JPH02167556A - Electrophotographic sensitive body - Google Patents

Electrophotographic sensitive body

Info

Publication number
JPH02167556A
JPH02167556A JP3592889A JP3592889A JPH02167556A JP H02167556 A JPH02167556 A JP H02167556A JP 3592889 A JP3592889 A JP 3592889A JP 3592889 A JP3592889 A JP 3592889A JP H02167556 A JPH02167556 A JP H02167556A
Authority
JP
Japan
Prior art keywords
layer
layer region
group
photosensitivity
range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3592889A
Other languages
Japanese (ja)
Inventor
Takao Kawamura
河村 孝夫
Naooki Miyamoto
宮本 直興
Hiroshi Ito
浩 伊藤
Hitoshi Takemura
仁志 竹村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to US07/399,780 priority Critical patent/US4997736A/en
Publication of JPH02167556A publication Critical patent/JPH02167556A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • G03G5/08214Silicon-based
    • G03G5/08235Silicon-based comprising three or four silicon-based layers
    • G03G5/08242Silicon-based comprising three or four silicon-based layers at least one with varying composition
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/043Photoconductive layers characterised by having two or more layers or characterised by their composite structure
    • G03G5/0436Photoconductive layers characterised by having two or more layers or characterised by their composite structure combining organic and inorganic layers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording members for original recording by exposure, e.g. to light, to heat, to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • G03G5/08214Silicon-based
    • G03G5/08235Silicon-based comprising three or four silicon-based layers

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  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Abstract

PURPOSE:To enhance photosensitivity and surface potential and to reduce residual potential by forming layer regions containing specified amounts of element of group IIIa and Va, respectively, in the inside of an a-SiC photoconductive layer. CONSTITUTION:The amorphous silicon carbide (a-SiC) photoconductive layer 2 has a layer structure formed by successively laminating a first layer region 2a containing an element of group IIIa of the periodic table in an amount of 0 - 10,000ppm, a second layer region 2b containing an element of group IIIa of the periodic table in an amount of 0 - 200ppm, and a third layer region containing an element of group Va of the periodic table in an amount of 1 - 300ppm, and each thickness of the layer regions 2a, 2b, 2c is set in the range of 0.01 - 3mum, thus permitting the obtained electrophotographic sensitive body to be enhanced in photosensitivity and surface potential and reduced in residual potential.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はアモルファスシリコンカーバイド光導電層と有
機光半導体層を積層して成る電子写真感光体に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an electrophotographic photoreceptor comprising a laminated layer of an amorphous silicon carbide photoconductive layer and an organic photoconductor layer.

〔従来技術及びその問題点〕[Prior art and its problems]

電子写真感光体の光導電材料には、Se、 5e−Te
AS2S a:++ZnO,Cd51アモルファスシリ
コンなどの無機材料と各種有機材料がある。そのなかで
最初に実用化されたものはSeであり、次いで、ZnO
,CdS、アモルファスシリコンも実用化された。他方
、有機材料ではPVK−TNPが最初に実用化され、そ
の後、電荷の発生並びに電荷の輸送という機能を別々の
材料に分担させるという機能分離型感光体が提案され、
この機能分離型感光体によって有機材料の開発が飛躍的
に発展している。
Photoconductive materials for electrophotographic photoreceptors include Se, 5e-Te,
AS2S a:++ There are inorganic materials such as ZnO and Cd51 amorphous silicon, and various organic materials. Among them, Se was the first to be put into practical use, followed by ZnO.
, CdS, and amorphous silicon have also been put into practical use. On the other hand, among organic materials, PVK-TNP was first put into practical use, and later, a functionally separated photoreceptor was proposed in which the functions of charge generation and charge transport are shared between separate materials.
This functionally separated photoreceptor has led to dramatic advances in the development of organic materials.

一方、無機光導電層の上に有機光半導体層を積層した電
子写真感光体も提案された。
On the other hand, an electrophotographic photoreceptor in which an organic photoconductive layer is laminated on an inorganic photoconductive layer has also been proposed.

例えばSe層と有機光半導体層の積層型感光体があり、
既に実用化されたが、この感光体においてはSe自体有
害であり、しかも、長波長側の感度に劣るという欠点も
あった。
For example, there is a laminated photoreceptor with a Se layer and an organic optical semiconductor layer.
Although it has already been put into practical use, this photoreceptor has the disadvantage that Se itself is harmful and the sensitivity is poor on the long wavelength side.

そこで、特開昭56−14241号にはアモルファスシ
リコンカーバイド光導電層と有機光半導体層から成る積
層型感光体が提案されており、この感光体によれば、上
記問題点を解消して無公害性並びに高光感度な特性が得
られた。
Therefore, Japanese Patent Application Laid-Open No. 56-14241 proposes a laminated photoconductor consisting of an amorphous silicon carbide photoconductive layer and an organic photoconductor layer, and this photoconductor solves the above problems and is non-polluting. Characteristics of high light sensitivity and light sensitivity were obtained.

しかしながら、本発明者等がこのような電子写真感光体
を製作し、その光感度、表面電位及び残留電位を測定し
たところ、いずれも未だ満足し得るような特性が得られ
ず、更に改善を要することが判明した。
However, when the present inventors manufactured such an electrophotographic photoreceptor and measured its photosensitivity, surface potential, and residual potential, satisfactory characteristics were still not obtained, and further improvements were needed. It has been found.

従って本発明は畝上に鑑みて完成されたものであり、そ
の目的は高い光感度及び表面電位が得られ、しかも、残
留電位を低減させた電子写真感光体を提供することにあ
る。
Therefore, the present invention was completed in view of the ridges, and its object is to provide an electrophotographic photoreceptor that can obtain high photosensitivity and surface potential, and furthermore, has a reduced residual potential.

