JPH02120039U

JPH02120039U -

Info

Publication number: JPH02120039U
Application number: JP2953089U
Authority: JP
Priority date: 1989-03-15
Filing date: 1989-03-15
Publication date: 1990-09-27

Description

[Brief explanation of drawings]

第１図は本考案の一実施例に係わる光スペクト
ラムアナライザの概略構成を示す模式図、第２図
は同実施例の要部を取出して示すブロツク図、第
３図は同実施例の動作原理を説明するための図、
第４図は従来の全光強度測定機能を有した光スペ
クトラムアナライザの概略構成を示す模式図であ
る。２……分光器、３……入射スリツト、５……回
折格子、５ａ……刻線、５ｄ……モータ、７……
…出射スリツト、９……受光器、１１……データ
処理部、１２……表示器、１３……プリンタ、１
５……ＣＰＵ、１５ａ……０次光強度測定制御手
段、１５ｂ……全光強度算出手段、１９ａ……回
動角メモリ、１９ｂ……補正情報メモリ、２４…
…回折格子制御回路、ａ……被測定光、ｂ_０……
０次回折光、ｂ_１……１次回折光、Ｉ_０……全光
強度、Ｉ（λ）……光強度、λ……波長。 Fig. 1 is a schematic diagram showing the general configuration of an optical spectrum analyzer according to an embodiment of the present invention, Fig. 2 is a block diagram showing the main parts of the embodiment, and Fig. 3 is the operating principle of the embodiment. Diagram to explain,
FIG. 4 is a schematic diagram showing the general configuration of a conventional optical spectrum analyzer having a total light intensity measurement function. 2...Spectroscope, 3...Incidence slit, 5...Diffraction grating, 5a...Screen line, 5d...Motor, 7...
...Output slit, 9...Receiver, 11...Data processing section, 12...Display device, 13...Printer, 1
5...CPU, 15a...0th order light intensity measurement control means, 15b...Total light intensity calculation means, 19a...Rotation angle memory, 19b...Correction information memory, 24...
...diffraction grating control circuit, a... light to be measured, b ₀ ...
0th-order diffracted light, b ₁ ... 1st-order diffracted light, I ₀ ... total light intensity, I (λ) ... light intensity, λ ... wavelength.

Claims

[Claims for Utility Model Registration] The light to be measured that has entered through the entrance slit 3 is made to enter the diffraction grating 5 which is rotated around an axis parallel to the scored lines by a rotation mechanism 5d, In the optical spectrum analyzer, the light diffracted by the diffraction grating is received by the spectroscope 9 through the output slit 7, and the light intensity at each wavelength corresponding to each rotation angle of the measured light is determined. a rotation angle memory that stores a rotation angle of the 0th-order diffracted light indicating a rotation angle of the diffraction grating when light is incident on the diffraction grating and the 0th-order diffracted light of the measured light is emitted to the output slit; 19a, and a correction information memory 19b that stores correction information for the total light intensity of the 0th-order diffracted light in the measured light.
and 0th-order light intensity measurement control means 15a for measuring the light intensity of each wavelength at each rotation angle and measuring the 0th-order light intensity at the rotation angle of the 0th-order diffracted light;
An optical spectrum analyzer comprising a total light intensity calculation means 15b for calculating the total light intensity of the light to be measured from the zero-order light intensity measured by the zero-order light intensity measurement control means using the correction information.