JPH0269751U - - Google Patents
Info
- Publication number
- JPH0269751U JPH0269751U JP14883988U JP14883988U JPH0269751U JP H0269751 U JPH0269751 U JP H0269751U JP 14883988 U JP14883988 U JP 14883988U JP 14883988 U JP14883988 U JP 14883988U JP H0269751 U JPH0269751 U JP H0269751U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- rotary table
- rays
- ray
- primary
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims description 2
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
Description
第１図は本考案の実施例を示す正面断面図、第
２図は上面図である。
１……Ｘ線管球、２……試料室、３……試料、
４……半導体検出器、５……回転テーブル、６…
…補助テーブル、７……回転テーブル用モータ、
８……試料室ふた、１０……一次Ｘ線、１１……
蛍光Ｘ線。
FIG. 1 is a front sectional view showing an embodiment of the present invention, and FIG. 2 is a top view. 1...X-ray tube, 2...sample chamber, 3...sample,
4...Semiconductor detector, 5...Rotary table, 6...
...Auxiliary table, 7...Rotary table motor,
8...Sample chamber lid, 10...Primary X-ray, 11...
Fluorescent X-ray.
Claims (1)
と、試料より発せられた蛍光Ｘ線を検出するため
の半導体検出器と、前記試料を自動交換するため
の回転テーブルと、前記回転テーブルを収める試
料室よりなる蛍光Ｘ線分析装置において、 被測定試料の位置、あるいは一次Ｘ線の照射位
置が試料室の中心になるように配置されたことを
特徴とするエネルギー分散型蛍光Ｘ線分析装置。 (2) 前記回転テーブルの上部にはいかなる突起
物もないことを特徴とする実用新案登録請求の範
囲第１項記載のエネルギー分散型蛍光Ｘ線分析装
置。[Claims for Utility Model Registration] (1) An X-ray tube for irradiating a sample with primary X-rays, a semiconductor detector for detecting fluorescent X-rays emitted from the sample, and automatic exchange of said sample. In a fluorescent X-ray analyzer consisting of a rotary table for the purpose of analysing, and a sample chamber housing the rotary table, the position of the sample to be measured or the irradiation position of the primary X-rays is located at the center of the sample chamber. Features of energy dispersive X-ray fluorescence analyzer. (2) The energy dispersive X-ray fluorescence spectrometer according to claim 1, wherein there is no protrusion on the top of the rotary table.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14883988U JPH0738843Y2 (en) | 1988-11-15 | 1988-11-15 | Energy dispersive X-ray fluorescence analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14883988U JPH0738843Y2 (en) | 1988-11-15 | 1988-11-15 | Energy dispersive X-ray fluorescence analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0269751U true JPH0269751U (en) | 1990-05-28 |
| JPH0738843Y2 JPH0738843Y2 (en) | 1995-09-06 |
Family
ID=31420524
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14883988U Expired - Lifetime JPH0738843Y2 (en) | 1988-11-15 | 1988-11-15 | Energy dispersive X-ray fluorescence analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0738843Y2 (en) |
-
1988
- 1988-11-15 JP JP14883988U patent/JPH0738843Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0738843Y2 (en) | 1995-09-06 |
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