〔問題点を解決するための手段〕[Means for solving problems]

本発明によれば、導電性基板上にアモルファスシリコン
カーバイド光導電層(以下、アモルファスシリコンカー
バイドをa−5iCと略す)と有機光半導体層が順次積
層された電子写真感光体において、前記a−3iC光導
電層が第1の層領域、第2の層領域及び第3の層領域が
順次形威された層構成であり、第1の層領域に周期律表
第IIIa族元素を1〜110000pp含有させ、第
2の層領域に周期律表第1[Ia族元素を0〜200p
pm含有させ、第3の層領域に周期律表第Va族元素を
1〜30(lppm含有させ、更に第1の層領域の厚み
を0.0■〜3μmの範囲内に、第2の層領域の厚みを
0.01〜3μmの範囲内に、第3の層領域の厚みをo
、oi〜3μmの範囲内に設定したことを特徴とする電
子写真感光体が提供される。
According to the present invention, in an electrophotographic photoreceptor in which an amorphous silicon carbide photoconductive layer (hereinafter amorphous silicon carbide is abbreviated as a-5iC) and an organic photoconductive layer are sequentially laminated on a conductive substrate, the a-3iC The photoconductive layer has a layer structure in which a first layer region, a second layer region, and a third layer region are formed in sequence, and the first layer region contains 1 to 110,000 pp of Group IIIa elements of the periodic table. 0 to 200 p of Group Ia elements of the periodic table in the second layer region.
pm, the third layer region contains 1 to 30 (lppm) of Group Va elements of the periodic table, and the thickness of the first layer region is within the range of 0.0 to 3 μm, and the second layer The thickness of the third layer region is within the range of 0.01 to 3 μm, and the thickness of the third layer region is o.
, oi to 3 μm is provided.

以下、本発明の詳細な説明する。The present invention will be explained in detail below.

第1図は本発明電子写真感光体の層構成を示しており、
同図によれば、導電性基板(1)の上にaSiC光導電
層(2)及び有機光半導体層(3)が順次積層されてい
る。そして、a−3iC光導電層(2)には電荷発生と
いう機能があり、他方の有機光半導体層(3)には電荷
輸送という機能がある。
FIG. 1 shows the layer structure of the electrophotographic photoreceptor of the present invention.
According to the figure, an aSiC photoconductive layer (2) and an organic photo-semiconductor layer (3) are sequentially laminated on a conductive substrate (1). The a-3iC photoconductive layer (2) has a function of charge generation, and the other organic photoconductive layer (3) has a function of charge transport.

本発明はa−3iC光導電層(2)の内部に第1の層領
域(2a)、第2の層領域(2b)及び第3の層領域(
2C)を順次形威し、第1の層領域(2a)に周期律表
第ma族元素(以下、IIIa族元素と略す)を所定の
範囲内で含有させ、しかも、第3の層領域(2c)に周
期律表第Va族元素(以下、Va族元素と略す)を所定
の範囲内で含有させ、そして、各々の層領域の厚みを所
定の範囲内に設定し、これにより、光感度、表面電位及
び残留電位を改善したことが特徴である。
The present invention provides a first layer region (2a), a second layer region (2b) and a third layer region (
2C) in order to make the first layer region (2a) contain an element of group Ma of the periodic table (hereinafter abbreviated as group IIIa element) within a predetermined range, and furthermore, the third layer region (2a) contains 2c) contains Group Va elements of the periodic table (hereinafter abbreviated as Group Va elements) within a predetermined range, and the thickness of each layer region is set within a predetermined range, thereby increasing photosensitivity. It is characterized by improved surface potential and residual potential.

また、このような層領域を形成したことにより正帯電用
電子写真感光体となることも特徴である。
Another feature is that by forming such a layer region, it becomes a positively charging electrophotographic photoreceptor.

先ず、a−5iC光導電層(2)はアモルファス化した
Si元素とC元素並びにこれらの元素のダングリングボ
ンド終端部に導入された水素(H)元素又はハロゲン元
素から成り、その組成式は下記の通りに設定するとよい
First, the a-5iC photoconductive layer (2) consists of an amorphous Si element and C element, as well as a hydrogen (H) element or a halogen element introduced at the end of a dangling bond between these elements, and its composition formula is as follows. It is recommended to set it as follows.

(5it−x Cに)+−yAy (但しAはH元素又はハロゲン元素) 0<x<0.5 好適には 0.01 < x  < 0.4最適には 
0.05 < x < 0.20.1  < V < 
0.5 好適には 0.2  <y  <0.5最適には 0.
25< y < 0.45X値がO<x<0.5の範囲
内であれば、高い光導電性が得られ、更に0.01 <
 x < 0.4の範囲内に設定した場合には短波長側
の光感度が高められ、しかも、光導電性が顕著に高くな
って光キャリアの励起機能が大きくなる。
(5it-x to C)+-yAy (A is H element or halogen element) 0<x<0.5 Preferably 0.01<x<0.4 Optimally
0.05 < x < 0.20.1 < V <
0.5 preferably 0.2 <y <0.5 optimally 0.
25 < y < 0.45 If the X value is within the range of O < x < 0.5, high photoconductivity is obtained;
When set within the range of x < 0.4, the photosensitivity on the short wavelength side is increased, and the photoconductivity is significantly increased, so that the excitation function of photocarriers is increased.

また、y値が0.1以下の場合には膜質が低下し、これ
によって光導電性が著しく低下し、更に0.2 < V
 < 0.5の範囲内に設定した場合には暗導電率が小
さくなり且つ光導電率が大きくなり、優れた光導電性が
得られ、また、基板との密着性にも優れる。
Furthermore, when the y value is less than 0.1, the film quality deteriorates, which significantly reduces the photoconductivity, and furthermore, 0.2 < V
When it is set within the range of <0.5, the dark conductivity is small and the photoconductivity is large, resulting in excellent photoconductivity and excellent adhesion to the substrate.

このa−3iC光導電層(2)には水素(H)元素やハ
ロゲン元素がダングリングボンド終端用に含有されてい
るが、これらの元素のなかでH元素が終端部に取り込ま
れ易く、これによってバンドギャップ中の局在単位密度
が低減化するという点で望ましい。
This a-3iC photoconductive layer (2) contains hydrogen (H) element and halogen element for dangling bond termination, but among these elements, H element is easily incorporated into the termination part, and this This is desirable in that the local unit density in the band gap is reduced by this.

また、a−5iC光導電層(2)の厚みは0.15〜5
μm、好適には0.2〜3μmの範囲内に設定すればよ
く、この範囲内であれば高い光感度が得られ、残留電位
が低くなる。
Moreover, the thickness of the a-5iC photoconductive layer (2) is 0.15 to 5
It may be set within the range of μm, preferably 0.2 to 3 μm, and within this range high photosensitivity can be obtained and the residual potential will be low.

