JPH0220072B2 - - Google Patents

Info

Publication number
JPH0220072B2
JPH0220072B2 JP57083686A JP8368682A JPH0220072B2 JP H0220072 B2 JPH0220072 B2 JP H0220072B2 JP 57083686 A JP57083686 A JP 57083686A JP 8368682 A JP8368682 A JP 8368682A JP H0220072 B2 JPH0220072 B2 JP H0220072B2
Authority
JP
Japan
Prior art keywords
cable
wires
wire
break
detecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57083686A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58200171A (ja
Inventor
Yoshito Tanaka
Hiroshi Nagai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobelco Wire Co Ltd
Original Assignee
Shinko Wire Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Wire Co Ltd filed Critical Shinko Wire Co Ltd
Priority to JP57083686A priority Critical patent/JPS58200171A/ja
Publication of JPS58200171A publication Critical patent/JPS58200171A/ja
Publication of JPH0220072B2 publication Critical patent/JPH0220072B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54—Testing for continuity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57083686A 1982-05-17 1982-05-17 防食ケ−ブルの断線検出方法 Granted JPS58200171A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57083686A JPS58200171A (ja) 1982-05-17 1982-05-17 防食ケ−ブルの断線検出方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57083686A JPS58200171A (ja) 1982-05-17 1982-05-17 防食ケ−ブルの断線検出方法

Publications (2)

Publication Number Publication Date
JPS58200171A JPS58200171A (ja) 1983-11-21
JPH0220072B2 true JPH0220072B2 (ko) 1990-05-08

Family

ID=13809370

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57083686A Granted JPS58200171A (ja) 1982-05-17 1982-05-17 防食ケ−ブルの断線検出方法

Country Status (1)

Country Link
JP (1) JPS58200171A (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005057577A1 (de) * 2005-12-02 2007-06-06 Robert Bosch Gmbh Leistungstransistor-Schalteinrichtung und Verfahren zur Funktionsprüfung einer derartigen Leistungstransistor-Schalteinrichtung

Also Published As

Publication number Publication date
JPS58200171A (ja) 1983-11-21

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