JPH0222493A - Working equipment - Google Patents

Working equipment

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Publication number
JPH0222493A
JPH0222493A JP13630489A JP13630489A JPH0222493A JP H0222493 A JPH0222493 A JP H0222493A JP 13630489 A JP13630489 A JP 13630489A JP 13630489 A JP13630489 A JP 13630489A JP H0222493 A JPH0222493 A JP H0222493A
Authority
JP
Japan
Prior art keywords
plating
plated
patternlike
mask
laser beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13630489A
Other languages
Japanese (ja)
Inventor
Minoru Kobayashi
実 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP13630489A priority Critical patent/JPH0222493A/en
Publication of JPH0222493A publication Critical patent/JPH0222493A/en
Pending legal-status Critical Current

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  • Chemically Coating (AREA)
  • Electroplating Methods And Accessories (AREA)

Abstract

PURPOSE:To easily form a patternlike plating part having a complex shape by irradiating the surface of a material to be plated with laser beams passed through a mask having a patternlike hole in the case of irradiating the surface of the above material immersed in plating liquid with laser beams in a patternlike state to form the patternlike plating part. CONSTITUTION:When voltage is impressed between a cathode consisting of a material 7 to be plated and an anode 8 if a counter electrode by a power source 9 in plating liquid 6 contained in a plating vessel 5 and plating of a complex pattern is applied on the surface of the material 7 to be plated, the laser beams 2 emitted from a laser oscillator 1 are passed through a working head 12 which consists of both a mask 11 formed with a hole of a prescribed pattern and a condenser lens 4 of the laser beams. Thereby the pattern 14 of the mask 11 is formed on the surface of the material 7 to be treated and activated to form the patternlike plating. In this case, when the working head 12 is transferred to the direction of the laser beams 2, the patternlike plating part having different size can be formed. Further this method can be utilized even for an electroless plating equipment and also used even for etching instead of plating.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明はレーザを用いて選択的にめっきあるいはエツ
チングをする加工装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a processing device that selectively performs plating or etching using a laser.

〔従来技術〕[Prior art]

従来、例えばこの種のめつき装置としては第1図の溝成
図に示すものがあった。図において、(1)はレーザ発
振器、(2)はレーザ発振器(1)から放射されるレー
ザ光、(3)はレーザ光(2)の進行方向を変える反射
鏡、(4)はレーザ光(2)を集光する集光レンズ、(
5)はレーザ光(2)を透過させる材質よりなるめっき
糟、(6)はめつき溶液、(7)は被めっき物、(8)
は対電極、(9)は被めっき物(7)と対電極(8)と
に電圧・電流を加える電源である。
Conventionally, for example, as a plating device of this type, there has been one shown in the groove diagram in FIG. In the figure, (1) is a laser oscillator, (2) is a laser beam emitted from the laser oscillator (1), (3) is a reflector that changes the traveling direction of the laser beam (2), and (4) is a laser beam ( 2) A condensing lens that condenses (
5) is a plating pot made of a material that transmits the laser beam (2), (6) is a plating solution, (7) is the object to be plated, (8)
is a counter electrode, and (9) is a power source that applies voltage and current to the object to be plated (7) and the counter electrode (8).

また、第2図は第1図に示すめっき装置により作製すべ
き被めっき物上のめつきパターンを示す平面図である。
2 is a plan view showing a plating pattern on an object to be plated to be produced by the plating apparatus shown in FIG. 1. FIG.

図において(10は形成されためつきパターンである。In the figure (10 is the formed slanting pattern).