次に第1の層領域(2a)については、l1la族元素
を1〜110000pp 、好適には300〜3000
ppm含有させ、これにより、P形半導体となし、a−
5iC光導電層(2)で発生した光キャリア、特に正電
荷を基板側へスムーズに流すことができ、また、基板側
のキャリアがa−5iC光導電層(2)へ流入するのを
阻止することができる。即ち、第1の層領域(2a)は
基板(1)に対して整流性を有するという点で非オーミ
ツク接触していると言える。
Next, for the first layer region (2a), the l1la group element is contained in an amount of 1 to 110,000 pp, preferably 300 to 3,000 pp.
ppm, thereby forming a P-type semiconductor, a-
Photocarriers generated in the 5iC photoconductive layer (2), especially positive charges, can flow smoothly to the substrate side, and carriers on the substrate side can be prevented from flowing into the a-5iC photoconductive layer (2). be able to. That is, the first layer region (2a) can be said to be in non-ohmic contact with the substrate (1) in that it has rectifying properties.

従って、この非オーミツク接触により表面電位が高くな
り、残留電位が低減する。
Therefore, this non-ohmic contact increases the surface potential and reduces the residual potential.

このような第1のN領域(2a)はma族元素の含有量
により表わされるが、その含有量が層厚方向に亘って不
均一になる場合にはその平均含有量で表示される。
Such a first N region (2a) is expressed by the content of the Ma group element, but when the content is non-uniform over the layer thickness direction, it is expressed by the average content.

かかるIIIa族元素がlppm以下では 基板側から
のキャリア注入を阻止し帯電能を向上させる効果がなく
 、110000ppを超える場合には、この層領域の
内部欠陥が増大して膜質が低下し、表面電位の低下並び
に残留電位の上昇をきたす。
If the Group IIIa element is less than 1 ppm, it has no effect of blocking carrier injection from the substrate side and improving charging ability, and if it exceeds 110,000 ppm, internal defects in this layer region increase, the film quality deteriorates, and the surface potential decreases. This causes a decrease in the residual potential and an increase in the residual potential.

また、第1の層領域(2a)はIIIa族元素含有量と
ともに、その厚みでもって更に具体的に設定する。
Further, the first layer region (2a) is set more specifically by its thickness as well as the IIIa group element content.

即ち、第1の層領域(2a)の厚みは0.01〜3μm
、好適には0.1〜0.5 μmの範囲内に設定すると
よく、この範囲内であれば残留電位を低減できるととも
に感光体の耐電圧を高めることができる。
That is, the thickness of the first layer region (2a) is 0.01 to 3 μm.
, preferably within the range of 0.1 to 0.5 μm, and within this range, the residual potential can be reduced and the withstand voltage of the photoreceptor can be increased.

更に、第1の層領域(2a)はIIIa族元素含有量及
び厚みとともに、そのSiC組戒組型比記の通りに設定
するのが望ましい。
Further, it is desirable that the first layer region (2a) is set according to the SiC group type ratio, as well as the Group IIIa element content and thickness.

即ち、組成式Sj、−,,CXで表わした場合、0.1
< x < 0.5の範囲内に設定するとよく、この範
囲内であれば、表面電位を高め、しかも、基板との密着
性を高めることができる。
That is, when expressed by the composition formula Sj, -,,CX, 0.1
It is preferable to set it within the range of < x < 0.5, and within this range, the surface potential can be increased and the adhesion to the substrate can be improved.

また、上記のようにC元素比率を設定するに当たって、
その比率を第2の層領域(2b)に比べて大きくすると
よく、これは表面電位を高め、基板との密着性を高める
ことができる点で有利である。
In addition, in setting the C element ratio as described above,
It is preferable to make the ratio larger than that of the second layer region (2b), which is advantageous in that the surface potential can be increased and the adhesion with the substrate can be improved.

上記nla族元素にはB+AI+Ga+In等があるが
、Bが共有結合性に優れて半導体特性を敏感に変え得る
点で、その上、優れた帯電能並びに光感度が得られると
いう点で望ましい。
The above-mentioned NLA group elements include B+AI+Ga+In, and B is preferable because it has excellent covalent bonding properties and can sensitively change semiconductor properties, and also provides excellent charging ability and photosensitivity.

第3の層領域(2c)については、Va族元素を1〜3
00ppm、好適には3〜1100pp含有させ、これ
により、a−5iC光導電層(2)内部の有機光半導体
層(3)側にn形半導体層を形威し、この層(2)で発
生した光キャリア、特に負電荷を有機光半導体層(3)
へスムーズに流すことができ、その結果、表面電位が高
くなり、残留電位が低下する。
For the third layer region (2c), 1 to 3 Va group elements are added.
00 ppm, preferably 3 to 1100 ppm, thereby forming an n-type semiconductor layer on the organic optical semiconductor layer (3) side inside the a-5iC photoconductive layer (2), and causing The photocarriers, especially the negative charges, are transferred to the organic photoconductor layer (3).
As a result, the surface potential increases and the residual potential decreases.

このように第3の層領域(2c)はVa族元素の含有量
により表わされるが、その含有量が層厚方向に亘って不
均一になる場合にはその平均含有量で表示される。
In this way, the third layer region (2c) is represented by the content of the Va group element, but if the content is non-uniform over the layer thickness direction, it is represented by the average content.

かかるVa族元素がlppm未満の場合には帯電能を向
上させることができず、300ppmを超える場合には
光励起キャリアの発生能力が劣り、光感度が低下する。
If the amount of the Va group element is less than 1 ppm, the charging ability cannot be improved, and if it exceeds 300 ppm, the ability to generate photoexcited carriers is poor and the photosensitivity is reduced.

また、第3の層領域(2c)はVa族元素含有量ととも
に、その厚みでもって更に具体的に設定する。
Further, the third layer region (2c) is set more specifically by its thickness as well as the Va group element content.

即ち、第3の層領域(2c)の厚めは0.01〜3μm
、好適には0.1〜0.5μmの範囲内に設定するとよ
く、この範囲内であれば高い光感度が得られ、残留電位
が低くなる。
That is, the thickness of the third layer region (2c) is 0.01 to 3 μm.
, is preferably set within the range of 0.1 to 0.5 μm, and within this range high photosensitivity can be obtained and the residual potential will be low.

上記Va族元素にはN、P、As+Sb、Bi等がある
が、Pが共有結合性に優れて半導体特性を敏感に変え得
る点で、その上、優れた帯電能並びに光感度が得られる
という点で望ましい。
The Va group elements mentioned above include N, P, As+Sb, Bi, etc., but P has excellent covalent bonding properties and can sensitively change semiconductor properties, and it is said that it can also provide excellent charging ability and photosensitivity. desirable in that respect.

