JPH02215135A - Vapor phase epitaxy device - Google Patents

Vapor phase epitaxy device

Info

Publication number
JPH02215135A
JPH02215135A JP3698589A JP3698589A JPH02215135A JP H02215135 A JPH02215135 A JP H02215135A JP 3698589 A JP3698589 A JP 3698589A JP 3698589 A JP3698589 A JP 3698589A JP H02215135 A JPH02215135 A JP H02215135A
Authority
JP
Japan
Prior art keywords
mercury
gas
reaction tube
raw material
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3698589A
Other languages
Japanese (ja)
Inventor
Kenji Maruyama
研二 丸山
Koji Shinohara
篠原 宏爾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3698589A priority Critical patent/JPH02215135A/en
Publication of JPH02215135A publication Critical patent/JPH02215135A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent any evaporated gas of an easily evaporative raw liquid from being led in a reaction tube without fixing a valve by a method wherein a raw gas liquefying means is provided to flow back the liquefied raw gas to the liquefying means. CONSTITUTION:A cooling apparatus such as Peltier element or Joule Thomson type cooler (cooling liquefying means) 12 is provided between a raw liquid evaporating means 111 such as a mercury evaporator, etc., and a reaction tube 3 to that mercury of a carrier gas containing mercury may be cooled down and liquefied to be flowed back from a mercury reservoir 13 to the means 11. Through these procedures, any evaporated gas of the material solution such as easily evaporative mercury solution, etc., can be prevented from being led in the reaction tube 3 without fixing a valve at all and after forming a epitaxial layer such as Hg1-xCdx Te, etc., on a substrate, the epitaxial layers, etc., containing no mercury can be continuously formed laminatedly.

Description

【発明の詳細な説明】 〔概 要〕 気相エピタキシャル成長装置に関し、 易蒸発性の水銀を含むエピタキシャル層と、該水銀を含
まないエピタキシャル層が積層されたエピタキシャル層
が容易に得られるような装置を目的とし、 エピタキシャル成長用基板を設置したサセプタを反応管
内に設置し、該基板上にエピタキシャル成長ガスの原料
液体を気化した原料ガスを導入し、該基板を加熱して原
料ガスを熱分解して基板上にエピタキシャル層を形成す
る装置に於いて、前記原料液体を気化する手段と反応管
との間に前記気化した原料ガスを冷却して液化し、該液
化したガスを前記原料液体のガス化用の蒸発器に還流さ
せる手段を設けて構成する。
[Detailed Description of the Invention] [Summary] Regarding a vapor phase epitaxial growth apparatus, an apparatus that can easily obtain an epitaxial layer in which an epitaxial layer containing easily evaporable mercury and an epitaxial layer not containing mercury are laminated is provided. For the purpose, a susceptor with a substrate for epitaxial growth installed is installed in a reaction tube, a source gas obtained by vaporizing the source liquid of the epitaxial growth gas is introduced onto the substrate, the substrate is heated, the source gas is thermally decomposed, and the source gas is thermally decomposed onto the substrate. In an apparatus for forming an epitaxial layer on a liquid, the vaporized raw material gas is cooled and liquefied between a means for vaporizing the raw material liquid and a reaction tube, and the liquefied gas is used for gasifying the raw material liquid. A means for refluxing the evaporator is provided.

〔産業上の利用分野〕[Industrial application field]

本発明は気相エピタキシャル成長装置に関する。 The present invention relates to a vapor phase epitaxial growth apparatus.

赤外線検知素子形成材料としてエネルギーバンドギャッ
プの狭い、水銀・カドミウム・テルル(Hgl−x c
tiXTe)よりなる化合物半導体結晶が用いられてい
る。
Mercury, cadmium, tellurium (Hgl-x c
A compound semiconductor crystal made of TiXTe) is used.

