JPH02172888A - Crucible for pulling up silicon single crystal - Google Patents

Crucible for pulling up silicon single crystal

Info

Publication number
JPH02172888A
JPH02172888A JP32868988A JP32868988A JPH02172888A JP H02172888 A JPH02172888 A JP H02172888A JP 32868988 A JP32868988 A JP 32868988A JP 32868988 A JP32868988 A JP 32868988A JP H02172888 A JPH02172888 A JP H02172888A
Authority
JP
Japan
Prior art keywords
crucible
single crystal
silica glass
pulling
bubbles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP32868988A
Other languages
Japanese (ja)
Inventor
Yoshinobu Shima
島 芳延
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
NKK Corp
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NKK Corp, Nippon Kokan Ltd filed Critical NKK Corp
Priority to JP32868988A priority Critical patent/JPH02172888A/en
Publication of JPH02172888A publication Critical patent/JPH02172888A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To eliminate the disturbance of single crystal growth by bubbles from the bottom of the crucible made of air bubble-contg. silica glass to be used in a CZ method by installing a bluebells silica glass plate which does not generate the bubbles near the m. p. of silicon to the bottom of the inside surface of the crucible. CONSTITUTION:The crucible 1 for pulling up the silicon single crystal by the Czochralski method is produced by a method for melting the powder silica in the rotating crucible, etc. The bubbleless silica glass plate 2 which has the diameter smaller than the bore of the crucible 1 and does not generate the bubbles at about the m. p. of the silicon is then installed by welding, etc., to the bottom of the inside surface of this crucible 1 in which the bubbles are unavoidably intruded. The hindrance of the growth of the single crystal by the infiltration of the bubbles generated from the silica glass to the solid-liquid boundary of the single crystal under pulling up is obviated in this way even if the crucible 1 is used over a long period of time.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、チョクラルスキー法によるシリコン単結晶引
き上げ用るつぼに関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a crucible for pulling a silicon single crystal using the Czochralski method.

[従来技術及び発明が解決しようとする課題]チョクラ
ルスキー法によるシリコン単結晶引き上げ方法は従来か
ら行われており、はぼ完成された技術となっている。
[Prior Art and Problems to be Solved by the Invention] A silicon single crystal pulling method using the Czochralski method has been practiced for a long time and has become a nearly perfected technology.

この技術は1周知のようにシリカガラス製のるつぼに溶
融した半導体原料を入れ、種結晶をこの溶融面に接触す
ると同時に回転させながら徐々に引き上げると、接触面
の凝固とともに結晶成長が行われ、円柱状の単結晶を得
ることができる。
In this technology, as is well known, a molten semiconductor raw material is placed in a silica glass crucible, a seed crystal is brought into contact with the molten surface, and at the same time rotated and pulled up gradually. As the contact surface solidifies, crystal growth occurs. A cylindrical single crystal can be obtained.

この単結晶引き上げに使用されるるつぼ材は−般に回転
するるつぼのなかで粉末のシリカを溶融して作成されて
いる。そのため不可避的にるつぼ内部に気泡が混入して
しまう。この気泡は溶融シリコン中で高温により膨張す
る。またシリカガラスは溶融したシリコン原料によりし
だいに侵食される。この結果、長時間るつぼを使用する
と、引き上げられているシリコン単結晶の固液界面にシ
リカガラスより発生した気泡が侵入し、単結晶の育成を
阻害するという問題が発生している。
The crucible material used for pulling this single crystal is generally made by melting powdered silica in a rotating crucible. Therefore, air bubbles inevitably get mixed into the crucible. The bubbles expand in the molten silicon due to the high temperature. Furthermore, silica glass is gradually eroded by the molten silicon raw material. As a result, when the crucible is used for a long time, air bubbles generated from silica glass enter the solid-liquid interface of the silicon single crystal being pulled, resulting in a problem that the growth of the single crystal is inhibited.

この問題を解決するための方法として特開昭59−21
3697号公報に開示された発明がある。この発明は、
るつぼの少なくとも半導体原料溶融面と接する側面を、
厚い透明シリカガラスで形成し気泡の発生を防止しよう
とするものである。しかし底部から発生する気泡にた対
して防止する能力が弱い点や、るつぼが大きくなるにつ
れて原料や加工に要するコストが非常に高くなるという
欠点がある。
As a method to solve this problem, JP-A-59-21
There is an invention disclosed in Publication No. 3697. This invention is
At least the side of the crucible in contact with the semiconductor raw material melting surface,
It is made of thick transparent silica glass to prevent the formation of bubbles. However, there are disadvantages in that the ability to prevent air bubbles from forming from the bottom is weak, and as the size of the crucible increases, the costs required for raw materials and processing become extremely high.

