JPH0232595B2 - - Google Patents

Info

Publication number
JPH0232595B2
JPH0232595B2 JP56194028A JP19402881A JPH0232595B2 JP H0232595 B2 JPH0232595 B2 JP H0232595B2 JP 56194028 A JP56194028 A JP 56194028A JP 19402881 A JP19402881 A JP 19402881A JP H0232595 B2 JPH0232595 B2 JP H0232595B2
Authority
JP
Japan
Prior art keywords
output
terminal
gate
input
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56194028A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5895284A (ja
Inventor
Takaya Furuishi
Masao Kayahara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP56194028A priority Critical patent/JPS5895284A/ja
Publication of JPS5895284A publication Critical patent/JPS5895284A/ja
Publication of JPH0232595B2 publication Critical patent/JPH0232595B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G04—HOROLOGY
    • G04D—APPARATUS OR TOOLS SPECIALLY DESIGNED FOR MAKING OR MAINTAINING CLOCKS OR WATCHES
    • G04D7/00—Measuring, counting, calibrating, testing or regulating apparatus
    • G04D7/002—Electrical measuring and testing apparatus
    • G04D7/003—Electrical measuring and testing apparatus for electric or electronic clocks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electric Clocks (AREA)
JP56194028A 1981-12-02 1981-12-02 半導体集積回路 Granted JPS5895284A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56194028A JPS5895284A (ja) 1981-12-02 1981-12-02 半導体集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56194028A JPS5895284A (ja) 1981-12-02 1981-12-02 半導体集積回路

Publications (2)

Publication Number Publication Date
JPS5895284A JPS5895284A (ja) 1983-06-06
JPH0232595B2 true JPH0232595B2 (cs) 1990-07-20

Family

ID=16317734

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56194028A Granted JPS5895284A (ja) 1981-12-02 1981-12-02 半導体集積回路

Country Status (1)

Country Link
JP (1) JPS5895284A (cs)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0782067B2 (ja) * 1985-04-10 1995-09-06 日本電気株式会社 信号試験回路
JP2670905B2 (ja) * 1990-12-28 1997-10-29 株式会社小松製作所 カウンタ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5368983A (en) * 1976-12-01 1978-06-19 Seikosha Kk Ic

Also Published As

Publication number Publication date
JPS5895284A (ja) 1983-06-06

Similar Documents

Publication Publication Date Title
US5486786A (en) Process monitor for CMOS integrated circuits
JPS61191973A (ja) 試験回路をそなえた半導体集積回路
US4011516A (en) Frequency correction arrangement
JPS6261911B2 (cs)
JPH0373176B2 (cs)
JPH0232595B2 (cs)
US3906256A (en) Drive pulse generator for use in electronic analog display clock apparatus
JP3123454B2 (ja) 半導体集積回路
US3979681A (en) System and method for decoding reset signals of a timepiece for providing internal control
US3956880A (en) Solid state wristwatch with charge coupled divider
GB1214980A (en) Electronic watch
JP3124912B2 (ja) タイマ装置
US4422038A (en) Integrated circuit with frequency-dividing circuits capable of being tested at a high speed
JPS635713B2 (cs)
JPS578858A (en) Integrated circuit package
JPS635711B2 (cs)
JPS6222433B2 (cs)
JP2533946B2 (ja) 集積回路
KR970000820B1 (ko) 바운더리 스캔 구조의 테스트 데이타 입력 장치
JPS63271966A (ja) 半導体集積回路
JPS6360350B2 (cs)
JPS6123835Y2 (cs)
JPS635712B2 (cs)
KR890006046Y1 (ko) 프로그램 가능한 논리 배열장치(pal)의 프로그램 시험장치
JPS6018026B2 (ja) 電子時計用回路