397A (en) * | 2016-08-08 | 2018-02-15 | 株式会社ディスコ | Device wafer processing method |
-
1988
- 1988-07-25 JP JP63184989A patent/JPH0234956A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7294558B2 (en) * | 2004-03-08 | 2007-11-13 | Kabushiki Kaisha Toshiba | Method and apparatus for cleaving a wafer through expansion resulting from vaporization or freezing of liquid |
DE102011119353A1 (en) * | 2011-11-23 | 2013-05-23 | Centrotherm Sitec Gmbh | Crushing semiconductor molding, comprises producing semiconductor molding having cavity, filling cavity with liquid having density anomaly effect, and cooling liquid below freezing point for producing pressure in cavity |
JP2018026397A (en) * | 2016-08-08 | 2018-02-15 | 株式会社ディスコ | Device wafer processing method |
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