JPH02128963U - - Google Patents
Info
- Publication number
- JPH02128963U JPH02128963U JP3681989U JP3681989U JPH02128963U JP H02128963 U JPH02128963 U JP H02128963U JP 3681989 U JP3681989 U JP 3681989U JP 3681989 U JP3681989 U JP 3681989U JP H02128963 U JPH02128963 U JP H02128963U
- Authority
- JP
- Japan
- Prior art keywords
- conductive contact
- contact pins
- contacts
- pin
- pin body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図はこの考案の一実施例における一方の導
電接触ピンを示す縦断側面図、第２図はその平面
図、第３図は測定例を示す説明図である。
図面において、１は導電接触ピン、２，３は接
触ピン本体、４，５はヘツド、６，７は傾斜面、
８は絶縁材、９はスリーブ、１２，１３はスペー
サ、１８，１９はコイルスプリングである。
FIG. 1 is a longitudinal sectional side view showing one conductive contact pin in an embodiment of the invention, FIG. 2 is a plan view thereof, and FIG. 3 is an explanatory diagram showing a measurement example. In the drawing, 1 is a conductive contact pin, 2 and 3 are contact pin bodies, 4 and 5 are heads, 6 and 7 are inclined surfaces,
8 is an insulating material, 9 is a sleeve, 12 and 13 are spacers, and 18 and 19 are coil springs.
Claims (1)
２本の前記導電接触ピンを電流端子とし、残りの
２本の前記導電接触ピン間に現れる電位差によつ
て前記試料の抵抗値を測定する４端子測定に用い
られる導電接触ピンにおいて、前記各導電接触ピ
ンはピン本体と、このピン本体の先端に取付けら
れた尖端を有する接触子とで構成され、電流用と
電位差用の２本の前記接触子が互いに接触しない
ように並列的にかつ摺動自在に保持する保持部材
を有し、前記接触子と前記保持部材間の前記ピン
本体には前記接触子と上方に弾性的に押圧するス
プリング部材が介在されていることを特徴とする
４端子測定用導電接触ピン。 Four conductive contact pins are brought into contact with the sample, two specific conductive contact pins are used as current terminals, and the resistance value of the sample is measured based on the potential difference that appears between the remaining two conductive contact pins. In a conductive contact pin used for four-terminal measurement, each of the conductive contact pins is composed of a pin body and a contact having a tip attached to the tip of the pin body, and two of the conductive contact pins are used for current and potential difference. It has a holding member that holds the contacts in a parallel and slidable manner so that they do not come into contact with each other, and a spring that elastically presses the contacts upward is provided in the pin body between the contacts and the holding member. A conductive contact pin for four-terminal measurement, characterized in that a member is interposed therebetween.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3681989U JPH02128963U (en) | 1989-03-30 | 1989-03-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3681989U JPH02128963U (en) | 1989-03-30 | 1989-03-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02128963U true JPH02128963U (en) | 1990-10-24 |
Family
ID=31543386
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3681989U Pending JPH02128963U (en) | 1989-03-30 | 1989-03-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02128963U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010008132A (en) * | 2008-06-25 | 2010-01-14 | Kiyota Seisakusho:Kk | Two-probe kelvin probe |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS603474B2 (en) * | 1976-04-12 | 1985-01-28 | モンサント・カンパニ− | Cell culture method and reactor |
-
1989
- 1989-03-30 JP JP3681989U patent/JPH02128963U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS603474B2 (en) * | 1976-04-12 | 1985-01-28 | モンサント・カンパニ− | Cell culture method and reactor |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010008132A (en) * | 2008-06-25 | 2010-01-14 | Kiyota Seisakusho:Kk | Two-probe kelvin probe |
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