また直接気泡を防止する目的ではないが特開昭56−7
8496号公報に開示された発明にるつぼ内表面に石英
ガラス、石英の粉、石英ガラスの板または石英ガラスの
棒を融着するというものがある。
Although the purpose is not to directly prevent air bubbles, JP-A-56-7
In the invention disclosed in Japanese Patent No. 8496, quartz glass, quartz powder, quartz glass plates, or quartz glass rods are fused to the inner surface of a crucible.

しかしこの発明は、酸素濃度の均一化を目的としたもの
であり、気泡防止のための工夫は見られない。
However, this invention aims to equalize the oxygen concentration, and does not include any measures to prevent bubbles.

また、るつぼ表面に窒化珪素の膜をコーチングするとい
う発明が特開昭57−188498号公報である。この
方法でも明らかに気泡を防止できるが、シリコン中の酸
素濃度が低下してしまいIC用ウェハーとして適さない
ものができてしまう。
Furthermore, Japanese Patent Laid-Open No. 188498/1989 discloses an invention in which a silicon nitride film is coated on the surface of a crucible. Although this method obviously prevents bubbles, the oxygen concentration in the silicon decreases, resulting in a wafer unsuitable for IC use.

本発明は、かかる事情に鑑みてなされたもので、チョク
ラルスキー法による単結晶の製造法において、るつぼか
ら発生する気泡の悪影響を避け、特に製造コストを高く
することもなく、良好なシリコン単結晶を得る単結晶引
き上げ用るつぼを提供しようとするものである。
The present invention has been made in view of the above circumstances, and is a method for producing a single crystal using the Czochralski method, which avoids the adverse effects of air bubbles generated from the crucible, does not particularly increase the production cost, and produces a good silicon single crystal. The present invention aims to provide a crucible for pulling a single crystal to obtain a crystal.

[課題を解決するための手段] 本発明によるシリコン単結晶引き上げ用るつぼは、チョ
クラルスキー法で、シリコン単結晶の引き上げに使用す
る気泡人りシリカガラス製のるつぼにおいて、前記るつ
ぼ内面の底部に、直径がるつぼの内径以下で、シリコン
の融点付近において気泡の発生しない、気泡無レジリカ
ガラス板が設置されていることを特徴とする。
[Means for Solving the Problems] A crucible for pulling a silicon single crystal according to the present invention is a crucible made of bubble-filled silica glass used for pulling a silicon single crystal using the Czochralski method. , a bubble-free resin glass plate having a diameter equal to or less than the inner diameter of the crucible and which does not generate bubbles near the melting point of silicon is installed.

[作用] るつぼ内の対流はるつぼ壁にそって上昇する熱対流とシ
リコン単結晶の回転によって起きる強制対流に分けるこ
とができる。るつぼ側面で生成した気泡は、前記熱対流
によりすぐに融液表面に到達してしまい、単結晶の育成
を阻害することはない、それに対して前記強制対流によ
り、るつぼ中央部で下から上に上昇する流れが生じ、こ
れによってるつぼ底部のシリコン単結晶直下で生成した
気泡は、上昇してシリコン単結晶と融液の界面に到達し
、単結晶育成を阻害する。
[Operation] Convection within the crucible can be divided into thermal convection that rises along the crucible wall and forced convection that occurs due to the rotation of the silicon single crystal. Bubbles generated on the sides of the crucible quickly reach the melt surface due to the thermal convection and do not inhibit the growth of the single crystal.On the other hand, due to the forced convection, bubbles are generated at the center of the crucible from bottom to top. An upward flow is generated, and as a result, bubbles generated directly under the silicon single crystal at the bottom of the crucible rise and reach the interface between the silicon single crystal and the melt, inhibiting single crystal growth.

