JPH02114679A - Field effect josephson transistor - Google Patents

Field effect josephson transistor

Info

Publication number
JPH02114679A
JPH02114679A JP63268518A JP26851888A JPH02114679A JP H02114679 A JPH02114679 A JP H02114679A JP 63268518 A JP63268518 A JP 63268518A JP 26851888 A JP26851888 A JP 26851888A JP H02114679 A JPH02114679 A JP H02114679A
Authority
JP
Japan
Prior art keywords
electrode
josephson
field effect
transistor
tunnel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63268518A
Other languages
Japanese (ja)
Inventor
Seiichi Iwamatsu
誠一 岩松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP63268518A priority Critical patent/JPH02114679A/en
Priority to FR898913548A priority patent/FR2638569B1/en
Priority to US07/423,969 priority patent/US5071832A/en
Publication of JPH02114679A publication Critical patent/JPH02114679A/en
Pending legal-status Critical Current

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  • Superconductor Devices And Manufacturing Methods Thereof (AREA)

Abstract

PURPOSE:To obtain a field effect Josephson transistor adapted for mass production by a method wherein a substrate electrode is provided in series with a tunnel film provided to the side wall inside the gap between a source and a drain electrode, and a gate electrode which controls a tunnel current with an electric field is formed through the intermediary of a dielectric film. CONSTITUTION:A field effect Josephson transistor is composed of an SiO2 2 formed on the surface of an Si 1, a gate electrode 5 formed through the etching of the rear of the Si 1, a source electrode 3 and a drain electrode 4 provided separate from each other by a slightly wide gap onto the SiO2 2 on the gate electrode 5, a field insulating film 7 thickly provided on the surface of the source electrode 3 and the drain electrode 4, a tunnel film 6 formed on the side wall as thick as tens of Angstrom , and a substrate electrode 3 formed so as to fill the slightly wide gap. Therefore, two Josephson effect transistors are so constituted as to be connected with each other in series, and when a gate electrode is separately provided to each of the transistors, the transistors can function as a two gate field effect Josephson transistor, so that a field effect Josephson transistor structure adapted for the mass production can be offered.

Description

【発明の詳細な説明】 [産業上の利用分野1 本発明は電界効果型ジョセフソン・トランジスタの構造
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application 1] The present invention relates to the structure of a field-effect Josephson transistor.

[従来の技術1 従来、電界効果型ジョセフソン・トランジスタとしては
、第2図に断面図を示す如きものがあった。すなわち、
5illの基板上に5iOi12を形成し、該SiO+
12を誘電体膜として5i11の裏面に穴開けした部分
にゲート電極15をNb等で形成し、該ゲート電極15
上に数10人のトンネルギャップ16を形成する様にソ
ース電極13及びドレイン電[i14をNb等で形成し
て成る。
[Prior Art 1] Conventionally, there has been a field effect type Josephson transistor as shown in a cross-sectional view in FIG. That is,
5iOi12 is formed on a 5ill substrate, and the SiO+
Using 12 as a dielectric film, a gate electrode 15 is formed using Nb or the like in a hole made on the back surface of 5i11.
The source electrode 13 and the drain electrode [i14] are formed of Nb or the like so as to form a tunnel gap 16 of several tens of people above.

[発明が解決しようとする課題1 しかし、上記従来技術によると、数10人のトンネル・
ギャップをホト・リソグラフィーとエツチング技術を用
いて形成するのは極めて困難であると云う課題がある。
[Problem to be solved by the invention 1 However, according to the above-mentioned conventional technology, several tens of people
The problem is that it is extremely difficult to form the gap using photolithography and etching techniques.

本発明は、かかる従来技術の課題を解決し、量産性ある
電界効果型ジョセフ・トランジスタの構造を提供する事
を目的とする。
It is an object of the present invention to solve the problems of the prior art and to provide a field-effect Joseph transistor structure that can be mass-produced.

〔課題を解決するための手段1 上記課題を解決するために1本発明は電界効果型ジョセ
フソン・トランジスタに関し、ソース電極とドレイン電
極とを、ギャップを有して設け、前記ソース電極とドレ
イン電極のギャップ内側壁にトンネル膜を設け、該トン
ネル膜と直列に基板電極を設けると共に、前記トンネル
膜に流れるトンネル電流を電界制御するゲート電極を誘
電体膜を介して形成する手段をとる。
[Means for Solving the Problems 1] In order to solve the above problems, the present invention relates to a field-effect Josephson transistor, in which a source electrode and a drain electrode are provided with a gap, and the source electrode and the drain electrode are separated from each other. A tunnel film is provided on the inner wall of the gap, a substrate electrode is provided in series with the tunnel film, and a gate electrode for controlling the electric field of the tunnel current flowing through the tunnel film is formed via a dielectric film.

[実 施 例] 以下、実施例により本発明を詳述する。[Example] Hereinafter, the present invention will be explained in detail with reference to Examples.