第2の層領域(2b)はVa族元素を含有しないか或い
はl1la族元素を200ppm未満の範囲内で含有し
、これにより、i形半導体層となす。そして、aSiC
光導電層(2)の主たるキャリア発生層である。
The second layer region (2b) does not contain Va group elements or contains L1la group elements in a range of less than 200 ppm, thereby forming an i-type semiconductor layer. And aSiC
This is the main carrier generation layer of the photoconductive layer (2).

第2の層領域(2b)の厚みは0.01〜3μm、好適
には0.1〜2μmの範囲内に設定すればよく、この範
囲内であれば、高い光感度が得られ、残留電位が低くな
る。
The thickness of the second layer region (2b) may be set within the range of 0.01 to 3 μm, preferably 0.1 to 2 μm, and within this range, high photosensitivity can be obtained and the residual potential becomes lower.

上記の通り、a−3iC光導電層(2)にはp−1−n
接合が形成され、そのため、このN(2)で発生したキ
ャリアのうち電子は有機光半導体層(3)へ向かい、一
方、正孔は基板(1)へ向かう。従って、正帯電型の電
子写真感光体となる。
As mentioned above, the a-3iC photoconductive layer (2) has p-1-n
A junction is formed, so that among the carriers generated in this N(2), electrons go toward the organic optical semiconductor layer (3), while holes go toward the substrate (1). Therefore, it becomes a positively charged electrophotographic photoreceptor.

このような正帯電型電子写真感光体においては、有機光
半導体層(3)に電子吸引性化合物が選ばれ、この化合
物には例えば2.4.7−1−リニトロフルオレノンな
どがある。
In such a positively charged electrophotographic photoreceptor, an electron-withdrawing compound is selected for the organic optical semiconductor layer (3), and examples of this compound include 2,4,7-1-linitrofluorenone.

また、前記基板(1)には銅、黄銅、SUS 、 AI
等の金属導電体、或いはガラス、セラ旦ソクス等の絶縁
体の表面に導電体薄膜をコーティングしたものがあり、
就中、AIがコスト面並びにa−5iC層との密着性と
いう点で有利である。
Further, the substrate (1) is made of copper, brass, SUS, AI.
There are metal conductors such as, or insulators such as glass and ceramics coated with a thin conductive film.
Among these, AI is advantageous in terms of cost and adhesion to the a-5iC layer.

かくして本発明によれば、a−5iC光導電層にIII
a族元素及びVa族元素が所定の範囲内で含有した層領
域を形成したことにより、表面電位及び残留電位が改善
され、光感度が高められる。
Thus, according to the present invention, the a-5iC photoconductive layer contains III
By forming a layer region containing a group A element and a group Va element within a predetermined range, surface potential and residual potential are improved, and photosensitivity is increased.

また本発明によれば、第1の層領域(2a)、第2の層
領域(2b)並びに第3の層領域(2c)のそれぞれの
C元素含有量は層厚方向に亘って変化させてもよい。例
えば第6図〜第10図に示す例があり、これらの図にお
いて、横軸は層厚方向であり、aは第1の層領域(2a
)と基板の界面、bは第1の層領域(2a)と第2の層
領域(2b)の界面、Cは第2の層領域(2b)と第3
の層領域(2c)の界面、dは第3の層領域(2c)と
有機光半導体層(3)の界面を表わし、また、縦軸はC
元素含有量を表わす。
Further, according to the present invention, the C element content of each of the first layer region (2a), the second layer region (2b), and the third layer region (2c) is varied in the layer thickness direction. Good too. For example, there are examples shown in FIGS. 6 to 10, in which the horizontal axis is the layer thickness direction, and a is the first layer region (2a
) and the substrate, b is the interface between the first layer region (2a) and the second layer region (2b), and C is the interface between the second layer region (2b) and the third layer region (2b).
The interface between the layer region (2c) and d represents the interface between the third layer region (2c) and the organic optical semiconductor layer (3), and the vertical axis represents C.
Represents elemental content.

尚、第1の層領域(2a)、第2の層領域(2b)又は
第3の層領域(2c)の内部で層厚方向に亘ってC元素
含有量を変えた場合、そのC元素含有比率(X値)はそ
れぞれ層領域(2a) (2b) (2c)全体当たり
のC元素平均含有比率に対応する。
In addition, when the C element content is changed in the layer thickness direction inside the first layer region (2a), the second layer region (2b), or the third layer region (2c), the C element content The ratio (X value) corresponds to the average content ratio of C element in the entire layer regions (2a), (2b), and (2c), respectively.

更にまた、本発明の電子写真感光体においては、第1の
層領域(2a)と第3の層領域(2c)のそれぞれのI
IIa族元素含有量及びVa族元素含有量を層厚方向に
亘って変化させてもよい。その例を第11図〜第16図
に示す。特に第3の層領域(2c)のVa族元素を有機
光半導体層(3)へ向けて漸次増大するように含有させ
ると残留電位を低減させるという点で望ましい。
Furthermore, in the electrophotographic photoreceptor of the present invention, the I of each of the first layer region (2a) and the third layer region (2c) is
The IIa group element content and the Va group element content may be varied in the layer thickness direction. Examples are shown in FIGS. 11 to 16. In particular, it is desirable to include the Va group element in the third layer region (2c) so that it gradually increases toward the organic optical semiconductor layer (3) in terms of reducing the residual potential.

これらの図において、横軸は層厚方向であり、aは基板
(1)と第1の層領域(2a)の界面、bは第1の層領
域(2a)と第2の層領域(2b)の界面、Cは第2の
層領域(2b)と第3の層領域(2c)の界面、dは第
3の層領域(2c)と有機光半導体層(3)の界面を表
わし、また、縦軸はma族元素又はVa族元素のそれぞ
れの含有量を表わす。
In these figures, the horizontal axis is the layer thickness direction, a is the interface between the substrate (1) and the first layer region (2a), and b is the interface between the first layer region (2a) and the second layer region (2b). ), C represents the interface between the second layer region (2b) and the third layer region (2c), d represents the interface between the third layer region (2c) and the organic optical semiconductor layer (3), and , the vertical axis represents the respective content of Ma group elements or Va group elements.