このようなHgt−y cctX Teの結晶をエピタ
キシャル成長する際、CdTeのような基板を設置した
サセプタを反応管内に設置し、該基板上に水銀(Hg)
とジメチルカドミウム(Cd(CIj)z) 、ジエチ
ルテルル(Te(CtHs)z Eのような原料ガスを
、キャリアガスの水素ガスと共に導入し、前記基板を設
置したサセプタを加熱することで反応管内に導入された
原料ガスを分解し、基板上にHgt−x Cdg Te
の結晶をエピタキシャル成長する方法が採られている。
When epitaxially growing such a crystal of Hgt-y cct
A raw material gas such as dimethyl cadmium (Cd(CIj)z) or diethyltellurium (Te(CtHs)z) is introduced together with hydrogen gas as a carrier gas, and the susceptor on which the substrate is installed is heated to form a gas in the reaction tube. The introduced raw material gas is decomposed and Hgt-x Cdg Te is deposited on the substrate.
A method of epitaxially growing crystals has been adopted.

このような気相成長方法をMOCVD法(MetalO
rganic Chemical Vapor Dep
osition :有機金属気相成長方法)と称してい
る。
This type of vapor phase growth method is called MOCVD method (MetalO
rganic Chemical Vapor Dep
position: metalorganic vapor phase growth method).

〔従来の技術〕[Conventional technology]

このような従来の気相エピタキシャル成長装置について
第3図を用いて説明する。
Such a conventional vapor phase epitaxial growth apparatus will be explained with reference to FIG.

図示するようにCdTeのようなエピタキシャル成長用
基板1を設置したサセプタ2を収容した反応管3に連な
るガス導入管4は分岐されて一方のガス導入管4Aは水
銀4を収容する水銀蒸発器6に接続され、分岐された他
方のガス導入管4Bは図示しないがジメチルカドミウム
、およびジエチルテルルを収容した蒸発器に接続されて
いる。
As shown in the figure, a gas introduction pipe 4 connected to a reaction tube 3 containing a susceptor 2 on which a substrate 1 for epitaxial growth such as CdTe is installed is branched, and one gas introduction pipe 4A is connected to a mercury evaporator 6 containing mercury 4. The other connected and branched gas introduction pipe 4B is connected to an evaporator containing dimethyl cadmium and diethyl tellurium (not shown).

そしてこれ等の水銀蒸発器6、ジメチルカドミウムの蒸
発器、ジエチルテルルの蒸発器にキャリアガスとしての
水素ガスOb)を導入し、これら水銀を担持した水素ガ
ス、ジエチルテルルを担持した水素ガス、ジメチルカド
ミウムを担持した水素ガスをガス導入管4Aと4Bを通
じて反応管3内に導入し、前記サセプタ2を反応管3の
周囲の高周波誘導コイル6に通電することで加熱し、こ
のサセプタ2の加熱で基板1を加熱し、基板1上に到達
した水銀ガス、ジメチルカドミウムガスおよびジエチル
テルルガスのようなエピタキシャル成長ガスを加熱分解
して基板上にt1g+−x CdxTeのエピタキシャ
ル層を形成し、このエピタキシャル成長にあずからなっ
たガスを反応管のフランジ10を通じて外部へ排出して
いる。
Then, hydrogen gas Ob) as a carrier gas is introduced into these mercury evaporator 6, dimethyl cadmium evaporator, and diethyl tellurium evaporator, hydrogen gas carrying mercury, hydrogen gas carrying diethyl tellurium, and dimethyl Hydrogen gas carrying cadmium is introduced into the reaction tube 3 through the gas introduction tubes 4A and 4B, and the susceptor 2 is heated by energizing the high frequency induction coil 6 around the reaction tube 3. The substrate 1 is heated and epitaxial growth gases such as mercury gas, dimethyl cadmium gas, and diethyl tellurium gas that have reached the substrate 1 are thermally decomposed to form an epitaxial layer of t1g+-x CdxTe on the substrate, and to participate in this epitaxial growth. The gas consisting of is discharged to the outside through the flange 10 of the reaction tube.

