JPH0219911B2 - - Google Patents

Info

Publication number
JPH0219911B2
JPH0219911B2 JP56207850A JP20785081A JPH0219911B2 JP H0219911 B2 JPH0219911 B2 JP H0219911B2 JP 56207850 A JP56207850 A JP 56207850A JP 20785081 A JP20785081 A JP 20785081A JP H0219911 B2 JPH0219911 B2 JP H0219911B2
Authority
JP
Japan
Prior art keywords
relay
circuit
flip
coil
flop
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56207850A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58108469A (ja
Inventor
Fumio Sanpei
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP20785081A priority Critical patent/JPS58108469A/ja
Publication of JPS58108469A publication Critical patent/JPS58108469A/ja
Publication of JPH0219911B2 publication Critical patent/JPH0219911B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP20785081A 1981-12-22 1981-12-22 自己保持形リレ−の動作・復旧時間測定回路 Granted JPS58108469A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20785081A JPS58108469A (ja) 1981-12-22 1981-12-22 自己保持形リレ−の動作・復旧時間測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20785081A JPS58108469A (ja) 1981-12-22 1981-12-22 自己保持形リレ−の動作・復旧時間測定回路

Publications (2)

Publication Number Publication Date
JPS58108469A JPS58108469A (ja) 1983-06-28
JPH0219911B2 true JPH0219911B2 (enrdf_load_stackoverflow) 1990-05-07

Family

ID=16546557

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20785081A Granted JPS58108469A (ja) 1981-12-22 1981-12-22 自己保持形リレ−の動作・復旧時間測定回路

Country Status (1)

Country Link
JP (1) JPS58108469A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104977528A (zh) * 2014-04-11 2015-10-14 华北电力大学 磁保持继电器动作时间和复归时间检测装置
CN107167729B (zh) * 2017-05-26 2019-06-18 中国电子科技集团公司第四十一研究所 利用触发脉冲控制的继电器操作时间自动测试装置及方法
CN111123085A (zh) * 2019-11-19 2020-05-08 北京航天测控技术有限公司 一种测量方法及电路

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5232756B2 (enrdf_load_stackoverflow) * 1973-08-03 1977-08-23
JPS5528342A (en) * 1978-08-21 1980-02-28 Kawasaki Steel Corp Detecting method for fall of ansatz of blast furnace

Also Published As

Publication number Publication date
JPS58108469A (ja) 1983-06-28

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