このように第1の層領域(2a)又は第3の層領域(2
c)で層厚方向に亘ってそれぞれma族元素又はVa族
元素の含有量を変えた場合には、その元素含有量はそれ
ぞれの層領域(2a) (2c)全体当たりの平均含有
量に対応する。
In this way, the first layer region (2a) or the third layer region (2a)
When the content of each Ma group element or Va group element is changed in the layer thickness direction in c), the element content corresponds to the average content in each layer region (2a) (2c) as a whole. do.

次に本発明電子写真感光体の製法を述べる。Next, a method for manufacturing the electrophotographic photoreceptor of the present invention will be described.

a−5iC層を形成するにはグロー放電分解法、イオン
ブレーティング法、反応性スパッタリング法、真空華着
法、CVD法などの薄膜形成方法がある。
To form the a-5iC layer, there are thin film forming methods such as a glow discharge decomposition method, an ion blating method, a reactive sputtering method, a vacuum deposition method, and a CVD method.

グロー放電分解法を用いる場合、Si元素含有ガスとC
元素含有ガスを組合せ、この混合ガスをプラズマ分解し
て放膜形成する。このSt元素含有ガスニは5it14
,5izl16+ 5tl118. SiF4,5iC
I4.5illCI 3等々があり、また、C元素含有
ガスニはCI+4.、 C211,、czu21C3H
8等々があり、就中、C,ll□は高速成膜性が得られ
るという点で望ましい。
When using the glow discharge decomposition method, Si element-containing gas and C
Element-containing gases are combined and the mixed gas is plasma decomposed to form a film. This St element containing gas is 5it14
, 5izl16+ 5tl118. SiF4,5iC
I4.5illCI3, etc., and C element-containing gases are CI+4. , C211,,czu21C3H
Among them, C, ll□ is preferable because it allows high-speed film formation.

本実施例に用いられるグロー放電分解装置を第2図によ
り説明する。
The glow discharge decomposition device used in this example will be explained with reference to FIG.

図中、第1タンク(4)、第2タンク(5)、第3タン
ク(6)、第4タンク(7)、第5タンク(8)にはそ
れぞれ5iHt+ C2H2+ PH3+ 82116
 (PHiガス及びB2H6ガスはいずれも水素ガスで
希釈されている)及びH2が密封され、これらのガスは
各々対応する第1調整弁(9)、第2調整弁(10) 
、第3調整弁(11)第4調製弁(12)及び第5調整
弁(13)を開放することにより放出される。その放出
ガスの流量はそれぞれマスフローコントローラ(14)
 (15) (16) (17) (18)により制御
され、各々のガスは混合されて主管(19)へ送られる
。尚、(20) (21)は止め弁である。
In the figure, the first tank (4), second tank (5), third tank (6), fourth tank (7), and fifth tank (8) each contain 5iHt+ C2H2+ PH3+ 82116
(PHi gas and B2H6 gas are both diluted with hydrogen gas) and H2 are sealed, and these gases are supplied to the corresponding first regulating valve (9) and second regulating valve (10), respectively.
, the third regulating valve (11), the fourth regulating valve (12) and the fifth regulating valve (13) are opened. The flow rate of the released gas is controlled by a mass flow controller (14).
(15) (16) (17) (18), each gas is mixed and sent to the main pipe (19). Note that (20) and (21) are stop valves.

主管(19)を通じて流れるガスは反応管(22)へ流
人するが、この反応管(22)の内部には容量結合型放
電用電極(23)が設置され、また、筒状の成膜用基板
(24)が基板支持体(25)の上に戴置され、基板支
持体(25)がモータ(26)により回転駆動され、こ
れに伴って基板(24)が回転する。そして、電極(2
3)に電力50囚〜3 KW、周波数1〜50Ml1z
の高周波電力を印加し、しかも、基板(24)を適当な
加熱手段により約200〜400°C1好適には約20
0〜350°Cの温度に加熱する。また、反応管(22
)は回転ポンプ(27)と拡散ポンプ(28)に連結さ
れており、これによってグロー放電による成膜形成時に
所要な真空状態(放電時のガス圧0.01〜2.0To
rr)が維持される。
The gas flowing through the main pipe (19) flows into the reaction tube (22), and a capacitively coupled discharge electrode (23) is installed inside this reaction tube (22). A substrate (24) is placed on a substrate support (25), and the substrate support (25) is rotationally driven by a motor (26), thereby rotating the substrate (24). Then, the electrode (2
3) Power 50~3 KW, frequency 1~50Ml1z
high frequency power is applied, and the substrate (24) is heated to about 200 to 400° C., preferably about 20° C., by suitable heating means.
Heat to a temperature of 0-350°C. In addition, a reaction tube (22
) is connected to a rotary pump (27) and a diffusion pump (28), which maintains the vacuum state required during film formation by glow discharge (gas pressure during discharge of 0.01 to 2.0 To
rr) is maintained.

このような構成のグロー放電分解装置を用いて基板(2
4)の」二にa−3iC層を形成する場合、第1調整弁
(9)、第2調整弁(10)、第3調整弁(11)及び
第5調整弁(]3)を開いてS+114.Cdl□、P
II3.llzの各々のガスを放出し、その放出量をマ
スフローコントローラ(14) (15) (16) 
(18)により制御し、各々のガスは滑合されて主管(
19)を介して反応管(22)へ流入する。そして、反
応管内部の真空状態、基板温度、電極印加用高周波電力
をそれぞれ所定の条件に設定するとグロー放電が発生し
、ガスの分解に伴ってP元素含有のa−3iC膜が基板
上に高速に形成する。
The substrate (2
4) When forming the a-3iC layer on the second layer, open the first regulating valve (9), the second regulating valve (10), the third regulating valve (11) and the fifth regulating valve (]3). S+114. Cdl□,P
II3. Each gas of llz is released and the released amount is controlled by a mass flow controller (14) (15) (16)
(18), each gas is slipped into the main pipe (
19) into the reaction tube (22). Then, by setting the vacuum inside the reaction tube, the substrate temperature, and the high-frequency power applied to the electrodes to predetermined conditions, a glow discharge occurs, and as the gas decomposes, the a-3iC film containing P element is rapidly spread onto the substrate. to form.

上述した通りの薄膜形成方法によりa−3iC層を形成
すると、次に有機光半導体層を形成する。
After forming the a-3iC layer by the thin film forming method as described above, an organic optical semiconductor layer is then formed.

