JPH02150555U - - Google Patents

Info

Publication number
JPH02150555U
JPH02150555U JP5934489U JP5934489U JPH02150555U JP H02150555 U JPH02150555 U JP H02150555U JP 5934489 U JP5934489 U JP 5934489U JP 5934489 U JP5934489 U JP 5934489U JP H02150555 U JPH02150555 U JP H02150555U
Authority
JP
Japan
Prior art keywords
sample
irradiating
rays
utility
registration request
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5934489U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5934489U priority Critical patent/JPH02150555U/ja
Publication of JPH02150555U publication Critical patent/JPH02150555U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

図面は本考案の一実施例装置の要部側面図であ
る。 Ｇ……Ｘ線源、Ｃ……真空槽、Ｓ……試料、Ｍ
……Ｘ線分光器、Ｉ……赤外光源、１……試料台
、２……熱電対。 The drawing is a side view of a main part of an apparatus according to an embodiment of the present invention. G...X-ray source, C...vacuum chamber, S...sample, M
...X-ray spectrometer, I...Infrared light source, 1...Sample stage, 2...Thermocouple.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料にＸ線を照射する手段と、試料よりの２次
放射線を分析する手段と、試料に赤外線を照射す
る手段とを備えたことを特徴とする高温Ｘ線分析
装置。 A high-temperature X-ray analyzer characterized by comprising means for irradiating a sample with X-rays, means for analyzing secondary radiation from the sample, and means for irradiating the sample with infrared rays.
JP5934489U 1989-05-23 1989-05-23 Pending JPH02150555U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5934489U JPH02150555U (en) 1989-05-23 1989-05-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5934489U JPH02150555U (en) 1989-05-23 1989-05-23

Publications (1)

Publication Number Publication Date
JPH02150555U true JPH02150555U (en) 1990-12-26

Family

ID=31585759

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5934489U Pending JPH02150555U (en) 1989-05-23 1989-05-23

Country Status (1)

Country Link
JP (1) JPH02150555U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000258340A (en) * 1999-03-05 2000-09-22 Horiba Ltd Substance identification apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5913945A (en) * 1982-07-15 1984-01-24 Natl Inst For Res In Inorg Mater Analyzing device of material structure in ultrahigh temperature variable atmosphere
JPS641942A (en) * 1987-06-24 1989-01-06 Nec Corp Sample observing apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5913945A (en) * 1982-07-15 1984-01-24 Natl Inst For Res In Inorg Mater Analyzing device of material structure in ultrahigh temperature variable atmosphere
JPS641942A (en) * 1987-06-24 1989-01-06 Nec Corp Sample observing apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000258340A (en) * 1999-03-05 2000-09-22 Horiba Ltd Substance identification apparatus

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