〔発明が解決しようとする課題] ところで上記反応管内には形成されるエピタキシャル層
の組成の均一化を図るために、一定の原料ガス濃度のキ
ャリアガスを導入する必要があり、そのために、例えば
水銀蒸発器6内に水素ガスのキャリアガスを導入し、該
水銀を上記水素ガスによってバブルし、該蒸発器6の空
間部6Aを水銀の飽和蒸気で充満させ、この飽和蒸気と
なった水銀をキャリアガスの水素によって反応管内に導
入している。
[Problems to be Solved by the Invention] By the way, in order to make the composition of the epitaxial layer formed uniform in the reaction tube, it is necessary to introduce a carrier gas with a certain concentration of raw material gas, for example, mercury. A hydrogen carrier gas is introduced into the evaporator 6, the mercury is bubbled with the hydrogen gas, the space 6A of the evaporator 6 is filled with saturated mercury vapor, and the saturated mercury is used as a carrier. Gaseous hydrogen is introduced into the reaction tube.

このような水銀の飽和蒸気を得るためには、該水銀を2
50℃に加熱して飽和蒸気圧を有する水銀としており、
そのため、水銀蒸発器6の周囲には加熱器8を設置して
水銀の温度を250℃に保つと共に、水銀蒸発器6に連
なるガス導入管4Aおよび、反応管のガス導入側の周囲
には加熱ヒータ9を設置しており、ガス導入管4Aおよ
び反応管3のガス導入側の管壁の温度を高めて、導入さ
れる水銀の蒸気が該管壁で凝固して付着しないようにし
ている。
In order to obtain such saturated mercury vapor, the mercury must be
Mercury is heated to 50°C to have a saturated vapor pressure,
Therefore, a heater 8 is installed around the mercury evaporator 6 to maintain the temperature of mercury at 250°C, and a heater 8 is installed around the gas inlet pipe 4A connected to the mercury evaporator 6 and the gas inlet side of the reaction tube. A heater 9 is installed to raise the temperature of the gas introduction tube wall of the gas introduction tube 4A and the reaction tube 3 so that the introduced mercury vapor does not solidify and adhere to the tube wall.

ところで上記した装置を用いてCdTeの基板上にHg
t−x Cdx Teのエピタキシャル層と水銀を含ま
ないCdTeのエピタキシャル層を積層して形成する必
要が、形成すべき検知素子の種類によって生じる場合が
ある。
By the way, using the above-mentioned apparatus, Hg was deposited on a CdTe substrate.
The need to stack an epitaxial layer of t-x Cdx Te and an epitaxial layer of mercury-free CdTe may arise depending on the type of sensing element to be formed.

そのため、水銀蒸発器6とガス導入管4Aとの間にパル
プを設けて、このパルプを閉じて水銀蒸発器6内の水銀
5が反応管内に導入されないような装置を形成しようと
試みたが、上記ガス導入管4Aはヒータ9によって加熱
されているため、この高温に耐える樹脂製のパルプは存
在しなく、また金属製のパルプを用いるとガス導入管を
流れる水銀と金属とが化学反応して水銀アマルガム生じ
、その成分が反応管内に導入されるので好ましくない。
Therefore, an attempt was made to provide a pulp between the mercury evaporator 6 and the gas introduction tube 4A and close this pulp to form a device that would prevent the mercury 5 in the mercury evaporator 6 from being introduced into the reaction tube. Since the gas introduction pipe 4A is heated by the heater 9, there is no resin pulp that can withstand this high temperature, and if metal pulp is used, the mercury flowing through the gas introduction pipe and the metal will chemically react. This is not preferred because mercury amalgam is formed and its components are introduced into the reaction tube.