シリコンの融点付近において気泡の発生しない気泡無し
シリカガラス板でるつぼ底部を覆うことにより気泡によ
る単結晶育成の阻害を防止できる。また、この気泡無し
シリカガラス板のるつぼ底部への固定方法としては、予
めるつぼに融着しておく方法と、シリコン原料をるつぼ
へのチャージする前にるつぼ底部にこの気泡無しシリカ
ガラスを置いて、その後シリコン原料を溶かすための熱
により融着する方法がある。
By covering the bottom of the crucible with a bubble-free silica glass plate that does not generate bubbles near the melting point of silicon, inhibition of single crystal growth due to bubbles can be prevented. In addition, there are two methods for fixing this bubble-free silica glass plate to the bottom of the crucible: one is to fuse it to the crucible in advance, and the other is to place this bubble-free silica glass plate on the bottom of the crucible before charging the silicon raw material to the crucible. Then, there is a method of fusion using heat to melt the silicon raw material.

[実施例] 本発明の実施例を添付の図面を参照しながら説明する。[Example] Embodiments of the invention will be described with reference to the accompanying drawings.

第1図(a>、(b)は本発明の一つの実施例を模式的
に示した図であり、(a>はるつぼの縦断面図、(b)
は横断面図を示す1図において、1は気泡人りシリカガ
ラス製のるつぼ、2は気泡無しシリカガラス板である。
FIG. 1 (a>, (b) is a diagram schematically showing one embodiment of the present invention, (a> is a longitudinal cross-sectional view of a crucible, (b) is a longitudinal cross-sectional view of a crucible,
In FIG. 1 showing a cross-sectional view, 1 is a crucible made of silica glass with bubbles, and 2 is a silica glass plate without bubbles.

ここでは、るつぼ底部中央に底部の曲面に沿って気泡無
しシリカガラスを融着したものである。第2図(a)、
(b)は本発明の他の実施例を模式的に示した図であり
、(a)はるつぼの縦断面図、(b)は横断面図を示す
0図において、平板の気泡無しシリカガラス板2をその
周囲に溶着部3を設けて、そこで数点溶着することによ
りるつぼ1の底部中央に固定したものである。第3図(
a>、(b)は本発明他の実施例を模式的に示した図で
あり、(a)はるつぼの縦断面図、(b)は横断面図を
示す、ここではるつぼ底部中央にシリカガラス製の足4
を設置したものである。いずれの場合も気泡無しシリカ
ガラスの形状は円形でも角型でも構わないが、厚みはる
つぼの使用時間に応じズ溶解量を計算し決定する。また
気泡無しシリカガラスの大きさは引き上げ条件によって
対流の状況が変化するが、最大でるつぼの底部全面を覆
うだけで十分である。
Here, bubble-free silica glass is fused to the center of the bottom of the crucible along the curved surface of the bottom. Figure 2(a),
(b) is a diagram schematically showing another embodiment of the present invention, in which (a) is a vertical cross-sectional view of a crucible, and (b) is a cross-sectional view, a flat plate of bubble-free silica glass is shown. A welding part 3 is provided around the plate 2, and the plate 2 is fixed to the center of the bottom of the crucible 1 by welding at several points there. Figure 3 (
Figures a> and (b) are diagrams schematically showing other embodiments of the present invention, in which (a) is a longitudinal cross-sectional view of a crucible, and (b) is a cross-sectional view. glass feet 4
This is what was installed. In either case, the shape of the bubble-free silica glass may be circular or square, but the thickness is determined by calculating the amount of melted glass depending on the usage time of the crucible. The size of the bubble-free silica glass changes depending on the pulling conditions, but it is sufficient to cover the entire bottom of the crucible at most.

上記のようにるつぼに予め前記シリカ板を溶着させてお
くと、るつぼのセットまたは原料の装入の際、前記シリ
カガラス板がずれる虞はないが、こうした虞がない場合
は、溶着の手間を省いて、シリコン原料装入後に原料を
溶解するときの熱で溶着させてもよい。
If the silica plate is welded to the crucible in advance as described above, there is no risk of the silica glass plate shifting when setting the crucible or charging raw materials. Alternatively, the welding may be performed using the heat generated when melting the silicon raw material after charging the silicon raw material.

また、本発明の方法およびその装置は、るつぼに仕切り
リングを浸漬させて、るつぼ内を単結晶育成部と原料溶
解部に分け、原料装入と単結晶育成を長時間にわたって
連続的に行う連続操業に対して最も適したものである。
In addition, the method and apparatus of the present invention are continuous in which a partition ring is immersed in the crucible to divide the inside of the crucible into a single crystal growth section and a raw material melting section, and raw material charging and single crystal growth are performed continuously over a long period of time. It is the most suitable for the operation.