次に動作について説明する。めっき溶液(6)中に浸漬
された被めっき物(7)および対電極(8)の間には、
[# (91により所定の電位差が与えられ、微少なイ
オン交換が起こる状態に設定される。しかる状態におい
て、レーザ発振器(1)からレーザ光(2)が放射され
、レーザ光(2)は2枚の反射M (3)により方向変
換され、さらに集光レンズ(4)により被めっき物(7
)表面に焦点を結ぶ状態で照射される。被めっき物(7
)上のレーザビーム(2)照射部は、電気化学的平衡状
態が崩れ、非照射部に比べより卑な電位状態になり、さ
らに照射部近傍のめつき溶液(6)の局部対流撹拌など
の効果とあいまって、選択的にめっきされることになる
Next, the operation will be explained. Between the object to be plated (7) immersed in the plating solution (6) and the counter electrode (8),
[# (91 gives a predetermined potential difference and sets a state in which minute ion exchange occurs. In this state, the laser oscillator (1) emits laser light (2), and the laser light (2) The direction is changed by the reflection M (3) of the sheet, and then the object to be plated (7
) The irradiation is focused on the surface. Plated object (7
), the electrochemical equilibrium state of the irradiated part of the laser beam (2) is disrupted, and the potential state becomes more base than that of the non-irradiated part, and furthermore, the electrochemical equilibrium state of the irradiated part of the laser beam (2) above the irradiated part is disrupted, resulting in a more base potential state than the non-irradiated part. Combined with the effect, it will be selectively plated.

第2図は、このような装置・方法により被めっき物(7
)上に形成されるめっきパターンαQであるが、パター
ン形状が複雑なものあるいはめつき幅、めっき面積が大
きなものに対しては、第1図の反射鏡を操作して被めっ
き物(7)上で集束レーザ光を振動させなければならな
い。
Figure 2 shows the plating target (7
) The plating pattern αQ is formed on the object to be plated (7), but if the pattern shape is complex or the plating width or area is large, the reflector shown in Fig. 1 should be operated. A focused laser beam must be oscillated above.

従来のレーザを用いた局部めっき装置は以上のように構
成されているため、複雑な形状およびめっき幅、めっき
面積が大きなものに対しては、反射鏡(3)と集光レン
ズ(4)を所定形状に対応して移動させる複雑な駆動機
FN(図示せず)が必要となり、また同一パターン形状
のめっきを施す場合には、繰り返し同一駆動をしなけれ
ばならず、莫大な時間を要するという欠点があった。
Conventional local plating equipment using a laser is configured as described above, so for complex shapes, large plating widths, and large plating areas, the reflector (3) and condensing lens (4) are used. A complicated drive machine FN (not shown) is required to move the plating according to the predetermined shape, and when plating the same pattern shape, the same drive must be repeated, which takes a huge amount of time. There were drawbacks.

〔発明の概要〕[Summary of the invention]

この発明は上記のような従来のものの欠点を除去するた
めになされたもので、所望パターンの空孔をあけたマス
クを通過し、集光レンズにより集光されたレーザ光を、
めっき(又はエツチング)溶液中に上記マスクと対向配
置された被めっき(又はエツチング)物に照射し、上記
被めっき(又はエツチング)物のレーザ光照射域を選択
的にめっき(又はエツチング)するようにすることによ
り、複雑なパターンのめつき(又はエツチング)加工を
簡単に効率よく施すことのできる加工装置を提供するこ
とを目的としている。
This invention was made in order to eliminate the drawbacks of the conventional ones as described above, and allows laser light to pass through a mask with holes in a desired pattern and be focused by a condensing lens.
A plating (or etching) object placed opposite the mask is irradiated in a plating (or etching) solution, so that the laser beam irradiation area of the plating (or etching) object is selectively plated (or etched). It is an object of the present invention to provide a processing device that can easily and efficiently perform plating (or etching) processing of complex patterns.

以下、この発明の一実施例のめつき装置を図について説
明する。第3図の構成図において、(1,1)は所定の
パターンの空孔をあけたマスク、@はマスク(6)と集
光レンズ(4)を備えた加工ヘッド、(至)は集光レン
ズ(4)と被めっき物(7)との間隔を変える手段で加
工ヘッド口をレーザ光(2)の光軸方向に移動させる駆
動機構である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS A plating apparatus according to an embodiment of the present invention will be described below with reference to the drawings. In the configuration diagram in Figure 3, (1, 1) is a mask with holes in a predetermined pattern, @ is a processing head equipped with a mask (6) and a condensing lens (4), and (to) is a condensing lens. This is a drive mechanism that moves the processing head opening in the optical axis direction of the laser beam (2) by changing the distance between the lens (4) and the object to be plated (7).

また、第4図はマスク(ロ)の平面図であり、所定のめ
つきパターンと相似形状の空孔6畳があけられている。
Further, FIG. 4 is a plan view of the mask (b), in which six holes of similar shape to a predetermined plating pattern are bored.