第1図は本発明の一実施例を示す電界効果型ジョセフソ
ン・トランジスタの断面図である。すなわち、Silの
表面に5iOz2を形成し、前記Silの裏面をエツチ
ングしてゲート電極5を形成し、該ゲート電極5上の5
iO22上にソース電極3とドレイン電極4をやや広い
ギャップを有して設け、前記ソース電極3とドレイン電
極4の表面にはフィールド絶縁膜7を厚く設け、且つ(
HI3壁にはトンネル膜6を数10人厚さで形成すると
共に、H記やや広いギャップを埋めるが如く、基板電極
8を形成して成る。
FIG. 1 is a sectional view of a field effect type Josephson transistor showing one embodiment of the present invention. That is, 5iOz2 is formed on the surface of the Sil, the back surface of the Sil is etched to form the gate electrode 5, and the 5iOz2 on the gate electrode 5 is etched.
A source electrode 3 and a drain electrode 4 are provided on iO22 with a slightly wide gap, a field insulating film 7 is provided thickly on the surfaces of the source electrode 3 and drain electrode 4, and (
A tunnel film 6 with a thickness of several tens of layers is formed on the wall of the HI 3, and a substrate electrode 8 is formed so as to fill a slightly wide gap in the HI 3.

尚、電極類の材質としては、NbやY+ BagCus
 O,の如き超電導体があり、トンネル膜としてはNb
OやSiO□等の誘電体膜がある。
In addition, the material of the electrodes is Nb or Y+ BagCus.
There are superconductors such as O, and Nb as a tunnel film.
There are dielectric films such as O and SiO□.

更に、基板はSilである必要はなく、ガラス等の絶縁
体であっても良く、この場合にはゲート電極は、ガラス
基板上に積層して形成されることとなる。
Further, the substrate does not need to be made of Sil, but may be made of an insulator such as glass, and in this case, the gate electrode will be formed in layers on the glass substrate.

本発明によると、丁度2つのジョセフソン効果素子が直
列に結合した形をとる事となり、ゲート電極を各々独立
に付けた場合には2ゲート電界効果ジヨセフソン・トラ
ンジスタとしての作用もあることとなる。
According to the present invention, exactly two Josephson effect elements are connected in series, and when the gate electrodes are attached independently, it also functions as a two-gate field effect Josephson transistor.

[発明の効果〕 本発明により量産性ある電界効果型ジョセフソン・トラ
ンジスタの構造が提供できる効果がある。
[Effects of the Invention] The present invention has the advantage of providing a field-effect Josephson transistor structure that can be mass-produced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す電界効果型ジョセフソ
ン・トランジスタの断面図である。 第2図は従来技術による電界効果型ジョセフソン・トラ
ンジスタの断面図である。 1. 2. 3. 4゜ 5. 6 ・ 7 ・ ・ ・ 8 ・ ・ ・ l 6 ・ ・ ・ Si S 10゜ ソース電極 ドレイン電極 ゲート電極 トンネル膜 フィールド絶縁膜 基板電極 トンネル・ギャップ 以上 出願人 セイコーエプソン株式会社
FIG. 1 is a sectional view of a field effect type Josephson transistor showing one embodiment of the present invention. FIG. 2 is a cross-sectional view of a field effect Josephson transistor according to the prior art. 1. 2. 3. 4゜5. 6 ・ 7 ・ ・ ・ 8 ・ ・ ・ l 6 ・ ・ ・ Si S 10° Source electrode Drain electrode Gate electrode Tunnel film Field insulating film Substrate electrode Tunnel gap and above Applicant Seiko Epson Corporation

Claims (1)

【特許請求の範囲】[Claims] ソース電極とドレイン電極とがギャップを有して設けら
れ、前記ソース電極とドレイン電極のギャップ内側壁に
は、トンネル膜が設けられ、該トンネル膜と直列に基板
電極が設けられると共に、前記トンネル膜に流れるトン
ネル電流を電界制御するゲート電極が誘電体膜を介して
形成されて成る事を特徴とする電界効果型ジョセフソン
・トランジスタ。
A source electrode and a drain electrode are provided with a gap, a tunnel film is provided on the inner wall of the gap between the source electrode and the drain electrode, a substrate electrode is provided in series with the tunnel film, and a substrate electrode is provided in series with the tunnel film. A field-effect Josephson transistor is characterized in that a gate electrode for electric field control of a tunnel current flowing through the transistor is formed through a dielectric film.
JP63268518A 1988-10-25 1988-10-25 Field effect josephson transistor Pending JPH02114679A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP63268518A JPH02114679A (en) 1988-10-25 1988-10-25 Field effect josephson transistor
FR898913548A FR2638569B1 (en) 1988-10-25 1989-10-17 JOSEPHSON FIELD-EFFECT TYPE TRANSISTOR AND METHOD FOR MANUFACTURING A JOSEPHSON JUNCTION
US07/423,969 US5071832A (en) 1988-10-25 1989-10-19 Field effect type josephson transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63268518A JPH02114679A (en) 1988-10-25 1988-10-25 Field effect josephson transistor

Publications (1)

Publication Number Publication Date
JPH02114679A true JPH02114679A (en) 1990-04-26

Family

ID=17459629

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63268518A Pending JPH02114679A (en) 1988-10-25 1988-10-25 Field effect josephson transistor

Country Status (1)

Country Link
JP (1) JPH02114679A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009107685A (en) * 2007-10-31 2009-05-21 Yoshino Kogyosho Co Ltd Two-agent mixing container

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63224374A (en) * 1987-03-13 1988-09-19 Semiconductor Energy Lab Co Ltd Superconducting element

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63224374A (en) * 1987-03-13 1988-09-19 Semiconductor Energy Lab Co Ltd Superconducting element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009107685A (en) * 2007-10-31 2009-05-21 Yoshino Kogyosho Co Ltd Two-agent mixing container

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