有機光半導体層は浸漬塗工方法又はコーティング法によ
り形成する。前者は感光利力9容媒中に分散された塗工
液の中に漫清し、次いで、一定な速度で引」二げ、そし
て、自然乾燥及び熱エージング(約150°C1約1時
間)を行うという方法であり、また、後者のコーティン
グ法によれば、コーター(空機)を用いて、溶媒に分散
された感光材を塗布し、次いで熱風乾燥を行う。
The organic optical semiconductor layer is formed by a dip coating method or a coating method. The former was sprayed into a coating solution dispersed in a photosensitive medium, then pulled at a constant speed, and then air-dried and heat aged (about 150°C for about 1 hour). According to the latter coating method, a photosensitive material dispersed in a solvent is applied using a coater (air machine), and then hot air drying is performed.

〔実施例〕〔Example〕

次に本発明の実施例を述べる。 Next, examples of the present invention will be described.

(例1) 第2図のグロー放電分解装置を用いて、S i If 
aガスを200secmの流量で、H2ガスを270s
ecmの流量で、そして、C2H2ガスの流量を変化さ
せ、また、ガス圧をQ、5Torr 、高周波電力を1
5OL基板温度を250℃に設定し、グロー放電によっ
てa−5iC膜(膜厚約1μm)を形成した。
(Example 1) Using the glow discharge decomposition device shown in Fig. 2, S i If
A gas at a flow rate of 200 seconds, H2 gas at a flow rate of 270 seconds
ecm, the flow rate of C2H2 gas was changed, the gas pressure was Q, 5 Torr, and the high frequency power was 1
The 5OL substrate temperature was set at 250° C., and an a-5iC film (film thickness of approximately 1 μm) was formed by glow discharge.

このようにしてa−3iCIt!のカーボン含有比率を
変え、そして、膜中のカーボン量をXMA法により測定
し、また、光導電率及び暗導電率を測定したところ、第
3図に示す通りの結果が得られた。
In this way a-3iCIt! When the carbon content ratio of the film was changed, the amount of carbon in the film was measured by the XMA method, and the photoconductivity and dark conductivity were also measured, the results shown in FIG. 3 were obtained.

第3図中、横軸はカーボン含有比率、即ちSi。In FIG. 3, the horizontal axis represents the carbon content ratio, that is, Si.

XCXのX値であり、縦軸は導電率を表わし、○印は発
光波長550nm (光量50μW/cm”)の光に対
する光導電率のプロットであり、・印は暗導電率のプロ
ットであり、また、a、bはそれぞれの特性曲線である
It is the X value of XCX, the vertical axis represents the conductivity, the circle mark is a plot of photoconductivity for light with an emission wavelength of 550 nm (light intensity 50 μW/cm"), and the mark is a plot of dark conductivity, Moreover, a and b are respective characteristic curves.

更に上記各a−3iC膜について、その水素含有量を赤
外吸収測定法により求めたところ、第4図に示す通りの
結果が得られた。
Furthermore, when the hydrogen content of each of the above a-3iC films was determined by infrared absorption measurement, the results shown in FIG. 4 were obtained.

第4図中、横軸は5h−XCつのX値であり、縦軸は水
素含有量、即ち(S++−x Cx 〕I−y  Hy
のX値であり、O印はSi原子に結合した水素量のプロ
ットであり、・印はC原子に結合した水素量のプロット
であり、また、c、dはそれぞれの特性曲線である。
In Figure 4, the horizontal axis is the 5h-XC X value, and the vertical axis is the hydrogen content, that is (S++-x Cx ]I-y Hy
The O mark is a plot of the amount of hydrogen bonded to the Si atom, the * mark is the plot of the amount of hydrogen bonded to the C atom, and c and d are the respective characteristic curves.

第4図より明らかな通り、本例のa−5iC膜はいずれ
もy (iが0.3〜0.4の範囲内にあることが判る
As is clear from FIG. 4, it can be seen that in all the a-5iC films of this example, y (i) is within the range of 0.3 to 0.4.

また、第3図より明らかな通り、カーボン含有比率Xが
0.2 < X < 0.5の範囲内であれば、高い光
導電性が得られるとともに光導電率と暗導電率の比率が
顕著に大きくなり、優れた光感度が得られることが判る
Furthermore, as is clear from Fig. 3, if the carbon content ratio X is within the range of 0.2 < It can be seen that excellent photosensitivity can be obtained.

(例2) 次に本例においては、SiH4ガスを200secmの
流量で、C2112ガスを20secmの流量で、11
□ガスを0〜101000scの流量で導入し、そして
、高周波電力を50〜300W、ガス圧を0.3〜1.
2Torrに設定し、グロー放電によりa−3iC膜(
膜厚約1μm )を形成した。
(Example 2) Next, in this example, SiH4 gas is fed at a flow rate of 200 seconds, C2112 gas is fed at a flow rate of 20 seconds, and 11
□ Gas is introduced at a flow rate of 0 to 101,000 sc, and the high frequency power is 50 to 300 W and the gas pressure is 0.3 to 1.
The a-3iC film (
A film thickness of about 1 μm) was formed.

かくして、カーボン含有比率×を0.3に設定し、しか
も、水素含有量yを変化させた種々のa−5iC膜を形
威し、各々の膜について光導電率及び暗導電率を測定し
たところ、第5図に示す通りの結果が得られた。
In this way, various a-5iC films were formed with the carbon content ratio x set to 0.3 and the hydrogen content y varied, and the photoconductivity and dark conductivity of each film were measured. , the results shown in FIG. 5 were obtained.

第5図中、横軸は水素含有量、即ちC3i+−XC−)
 I−y  flyのy値であり、縦軸は導電率を表わ
し、○印は発光波長550nm (光量50μW/cm
Jの光に対する光導電率のプロットであり、・印は暗導
電率のプロットであり、また、e、fはそれぞれの特性
曲線である。
In Figure 5, the horizontal axis is the hydrogen content (C3i+-XC-)
It is the y value of I-y fly, the vertical axis represents the conductivity, and the circle mark indicates the emission wavelength of 550 nm (light intensity of 50 μW/cm
It is a plot of the photoconductivity against light of J, the * mark is a plot of dark conductivity, and e and f are respective characteristic curves.

第5図より明らかな通り、y値が0.2を超えた場合、
高い光導電率並びに低い暗導電率が得られたことが判る
As is clear from Figure 5, when the y value exceeds 0.2,
It can be seen that high photoconductivity as well as low dark conductivity were obtained.

