JPS62104163U - - Google Patents
Info
- Publication number
- JPS62104163U JPS62104163U JP19611685U JP19611685U JPS62104163U JP S62104163 U JPS62104163 U JP S62104163U JP 19611685 U JP19611685 U JP 19611685U JP 19611685 U JP19611685 U JP 19611685U JP S62104163 U JPS62104163 U JP S62104163U
- Authority
- JP
- Japan
- Prior art keywords
- plungers
- chip component
- plunger
- terminal
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 5
- 239000000523 sample Substances 0.000 claims description 5
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は本考案に係るチツプ部品検査用プロー
ブの横断面図、第２図はそのチツプ部品端子への
接触状態を示す側面図、第３図は従来のチツプ部
品検査用プローブの側面図である。
１……チツプ部品検査用プローブ、７，９……
プランジヤ、１０……スリーブ、１２……スプリ
ング、１３，１５……チツプ部品端子。
Fig. 1 is a cross-sectional view of the chip component inspection probe according to the present invention, Fig. 2 is a side view showing the state of contact with the chip component terminal, and Fig. 3 is a side view of a conventional chip component inspection probe. be. 1... Probe for chip component inspection, 7, 9...
Plunger, 10...sleeve, 12...spring, 13, 15...chip component terminal.
Claims (1)
て、該端子からの信号を取出すようにしたチツプ
部品検査用プローブにおいて、 前記プランジヤを複数個設け、これらプランジ
ヤの少なくとも互に接触する面を絶縁し、それぞ
れ各プランジヤから電気信号を取出し得るように
構成し、更にこれらプランジヤをスリーブに摺動
自在かつ回転不能に嵌合すると共にスプリングに
て各プランジヤが所定位置になるように付勢して
なるチツプ部品検査用プローブ。[Claims for Utility Model Registration] A chip component inspection probe in which a tip of a plunger is brought into contact with a terminal of a chip component to extract a signal from the terminal, wherein a plurality of the plungers are provided, and at least one of these plungers is mutually connected. The surfaces that come into contact with the plungers are insulated, and the plungers are constructed so that electrical signals can be extracted from each plunger, and the plungers are fitted into the sleeve in a slidable but non-rotatable manner, and each plunger is held in a predetermined position by a spring. A probe for chip component inspection that is energized by
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19611685U JPS62104163U (en) | 1985-12-20 | 1985-12-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19611685U JPS62104163U (en) | 1985-12-20 | 1985-12-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62104163U true JPS62104163U (en) | 1987-07-02 |
Family
ID=31154637
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19611685U Pending JPS62104163U (en) | 1985-12-20 | 1985-12-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62104163U (en) |
-
1985
- 1985-12-20 JP JP19611685U patent/JPS62104163U/ja active Pending