次にこの発明の装置による動作について説明する。従来
と同様、めっき溶液(6)中に浸漬された被めっき物(
7)および対電極(8)の間には、電源(9)により所
定の電位差が与えられ、微少なイオン交換が起こる状態
に設定される。
Next, the operation of the apparatus of the present invention will be explained. As in the past, the object to be plated (
7) and the counter electrode (8), a predetermined potential difference is applied by a power source (9), and a state is set in which minute ion exchange occurs.

しかる状態において、レーザ発振器(1)から放射され
たレーザ光(2)は光路上に配設されたマスク(ロ)に
よりレーザ光(2)の一部を遮蔽され、マスクにあけら
れた空孔α〜を通過した空孔形状のレーザ光となって集
光レンズ(4)を透過し集光されて被めっき物(7)表
面に照射される。被めっき物(7)表面ではレーザ光(
2)が照射された所定のパターン形状部分のみが活性化
し、選択的にめっきされ、所望のめつきパターンが得ら
れる。めっきパターンの寸法を変化させる場合には、駆
動機構(至)により加工ヘッド四をレーザ光(2)と同
軸方向に移動させることにより、集光レンズ(4)と被
めっき物(7)との間隔を変えて被めっき物(7)表面
上でのめつきパターンの大きさを任意に設定することが
できる。
In this state, a part of the laser beam (2) emitted from the laser oscillator (1) is blocked by a mask (b) placed on the optical path, and a hole made in the mask is blocked. The hole-shaped laser beam that has passed through α~ is transmitted through the condenser lens (4), is condensed, and is irradiated onto the surface of the object to be plated (7). Laser light (
Only the predetermined pattern-shaped portions irradiated with 2) are activated and selectively plated, resulting in a desired plating pattern. When changing the dimensions of the plating pattern, the drive mechanism (to) moves the processing head 4 in the same axis direction as the laser beam (2), thereby changing the relationship between the condenser lens (4) and the object to be plated (7). The size of the plating pattern on the surface of the object to be plated (7) can be arbitrarily set by changing the interval.

なお、上記実施例ではマスクa復を集光レンズ(4)よ
りレーザ発振器(1〕側に配設した例を示したが、レー
ザ光(2)の光軸上であれば任意の位置でよい。
In the above embodiment, the mask a was placed closer to the laser oscillator (1) than the condenser lens (4), but it may be placed at any position as long as it is on the optical axis of the laser beam (2). .

また、集光レンズ(4)と被めっき物(7)との間隔を
変えるのに、加工ヘッド@を移動させる方法をとったが
、マスクαル、集光レンズ(4)及び被加工物(7)を
各々単独に動かしてもよい、また上記実施例ではレーザ
ビーム(2)をめっき糟(5)の側方から照射する例を
示したが、めっき溶液の液面側から照射してもよい。ま
た上記実施例では、電解めっきの例について説明したが
、無電解めっきであってもよい。
In addition, in order to change the distance between the condenser lens (4) and the object to be plated (7), we used a method of moving the processing head @, but the mask α, the condenser lens (4), and the object to be plated ( 7) may be moved independently. In the above embodiment, an example was shown in which the laser beam (2) is irradiated from the side of the plating bath (5), but it is also possible to irradiate it from the liquid surface side of the plating solution. good. Further, in the above embodiments, an example of electrolytic plating has been described, but electroless plating may also be used.