[発明の効果] 本発明によれば、気泡なしシリカガラス板をるつぼ底面
に設置しであるので、特に製造コストを上げることなく
、るつぼ底部からの気泡による単結晶育成の障害を排除
して、良好な単結晶を得ることができる。
[Effects of the Invention] According to the present invention, since a bubble-free silica glass plate is installed at the bottom of the crucible, it is possible to eliminate obstacles to single crystal growth due to air bubbles from the bottom of the crucible, without particularly increasing manufacturing costs. A good single crystal can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第3図は本発明の実施例のそれぞれ異なるる
つぼの縦面図および横断面図である。 1・・・るつぼ、2・・・気泡無しシリカガラス板、3
・・・融着部、4・・足。
1 to 3 are longitudinal and cross-sectional views of different crucibles according to embodiments of the present invention. 1... Crucible, 2... Bubble-free silica glass plate, 3
...Fused part, 4...legs.

Claims (4)

【特許請求の範囲】[Claims] (1)チョクラルスキー法で、シリコン単結晶の引き上
げに使用する気泡入りシリカガラス製のるつぼにおいて
、 前記るつぼ内面の底部に、直径がるつぼの内径以下で、
シリコンの融点付近において気泡の発生しない、気泡無
しシリカガラス板が設置されていることを特徴とするシ
リコン単結晶引き上げ用るつぼ。
(1) In a vitreous silica glass crucible used for pulling silicon single crystals in the Czochralski method, at the bottom of the inner surface of the crucible, a diameter of not more than the inner diameter of the crucible,
A crucible for pulling a silicon single crystal, characterized in that a bubble-free silica glass plate that does not generate bubbles near the melting point of silicon is installed.
(2)気泡無しシリカガラス板の設置は、前記シリカガ
ラス板の全面または一部がるつぼ底面に溶着により行わ
れてあることを特徴とする請求項1に記載のシリコン単
結晶引き上げ用るつぼ。
(2) The crucible for pulling a silicon single crystal according to claim 1, wherein the bubble-free silica glass plate is installed by welding the entire surface or a part of the silica glass plate to the bottom of the crucible.
(3)前記気泡無しシリカガラス板の下面は、るつぼ底
部の曲面と同じ曲面を有することを特徴とする請求項1
に記載のシリコン単結晶引き上げ用るつぼ。
(3) The lower surface of the bubble-free silica glass plate has the same curved surface as the curved surface of the bottom of the crucible.
A crucible for pulling silicon single crystals as described in .
(4)気泡無しシリカガラス板は、下部に補強用の足ま
たは梁を有することを特徴とする請求項1に記載ののシ
リコン単結晶引き上げ用るつぼ。
(4) The crucible for pulling a silicon single crystal according to claim 1, wherein the bubble-free silica glass plate has reinforcing legs or beams at the bottom.
JP32868988A 1988-12-26 1988-12-26 Crucible for pulling up silicon single crystal Pending JPH02172888A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP32868988A JPH02172888A (en) 1988-12-26 1988-12-26 Crucible for pulling up silicon single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP32868988A JPH02172888A (en) 1988-12-26 1988-12-26 Crucible for pulling up silicon single crystal

Publications (1)

Publication Number Publication Date
JPH02172888A true JPH02172888A (en) 1990-07-04

Family

ID=18213069

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32868988A Pending JPH02172888A (en) 1988-12-26 1988-12-26 Crucible for pulling up silicon single crystal

Country Status (1)

Country Link
JP (1) JPH02172888A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05117077A (en) * 1991-10-30 1993-05-14 Shin Etsu Handotai Co Ltd Apparatus for pulling up single crystal
JP2008195566A (en) * 2007-02-13 2008-08-28 Sumco Corp Method and apparatus for pulling up silicon single crystal
JP2016130200A (en) * 2015-01-14 2016-07-21 株式会社Sumco Manufacturing method of silicon single crystal

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05117077A (en) * 1991-10-30 1993-05-14 Shin Etsu Handotai Co Ltd Apparatus for pulling up single crystal
JP2008195566A (en) * 2007-02-13 2008-08-28 Sumco Corp Method and apparatus for pulling up silicon single crystal
JP2016130200A (en) * 2015-01-14 2016-07-21 株式会社Sumco Manufacturing method of silicon single crystal

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