本発明は上記した問題点を解決し、上記したパルプを用
いないで易蒸発性の原料液体の蒸発したガスが反応管内
に導入されないようにした気相エピタキシャル成長装置
の提供を目的とする。
The present invention solves the above-mentioned problems and aims to provide a vapor phase epitaxial growth apparatus which does not use the above-mentioned pulp and prevents the vaporized gas of the easily evaporable raw material liquid from being introduced into the reaction tube.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の気相エピタキシャル成長装置は第1図に示すよ
うに、原料液体を気化する手段itと、反応管3の間に
前記気化した原料ガスを冷却して液化する手段12を設
け、該液化したガスを前記原料液体の気化手段11に還
流させる手段を設けたことで構成する。
As shown in FIG. 1, the vapor phase epitaxial growth apparatus of the present invention is provided with means 12 for cooling and liquefying the vaporized raw material gas between a means IT for vaporizing the raw material liquid and a reaction tube 3. It is constructed by providing means for refluxing the gas to the vaporizing means 11 for the raw material liquid.

(作 用) 本発明の装置は易蒸発性の水銀を担持したキャリアガス
が反応管内に導入される通路の途中にベルチェ素子やジ
ュールトムソン型冷却器のような冷却装置12を設置し
、水銀を含むキャリアガスの水銀をこの装置によって冷
却して液化するとともに、この液化した水銀を溜める水
銀溜13を設け、この水銀溜13より溜まった水銀を原
料液体気化手段の水銀蒸発器11の内部に還流させる。
(Function) In the apparatus of the present invention, a cooling device 12 such as a Bertier element or a Joule-Thomson type cooler is installed in the middle of a passage through which a carrier gas carrying easily evaporable mercury is introduced into a reaction tube, and the mercury is The mercury contained in the carrier gas is cooled and liquefied by this device, and a mercury reservoir 13 is provided to store the liquefied mercury, and the mercury collected from this mercury reservoir 13 is returned to the inside of the mercury evaporator 11 of the raw material liquid vaporization means. let

このようにすれば、耐熱性が乏しいか、或いは水銀アマ
ルガムを形成し易い樹脂または金属性のバルブを用いる
ことなく、容易に水銀の蒸気が反応管内に導入されるの
を停止することができるので、基板上にHg+−x C
dXTeのエピタキシャル層を形成後、その上に水銀を
含まないCdTeのエピタキシャル層を連続して積層形
成することが可能となる。
In this way, it is possible to easily stop the introduction of mercury vapor into the reaction tube without using resin or metal valves that have poor heat resistance or easily form mercury amalgam. , Hg+-x C on the substrate
After forming the epitaxial layer of dXTe, it becomes possible to continuously form an epitaxial layer of CdTe that does not contain mercury thereon.

〔実 施 例〕〔Example〕

以下、図面を用いて本発明の一実施例につき詳細に説明
する。
Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.

第1図は本発明のエピタキシャル成長装置の要部を示す
模式図で、第2図は第1図の要部の詳細図である。
FIG. 1 is a schematic diagram showing the main parts of the epitaxial growth apparatus of the present invention, and FIG. 2 is a detailed view of the main parts of FIG. 1.

第1図および第2図に示すように、本発明の装置は水銀
蒸発器11と反応管3の経路のガス導入管4Aにベルチ
ェ素子、或いはジュール・トムソン型冷却素子12を設
ける。そしてこの素子の対向する部分は断熱材14を充
填し、この断熱材140間に前記ガス導入管4Aの熱伝
達を良好にするために蛇管4C構造に形成し、この蛇管
4Cの下部に液化した水銀を一時的に溜める水銀溜13
を設ける。
As shown in FIGS. 1 and 2, in the apparatus of the present invention, a Vertier element or a Joule-Thomson type cooling element 12 is provided in the gas introduction tube 4A in the path between the mercury evaporator 11 and the reaction tube 3. The opposing portions of this element are filled with a heat insulating material 14, and between the heat insulating material 140, a serpentine pipe 4C structure is formed in order to improve the heat transfer of the gas introduction pipe 4A. Mercury reservoir 13 that temporarily stores mercury
will be established.