さらにめっき溶液と電源の極性を変えたエツチング除去
加工に対しても同様の効果を奏する。
Furthermore, the same effect can be achieved in etching removal processing by changing the polarity of the plating solution and power supply.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明(こよれば、所望パターンの空
孔をあけたマスクを通過し集光レンズにより集光された
レーザ光を、めっき(又はエツチング)溶液中に上記マ
スクと対向配置された被めっき(又はエツチング)物に
照射し、上記波めっき(又はエツチング)物のレーザ光
照射域を選択的にめっき(又はエツチング)するように
することにより、複雑なパターンのめつき(又はエツチ
ング)加工を簡単に効率よく施せる加工装置が得られる
という効果がある。
As described above, the present invention (according to this invention) allows laser light that passes through a mask with holes in a desired pattern and is focused by a condensing lens to be placed in a plating (or etching) solution facing the mask. Plating (or etching) of complex patterns can be achieved by selectively plating (or etching) the laser beam irradiation area of the wave-plated (or etched) object. ) This has the effect of providing a processing device that can perform processing easily and efficiently.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のレーザを用いためつき装置を示す構成図
、第2図は被めっき物とに形成されためつきパターンを
示す平面図、第3図はこの発明の一実施例のめつき装置
を示す構成図、第4図はこの発明に係わるマスクの一実
施例を示す平面図である。 図において、(1)はレーザ発振器、(2)はレーザ光
、(4)は集光レンズ、(5)はめつき糟、(6)はめ
つき溶液、(7)は披めっき物、(8)は対電極、(9
)は電源、(ロ)はマスク、Qは集光レンズの駆動機溝
である。 なお、 図中同一符号は同−又は相当部分を示す。
Fig. 1 is a block diagram showing a conventional plating device using a laser, Fig. 2 is a plan view showing a plating pattern formed on an object to be plated, and Fig. 3 is a plating device according to an embodiment of the present invention. FIG. 4 is a plan view showing an embodiment of the mask according to the present invention. In the figure, (1) is a laser oscillator, (2) is a laser beam, (4) is a condensing lens, (5) is a plating pot, (6) is a plating solution, (7) is a plated object, (8) is the counter electrode, (9
) is the power supply, (b) is the mask, and Q is the driver groove of the condenser lens. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (4)

【特許請求の範囲】[Claims] (1)所望パターンの空孔をあけたマスクを通過し集光
レンズにより集光されたレーザ光を、めつき(又はエッ
チング)溶液中に上記マスクと対向配置された被めつき
(又はエッチング)物に照射し、上記被めつき(又はエ
ッチング)物のレーザ光照射域を選択的にめつき(又は
エッチング)するようにした加工装置。
(1) Laser light that passes through a mask with holes in a desired pattern and is focused by a condensing lens is applied to a plating (or etching) plate placed opposite the mask in a plating (or etching) solution. A processing device that irradiates an object to selectively plate (or etch) the laser beam irradiation area of the object to be plated (or etched).
(2)集光レンズと被めつき(又はエッチング)物との
間隔を変える手段を備えている特許請求の範囲第1項に
記載の加工装置。
(2) The processing apparatus according to claim 1, further comprising means for changing the distance between the condenser lens and the plated (or etched) object.
(3)集光レンズを光軸方向に沿つて移動させるように
した特許請求の範囲第2項記載の加工装置。
(3) The processing device according to claim 2, wherein the condenser lens is moved along the optical axis direction.
(4)めつきは無電解めつきである特許請求の範囲第1
項ないし第3項のいずれかに記載の加工装置。
(4) Plating is electroless plating Claim 1
The processing device according to any one of Items 1 to 3.
JP13630489A 1989-05-30 1989-05-30 Working equipment Pending JPH0222493A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13630489A JPH0222493A (en) 1989-05-30 1989-05-30 Working equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13630489A JPH0222493A (en) 1989-05-30 1989-05-30 Working equipment

Publications (1)

Publication Number Publication Date
JPH0222493A true JPH0222493A (en) 1990-01-25

Family

ID=15172063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13630489A Pending JPH0222493A (en) 1989-05-30 1989-05-30 Working equipment

Country Status (1)

Country Link
JP (1) JPH0222493A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113597107A (en) * 2021-07-28 2021-11-02 广东工业大学 Method for processing micro-droplet auxiliary type nano metal fine line

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5970755A (en) * 1982-09-30 1984-04-21 インタ−ナシヨナル ビジネス マシ−ンズ コ−ポレ−シヨン Automatic electrochemical treating device using energy beam

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5970755A (en) * 1982-09-30 1984-04-21 インタ−ナシヨナル ビジネス マシ−ンズ コ−ポレ−シヨン Automatic electrochemical treating device using energy beam

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113597107A (en) * 2021-07-28 2021-11-02 广东工业大学 Method for processing micro-droplet auxiliary type nano metal fine line
CN113597107B (en) * 2021-07-28 2022-08-05 广东工业大学 Method for processing micro-droplet auxiliary type nano metal fine line

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