(例3) グロー放電分解装置の反応管内部にアルミニウム製基板
(25mm x 50mm)を設置し、第1表に示す成
膜条件により順次第1の層領域(2a)、第2の層領域
(2b)及び第3の層領域(2C)を形成する。
(Example 3) An aluminum substrate (25 mm x 50 mm) was installed inside the reaction tube of a glow discharge decomposition device, and the first layer region (2a) and the second layer region (2a) were sequentially coated according to the film forming conditions shown in Table 1. 2b) and a third layer region (2C) are formed.

次いで、2.4.7−ドリニトロフルオレノンを主成分
とする有機光半導体層(膜厚約15μm )を形威し、
正帯電型の電子写真感光体とした。
Next, an organic optical semiconductor layer (film thickness approximately 15 μm) containing 2.4.7-dolinitrofluorenone as a main component was formed,
This was a positively charged electrophotographic photoreceptor.

そして、第1の層領域及び第2の層領域のそれぞれのB
元素含有量を、第3の層領域のP元素含有量を二次イオ
ン質量分析計により測定したところ、それぞれ順次11
000pp 、40ppm 、40ppmであった。
and B of each of the first layer region and the second layer region.
When the P element content in the third layer region was measured using a secondary ion mass spectrometer, it was found that 11
000pp, 40ppm, and 40ppm.

また、第1の層領域の炭素含有量(y値)をXMA法に
より測定したところ、x=0.23であり、その水素含
有量(y値)を赤外吸収測定法により求めたところ、y
=0.35であった。同様に、第2の層領域のy値及び
y値を求めたところ、それぞれ0.3及び0.17とな
り、第3の層領域のy値及びy値はそれぞれ0.3及び
0.40であった。
In addition, when the carbon content (y value) of the first layer region was measured by the XMA method, x = 0.23, and the hydrogen content (y value) was determined by infrared absorption measurement method. y
=0.35. Similarly, the y value and y value of the second layer region were found to be 0.3 and 0.17, respectively, and the y value and y value of the third layer region were 0.3 and 0.40, respectively. there were.

かくして得られた電子写真感光体の特性評価を電子写真
特性測定装置により測定したところ、優れた光感度及び
表面電位が得られ、しかも、低い残留電位が得られた。
When the properties of the electrophotographic photoreceptor thus obtained were measured using an electrophotographic property measuring device, it was found that excellent photosensitivity and surface potential were obtained, as well as a low residual potential.

〔以下余白〕[Margin below]

(例4) また本発明者等は(例3)の電子写真感光体を製作する
に当たって、PH,lガス流量とBtl16ガス流量を
変化させ、これにより、第2表に示す通りに第1の層領
域のB元素含有量並びに第3の層領域のP元素含有量を
変えた14種類の電子写真感光体(感光体A −N )
を製作した。
(Example 4) In manufacturing the electrophotographic photoreceptor of (Example 3), the present inventors changed the PH, l gas flow rate and Btl16 gas flow rate, thereby achieving the first 14 types of electrophotographic photoreceptors with different B element content in the layer region and P element content in the third layer region (photoreceptors A - N)
was produced.

これらの電子写真感光体の光感度、表面電位並びに残留
電位を測定したところ、第2表に示す通りの結果が得ら
れた。
When the photosensitivity, surface potential and residual potential of these electrophotographic photoreceptors were measured, the results shown in Table 2 were obtained.

同表中、光感度は相対評価により◎印、○印及びΔ印の
三段階に区分し、◎印は最も優れた光感度が得られた場
合であり、○印は幾分優れた光感度が得られた場合であ
り、Δ印は他に比べてわずかに劣る光感度になった場合
である。
In the same table, photosensitivity is classified into three levels based on relative evaluation: ◎, ○, and Δ. ◎ indicates the best photosensitivity, and ○ indicates somewhat better photosensitivity. is obtained, and the mark Δ is a case where the photosensitivity is slightly inferior to the others.

表面電位の特性評価も◎印、○印及びΔ印の三段階に区
分し、◎印は最も高い表面電位が得られた場合であり、
○印は幾分高い表面電位が得られた場合であり、△印は
他に比べて高い表面電位が認められなかった場合である
Characteristic evaluation of surface potential is also divided into three stages: ◎ mark, ○ mark, and Δ mark. ◎ mark is the case where the highest surface potential is obtained;
The ○ mark indicates a case where a somewhat high surface potential was obtained, and the △ mark indicates a case where a higher surface potential was not observed compared to the others.

また、残留電位についても三段階に相対評価しており、
◎印は残留電位が最も小さくなった場合であり、○印は
残留電位の低下が幾分認められた場合であり、Δ印は他
に比べて残留電位の低減が認、められなかった場合であ
る。
In addition, the residual potential is also evaluated relative to three levels.
The ◎ mark indicates the case where the residual potential is the smallest, the ○ mark indicates the case where a slight decrease in the residual potential is observed, and the ∆ mark indicates the case where the residual potential is not reduced compared to the others. It is.

〔以下余白〕[Margin below]

第 表 *印の感光体は本発明の範囲外のもである。 No. table Photoreceptors marked with * are outside the scope of the present invention.

第2表より明らかな通り、感光体A−J及びNは優れた
光感度が得られ、しかも、表面電位が高く、残留電位の
低減が認められた。
As is clear from Table 2, photoreceptors A-J and N had excellent photosensitivity, high surface potential, and reduced residual potential.

然るに感光体門は光感度及び残留電位が劣り、また、感
光体K及び感光体りは光感度、表面電位並びに残留電位
のいずれの特性も改善されていないことが判る。
However, it can be seen that the photosensitivity and residual potential of the photoreceptor are inferior, and that the characteristics of the photosensitivity, surface potential, and residual potential of the photoreceptor K and the photoreceptor are not improved.

(例5) 本例においては、(例3)に電子写真感光体を製作する
に当たり、第2の層領域(2b)のma族元素含有量を
第3表に示す通りに変え、これにより、6種類の電子写
真感光体(感光体0〜T)を製作した。
(Example 5) In this example, when manufacturing the electrophotographic photoreceptor in (Example 3), the content of the Ma group element in the second layer region (2b) was changed as shown in Table 3, and thereby, Six types of electrophotographic photoreceptors (photoreceptors 0 to T) were manufactured.

〔以下余白〕[Margin below]

第 表 第3表より明らかな通り、感光体O−Sは優れた光感度
が得られ、しかも、表面電位が高く、残留電位の低減が
認められた。
As is clear from Table 3, the photoreceptor O-S had excellent photosensitivity, had a high surface potential, and was found to have a reduced residual potential.

