JPH02145817U - - Google Patents
Info
- Publication number
- JPH02145817U JPH02145817U JP5629989U JP5629989U JPH02145817U JP H02145817 U JPH02145817 U JP H02145817U JP 5629989 U JP5629989 U JP 5629989U JP 5629989 U JP5629989 U JP 5629989U JP H02145817 U JPH02145817 U JP H02145817U
- Authority
- JP
- Japan
- Prior art keywords
- address
- delay
- memories
- accessed
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000015654 memory Effects 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Tests Of Electronic Circuits (AREA)
- Pulse Circuits (AREA)
Description
第1図はこの考案の一実施例を示すブロツク図
、第2図及び第3図はこの考案の動作を説明する
ための波形図、第4図は従来の技術を説明するた
めのブロツク図、第5図及び第6図は従来の技術
の動作を説明するための波形図である。
1……アドレスカウンタ、2A,2B……メモ
リ、3……アンドゲート、4……固定遅延素子。
FIG. 1 is a block diagram showing an embodiment of this invention, FIGS. 2 and 3 are waveform diagrams for explaining the operation of this invention, and FIG. 4 is a block diagram for explaining the conventional technology. FIGS. 5 and 6 are waveform diagrams for explaining the operation of the conventional technology. 1... Address counter, 2A, 2B... Memory, 3... AND gate, 4... Fixed delay element.
Claims (1)
数出力をアドレス信号として出力するアドレスカ
ウンタと、 このアドレスカウンタから出力されるアドレス
信号によつて先頭アドレスから順次アクセスされ
希望する遅延時間が経過した時点でアクセスされ
るアドレスに遅延パルス発生指令が書込まれたメ
モリとによつて構成された遅延発生回路において
、 B 上記メモリを複数設け、この複数のメモリを
上記アドレスカウンタから出力されるアドレス信
号の上位側と下位側のビツトのアドレス信号によ
つてアクセスし、複数のメモリから読出出力が得
られた時点で遅延パルスを発生させるように構成
した遅延発生回路。[Claims for Utility Model Registration] A. An address counter that counts clock pulses of a fixed period and outputs the counted output as an address signal, and a desired address that is sequentially accessed from the first address by the address signal output from this address counter. In a delay generation circuit constituted by a memory in which a delay pulse generation command is written at an address that is accessed when the delay time has elapsed, B. A plurality of the above memories are provided, and the plurality of memories are connected from the above address counter. A delay generation circuit that is accessed by the upper and lower bit address signals of the output address signal and is configured to generate a delay pulse when read outputs are obtained from a plurality of memories.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5629989U JPH02145817U (en) | 1989-05-15 | 1989-05-15 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5629989U JPH02145817U (en) | 1989-05-15 | 1989-05-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02145817U true JPH02145817U (en) | 1990-12-11 |
Family
ID=31579997
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5629989U Pending JPH02145817U (en) | 1989-05-15 | 1989-05-15 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02145817U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0572285A (en) * | 1991-09-13 | 1993-03-23 | Hitachi Electron Eng Co Ltd | Data output timing synchronization system within ic tester |
JP2002071767A (en) * | 2000-08-31 | 2002-03-12 | Advantest Corp | Timing generator and semiconductor testing device |
-
1989
- 1989-05-15 JP JP5629989U patent/JPH02145817U/ja active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0572285A (en) * | 1991-09-13 | 1993-03-23 | Hitachi Electron Eng Co Ltd | Data output timing synchronization system within ic tester |
JP2002071767A (en) * | 2000-08-31 | 2002-03-12 | Advantest Corp | Timing generator and semiconductor testing device |
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