JPH0230052U - - Google Patents

Info

Publication number
JPH0230052U
JPH0230052U JP9626289U JP9626289U JPH0230052U JP H0230052 U JPH0230052 U JP H0230052U JP 9626289 U JP9626289 U JP 9626289U JP 9626289 U JP9626289 U JP 9626289U JP H0230052 U JPH0230052 U JP H0230052U
Authority
JP
Japan
Prior art keywords
probe
group
reception
array
deflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP9626289U
Other languages
Japanese (ja)
Other versions
JPH0311734Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989096262U priority Critical patent/JPH0311734Y2/ja
Publication of JPH0230052U publication Critical patent/JPH0230052U/ja
Application granted granted Critical
Publication of JPH0311734Y2 publication Critical patent/JPH0311734Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は従来の焦点探触子の原理説明図、第２
図は焦点探触子を用いた従来装置の説明図、第３
図は本考案で用いる探触子アレイの説明図、第４
図は本考案で用いる探触子アレイの焦点ビーム特
性の説明図、第５，６，７図で本考案の探触子ア
レイにおいて焦点ビーム特性を得るための信号遅
延を示した説明図、第８図は本考案の装置構成の
一実施例を示したブロツク図、第９図は本考案で
用いる探触子アレイの他の実施例を示した説明図
である。 ２：管体、１０，１０ａ，１０ｂ：探触子アレ
イ、１２：焦点遅延部、１４：偏向遅延部、１６
：アナログスイツチ、２０：制御信号発生器、２
２：送信遅延回路、２４：送信部、２６：プリア
ンプ、２８：受信遅延回路、３０：加算器、３２
：主増幅部、３４，３６，３８，４０：バツフア
、４２：混合−レベル比較器、４４：入力インタ
フエース、４６：マイクロコンピユータ、４８：
出力インタフエース、５０：プリンタ、５２：Ｃ
ＲＴ。 Figure 1 is an explanatory diagram of the principle of a conventional focusing probe, Figure 2
The figure is an explanatory diagram of a conventional device using a focusing probe.
The figure is an explanatory diagram of the probe array used in this invention.
The figure is an explanatory diagram of the focal beam characteristics of the probe array used in the present invention. FIG. 8 is a block diagram showing one embodiment of the device configuration of the present invention, and FIG. 9 is an explanatory diagram showing another embodiment of the probe array used in the present invention. 2: Tube body, 10, 10a, 10b: Probe array, 12: Focus delay section, 14: Deflection delay section, 16
: Analog switch, 20: Control signal generator, 2
2: Transmission delay circuit, 24: Transmission unit, 26: Preamplifier, 28: Reception delay circuit, 30: Adder, 32
: Main amplifier section, 34, 36, 38, 40: Buffer, 42: Mixing-level comparator, 44: Input interface, 46: Microcomputer, 48:
Output interface, 50: Printer, 52: C
RT.

Claims (1)

【実用新案登録請求の範囲】 水中に固定設置され、複数の探触子を環状に配
列した探触子アレイと、 該探触子アレイの基準位置より所定数の探触子
を１グループとする探触子群を所定の送受信周期
毎に順次探触子１個分づつシフトさせるアナログ
スイツチを介して送・受信部に接続するように走
査する走査手段と、 該走査手段で選択された探触子群に送信する送
信パルス信号として焦点探触子と等価な超音波ビ
ーム特性が得られるように焦点遅延および偏向遅
延する送信遅延手段と、 前記走査手段で選択された探触子群によつて受
信された超音波受信信号の各々の受信タイミング
が一致するように偏向遅延および焦点遅延する受
信遅延手段と、 該受信遅延手段の出力信号を加算して得た合成
信号に基づいて前記探触子アレイ内を通過する管
状金属の欠陥を検出表示する処理手段とを備えた
ことを特徴とする超音波自動探傷装置。[Scope of Claim for Utility Model Registration] A probe array that is fixedly installed underwater and has a plurality of probes arranged in a ring, and a group of a predetermined number of probes from a reference position of the probe array. A scanning means that scans the probe group so as to be connected to the transmitting/receiving section via an analog switch that sequentially shifts the probe group by one probe at each predetermined transmission/reception cycle, and a probe selected by the scanning means. a transmission delay means for delaying focus and deflection so as to obtain ultrasonic beam characteristics equivalent to those of a focusing probe as a transmission pulse signal to be transmitted to a probe group; a reception delay unit that delays the deflection and focus so that the reception timings of the received ultrasonic reception signals coincide; 1. An automatic ultrasonic flaw detection device comprising processing means for detecting and displaying defects in a tubular metal passing through the array.
JP1989096262U 1989-08-17 1989-08-17 Expired JPH0311734Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989096262U JPH0311734Y2 (en) 1989-08-17 1989-08-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989096262U JPH0311734Y2 (en) 1989-08-17 1989-08-17

Publications (2)

Publication Number Publication Date
JPH0230052U true JPH0230052U (en) 1990-02-26
JPH0311734Y2 JPH0311734Y2 (en) 1991-03-20

Family

ID=31321126

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989096262U Expired JPH0311734Y2 (en) 1989-08-17 1989-08-17

Country Status (1)

Country Link
JP (1) JPH0311734Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006250873A (en) * 2005-03-14 2006-09-21 Krautkramer Japan Co Ltd Ultrasonic flaw detecting method and apparatus for the same
JP2006343725A (en) * 2005-05-13 2006-12-21 Mitsubishi Electric Corp Acoustic wave guide device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5558666B2 (en) * 2007-12-19 2014-07-23 山陽特殊製鋼株式会社 Surface defect evaluation apparatus and method for round bar steel by water immersion ultrasonic flaw detection using an electronic scanning array probe

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55110952A (en) * 1979-02-21 1980-08-27 Toshiba Corp Ultrasonic probe
JPS5642136A (en) * 1979-09-14 1981-04-20 Toshiba Corp Ultrasonic flaw detecting method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55110952A (en) * 1979-02-21 1980-08-27 Toshiba Corp Ultrasonic probe
JPS5642136A (en) * 1979-09-14 1981-04-20 Toshiba Corp Ultrasonic flaw detecting method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006250873A (en) * 2005-03-14 2006-09-21 Krautkramer Japan Co Ltd Ultrasonic flaw detecting method and apparatus for the same
JP4564867B2 (en) * 2005-03-14 2010-10-20 日本クラウトクレーマー株式会社 Ultrasonic flaw detection method and apparatus
JP2006343725A (en) * 2005-05-13 2006-12-21 Mitsubishi Electric Corp Acoustic wave guide device

Also Published As

Publication number Publication date
JPH0311734Y2 (en) 1991-03-20

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