(例6) 本発明者等は(例3)の電子写真感光体を製作するに当
たり、第3の層領域(2c)のVa族元素を底膜形成に
伴って600ゆ1200sccmに連続的かつ漸次増大
させた。
(Example 6) In manufacturing the electrophotographic photoreceptor of (Example 3), the present inventors continuously and gradually added the Va group element in the third layer region (2c) from 600 to 1200 sccm as the bottom film was formed. increased.

か(して得られた電子写真感光体の残留電位を測定した
ところ、約20χ低下した。
When the residual potential of the electrophotographic photoreceptor thus obtained was measured, it was found to have decreased by about 20x.

〔発明の効果〕〔Effect of the invention〕

以上の通り、本発明の電子写真感光体によれば、a−3
iC光導電層の内部にTIIa族元素とVa族元素を所
定の範囲内で含有された各層領域を形成したことにより
優れた光感度が得られ、表面電位を高め、しかも、残留
電位を低減させることができた。
As mentioned above, according to the electrophotographic photoreceptor of the present invention, a-3
By forming each layer region containing TIIa group elements and Va group elements within a predetermined range inside the iC photoconductive layer, excellent photosensitivity is obtained, the surface potential is increased, and the residual potential is reduced. I was able to do that.

また、この電子写真感光体によれば、a−5iC光導電
層が基板に対して非オーくツク接触であり、これにより
、整流機能が高められ、高い表面電位並びに低い残留電
位の正帯電用電子写真感光体が提供できた。
Further, according to this electrophotographic photoreceptor, the a-5iC photoconductive layer is in non-oak contact with the substrate, which improves the rectifying function and enables positive charging with high surface potential and low residual potential. We were able to provide an electrophotographic photoreceptor.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明電子写真感光体の層構成を表わす断面図
、第2図は実施例に用いられるグロー放電分解装置の概
略図、第3図はカーボン含有比率と導電率の関係を示す
線図、第4図はカーボン含有比率と水素含有量の関係を
示す線図、第5図は水素含有量と導電率の関係を示す線
図であり、また、第6図、第7図、第8図、第9図及び
第10図はアモルファスシリコンカーバイド光導電層の
層厚方向に亘るカーボン含有量を表わす線図である。そ
して、第11図、第12図、第13図、第14図、第1
5図及び第16図はアモルファスシリコンカーバイド光
導電層の層厚方向に亘るl1la族元素含有量及びVa
族元素含有量を表わす線図である。 1・・・導電性基板 2・・・アモルファスシリコンカーバイド光導電層 第1の層領域 第2の層領域 第3の層領域 有機光半導体層 2a・ 2b・ 2c・ 3 ・ 特許出願人 (663)京セラ株式会社代表者 安城飲
方 同   河村孝夫
FIG. 1 is a cross-sectional view showing the layer structure of the electrophotographic photoreceptor of the present invention, FIG. 2 is a schematic diagram of a glow discharge decomposition device used in Examples, and FIG. 3 is a line showing the relationship between carbon content ratio and electrical conductivity. 4 is a diagram showing the relationship between carbon content ratio and hydrogen content, FIG. 5 is a diagram showing the relationship between hydrogen content and electrical conductivity, and FIGS. 8, 9 and 10 are diagrams showing the carbon content in the thickness direction of the amorphous silicon carbide photoconductive layer. 11, 12, 13, 14, 1
5 and 16 show the l1la group element content and Va in the layer thickness direction of the amorphous silicon carbide photoconductive layer.
It is a diagram showing group element content. 1 Conductive substrate 2 Amorphous silicon carbide photoconductive layer First layer region Second layer region Third layer region Organic optical semiconductor layer 2a, 2b, 2c, 3 Patent applicant (663) Kyocera Corporation Representative Takao Kawamura, Anjo Nokata

Claims (2)

【特許請求の範囲】[Claims] (1)導電性基板上にアモルファスシリコンカーバイド
光導電層と有機光半導体層が順次積層された電子写真感
光体において、前記アモルファスシリコンカーバイド光
導電層が第1の層領域、第2の層領域及び第3の層領域
が順次形成された層構成であり、第1の層領域に周期律
表第IIIa族元素を1〜10,000ppm含有させ、
第2の層領域に周期律表第IIIa族元素を0〜200p
pm含有させ、第3の層領域に周期律表第Va族元素を
1〜300ppm含有させ、更に第1の層領域の厚みを
0.01〜3μmの範囲内、第2の層領域の厚みを0.
01〜3μmの範囲内に、第3の層領域の厚みを0.0
1〜3μmの範囲内に設定したことを特徴とする電子写
真感光体。
(1) In an electrophotographic photoreceptor in which an amorphous silicon carbide photoconductive layer and an organic photoconductive layer are sequentially laminated on a conductive substrate, the amorphous silicon carbide photoconductive layer is arranged in a first layer region, a second layer region and The third layer region has a layer structure formed in sequence, and the first layer region contains 1 to 10,000 ppm of Group IIIa elements of the periodic table,
0 to 200p of Group IIIa elements of the periodic table in the second layer region
pm, the third layer region contains 1 to 300 ppm of Group Va elements of the periodic table, and the thickness of the first layer region is within the range of 0.01 to 3 μm, and the thickness of the second layer region is within the range of 0.01 to 3 μm. 0.
The thickness of the third layer region is within the range of 0.01 to 3 μm.
An electrophotographic photoreceptor characterized in that the thickness is set within a range of 1 to 3 μm.
(2)第3の層領域に周期律表第Va族元素を有機光半
導体層へ向けて漸次増大するように含有させた請求項(
1)記載の電子写真感光体。
(2) A claim (
1) The electrophotographic photoreceptor described above.
JP3592889A 1988-08-31 1989-02-14 Electrophotographic sensitive body Pending JPH02167556A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US07/399,780 US4997736A (en) 1988-08-31 1989-08-25 Layered electrophotographic sensitive member comprising amorphous silicon carbide

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP63-217325 1988-08-31
JP21732588 1988-08-31

Publications (1)

Publication Number Publication Date
JPH02167556A true JPH02167556A (en) 1990-06-27

Family

ID=16702408

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3592889A Pending JPH02167556A (en) 1988-08-31 1989-02-14 Electrophotographic sensitive body

Country Status (1)

Country Link
JP (1) JPH02167556A (en)

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