JPH022085B2 - - Google Patents

Info

Publication number
JPH022085B2
JPH022085B2 JP58187593A JP18759383A JPH022085B2 JP H022085 B2 JPH022085 B2 JP H022085B2 JP 58187593 A JP58187593 A JP 58187593A JP 18759383 A JP18759383 A JP 18759383A JP H022085 B2 JPH022085 B2 JP H022085B2
Authority
JP
Japan
Prior art keywords
circuit
zero point
temperature
old
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58187593A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6079224A (ja
Inventor
Fumiaki Tsukasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP58187593A priority Critical patent/JPS6079224A/ja
Publication of JPS6079224A publication Critical patent/JPS6079224A/ja
Publication of JPH022085B2 publication Critical patent/JPH022085B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP58187593A 1983-10-06 1983-10-06 基準点補正装置 Granted JPS6079224A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58187593A JPS6079224A (ja) 1983-10-06 1983-10-06 基準点補正装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58187593A JPS6079224A (ja) 1983-10-06 1983-10-06 基準点補正装置

Related Child Applications (2)

Application Number Title Priority Date Filing Date
JP1147364A Division JPH0228516A (ja) 1989-06-10 1989-06-10 基準点補正装置
JP1147363A Division JPH0228515A (ja) 1989-06-10 1989-06-10 基準点補正装置

Publications (2)

Publication Number Publication Date
JPS6079224A JPS6079224A (ja) 1985-05-07
JPH022085B2 true JPH022085B2 (th) 1990-01-16

Family

ID=16208819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58187593A Granted JPS6079224A (ja) 1983-10-06 1983-10-06 基準点補正装置

Country Status (1)

Country Link
JP (1) JPS6079224A (th)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0410790U (th) * 1990-05-18 1992-01-29

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6798718B1 (en) * 1999-04-19 2004-09-28 Seiko Instruments Inc. Sensor timepiece, sensor timepiece data input system and method, and computer readable recording medium
JP5403793B2 (ja) * 2009-04-21 2014-01-29 株式会社タニタ 重量測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0410790U (th) * 1990-05-18 1992-01-29

Also Published As

Publication number Publication date
JPS6079224A (ja) 1985-05-07

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