このような装置を用いてCdTeのエピタキシャル成長
用基板上に”gl−x Cdx Toのエピタキシャル
層を形成した後、その上にCdTeのエピタキシャル層
を形成する場合について述べる。
A case will be described in which an epitaxial layer of gl-x Cdx To is formed on a CdTe epitaxial growth substrate using such an apparatus, and then a CdTe epitaxial layer is formed thereon.

まず水銀蒸発器に流すガス流量を0.31 /lll1
n、水銀蒸発器11の加熱温度を270 ’Cとするこ
とで、水銀蒸発器より導出されたキャリアガス中の水銀
分圧は0.16at−となり、この状態で前記したジメ
チルカドミウム、およびジエチルテルルを担持した水素
ガスとともに反応管3内に導入して基板上にHg+−x
 Cdx Teのエピタキシャル層を形成する。
First, set the gas flow rate to the mercury evaporator to 0.31/lll1.
By setting the heating temperature of the mercury evaporator 11 to 270'C, the mercury partial pressure in the carrier gas derived from the mercury evaporator becomes 0.16 at-, and in this state, the above-mentioned dimethyl cadmium and diethyl tellurium Hg+-x is introduced into the reaction tube 3 together with hydrogen gas supporting Hg+-x
Form an epitaxial layer of CdxTe.

次いで前記ベルチェ素子12等の冷却素子を作動させ、
冷却素子近傍の蛇管4C内の温度を一35°Cに保つ。
Next, actuate the cooling element such as the Bertier element 12,
The temperature inside the corrugated pipe 4C near the cooling element is maintained at -35°C.

すると水銀の融点は一38°Cであるので、大部分の水
銀ガスは液体となり、この場合のキャリアガス中の水銀
分圧は5.8 XIO”’atn+となり、水銀を遮断
することができる。このベルチェ素子12によって蛇管
4Cを伝わって上昇する水銀を含むガスを液化し、この
水銀を含むガスが反応管3内に導入されないようになる
Then, since the melting point of mercury is -38°C, most of the mercury gas becomes a liquid, and the mercury partial pressure in the carrier gas in this case becomes 5.8 XIO"'atn+, which can block mercury. The Vertier element 12 liquefies the mercury-containing gas rising along the flexible tube 4C, and prevents the mercury-containing gas from being introduced into the reaction tube 3.

この状態にすると前記反応管内にはジメチルテルル、お
よびジメチルカドミウムを担持した水素ガスのみが導入
されるので、水銀を含まないCdTeのエピタキシャル
層がHg+−x CdXTeのエピタキシャル層上に積
層して形成される。
In this state, only dimethyl tellurium and hydrogen gas carrying dimethyl cadmium are introduced into the reaction tube, so a mercury-free CdTe epitaxial layer is formed on the Hg+-x CdXTe epitaxial layer. Ru.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように本発明によれば、基板上
にHg+−m Cdx ToとCdTeのエピタキシャ
ル層が容易に積層して形成される気相エピタキシャル成
長装置が得られ、赤外線検知装置等の素子形成材料の製
造に利用して効果が大である。
As is clear from the above description, according to the present invention, it is possible to obtain a vapor phase epitaxial growth apparatus in which epitaxial layers of Hg+-m Cdx To and CdTe are easily laminated and formed on a substrate. It is highly effective when used in the production of forming materials.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の装置の一実施例の要部の説明図、 第2図は第1図の要部の詳細図、 第3図は従来の気相成長装置の説明図である。 図において、 3は反応管、4Aはガス導入管、4Cは蛇管、11は原
料液体気化手段(水銀蒸発器)、12は冷却液化手段( ペルチェ素子) 13は水銀溜、 14は断熱材 を示す。 第 図 オlトキ印。すギ四図 第 2m
FIG. 1 is an explanatory diagram of the essential parts of an embodiment of the apparatus of the present invention, FIG. 2 is a detailed diagram of the essential parts of FIG. 1, and FIG. 3 is an explanatory diagram of a conventional vapor phase growth apparatus. In the figure, 3 is a reaction tube, 4A is a gas introduction tube, 4C is a flexible tube, 11 is a raw material liquid vaporization means (mercury evaporator), 12 is a cooling liquefaction means (Peltier element), 13 is a mercury reservoir, and 14 is a heat insulating material. . Diagram Ortoki mark. Sugi 4th figure 2m

Claims (1)

【特許請求の範囲】 エピタキシャル成長用基板(1)を設置したサセプタ(
2)を反応管(3)内に設置し、該基板上にエピタキシ
ャル成長ガスの原料液体を気化した原料ガスを導入し、
該基板を加熱して原料ガスを熱分解して基板上にエピタ
キシャル層を形成する装置に於いて、 前記原料液体の気化手段(11)と反応管(3)との間
に前記気化した原料ガスを冷却して液化する手段(12
)を設け、該液化したガスを前記原料液体の気化手段(
11)に還流させるようにしたことを特徴とする気相エ
ピタキシャル成長装置。
[Claims] A susceptor (
2) is installed in a reaction tube (3), and a raw material gas obtained by vaporizing a raw material liquid of an epitaxial growth gas is introduced onto the substrate,
In the apparatus for forming an epitaxial layer on the substrate by heating the substrate and thermally decomposing the raw material gas, the vaporized raw material gas is disposed between the raw material liquid vaporization means (11) and the reaction tube (3). Means for cooling and liquefying (12
), and the liquefied gas is transferred to the raw material liquid vaporization means (
11) A vapor phase epitaxial growth apparatus characterized in that the reflux is performed.
JP3698589A 1989-02-15 1989-02-15 Vapor phase epitaxy device Pending JPH02215135A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3698589A JPH02215135A (en) 1989-02-15 1989-02-15 Vapor phase epitaxy device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3698589A JPH02215135A (en) 1989-02-15 1989-02-15 Vapor phase epitaxy device

Publications (1)

Publication Number Publication Date
JPH02215135A true JPH02215135A (en) 1990-08-28

Family

ID=12485045

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3698589A Pending JPH02215135A (en) 1989-02-15 1989-02-15 Vapor phase epitaxy device

Country Status (1)

Country Link
JP (1) JPH02215135A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06268053A (en) * 1993-03-16 1994-09-22 Ngk Insulators Ltd Susceptor for semiconductor wafer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06268053A (en) * 1993-03-16 1994-09-22 Ngk Insulators Ltd Susceptor for semiconductor wafer

Similar Documents

Publication Publication Date Title
US3065113A (en) Compound semiconductor material control
US6712908B2 (en) Purified silicon production system
US6676752B1 (en) Forming metal nitrides
JPH02215135A (en) Vapor phase epitaxy device
JPH01257337A (en) Vapor phase epitaxy apparatus
US6447734B1 (en) Vaporization and cracker cell apparatus
EP0122339B1 (en) Method of and apparatus for producing a controlled unsaturated vapour pressure of a volatile liquid in a liquid epitaxy or annealing process
GB1031517A (en) Methods of producing vapours having at least two components
JPH01152734A (en) Evaporator
US4609424A (en) Plasma enhanced deposition of semiconductors
JPS58176196A (en) Apparatus for growing crystal from compound
JPH0217019Y2 (en)
JPH047847A (en) Vapor growth equipment
JPS637620A (en) Apparatus for vaporizing volatile material
JPS63174312A (en) Vapor phase epitaxial growth apparatus
JPS6121995A (en) Vaporization of organometallic compound
JPH0582457A (en) Manufacturing equipment for semiconductor crystal and manufacture of semiconductor crystal using the equipment
JPS6242517A (en) Semiconductor vapor processing
JPH01289258A (en) Vapor phase epitaxy
JPS63250465A (en) Vapor growth device
JPH04219393A (en) Method and device for gas-phase epitaxial growth
JPH04119906A (en) Production of thin oxide film
JPS62169410A (en) Vapor growth equipment
JPS61263119A (en) Producing equipment of semiconductor by vapor growth
JPH0432241A (en) Vapor epitaxially growing apparatus