JPH0210462Y2 - - Google Patents
Info
- Publication number
- JPH0210462Y2 JPH0210462Y2 JP11404084U JP11404084U JPH0210462Y2 JP H0210462 Y2 JPH0210462 Y2 JP H0210462Y2 JP 11404084 U JP11404084 U JP 11404084U JP 11404084 U JP11404084 U JP 11404084U JP H0210462 Y2 JPH0210462 Y2 JP H0210462Y2
- Authority
- JP
- Japan
- Prior art keywords
- hole
- terminal
- cylindrical portion
- test pin
- cylindrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 5
- 239000000523 sample Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11404084U JPS6128065U (ja) | 1984-07-26 | 1984-07-26 | テストピン |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11404084U JPS6128065U (ja) | 1984-07-26 | 1984-07-26 | テストピン |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6128065U JPS6128065U (ja) | 1986-02-19 |
| JPH0210462Y2 true JPH0210462Y2 (instruction) | 1990-03-15 |
Family
ID=30673068
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11404084U Granted JPS6128065U (ja) | 1984-07-26 | 1984-07-26 | テストピン |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6128065U (instruction) |
-
1984
- 1984-07-26 JP JP11404084U patent/JPS6128065U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6128065U (ja) | 1986-02-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6822466B1 (en) | Alignment/retention device for connector-less probe | |
| US3537000A (en) | Electrical probe including pivotable contact elements | |
| JPH0210462Y2 (instruction) | ||
| US4075556A (en) | Test fixture for miniature capacitors | |
| JPH0548131Y2 (instruction) | ||
| JPH049580Y2 (instruction) | ||
| JPS62108874U (instruction) | ||
| JPH0533974Y2 (instruction) | ||
| JPH084102B2 (ja) | 半導体検査装置 | |
| JPS6331934B2 (instruction) | ||
| JPS63142762U (instruction) | ||
| JPS5828360Y2 (ja) | Icクリツプ | |
| JPH05183024A (ja) | 製品評価装置 | |
| JPH09152450A (ja) | 評価用プローブ固定ジャック | |
| JP2603981Y2 (ja) | 導電接触ピン | |
| KR200300719Y1 (ko) | 계측기용 단자 체결구조 | |
| JPH0524061Y2 (instruction) | ||
| JPS63294677A (ja) | Icソケツト | |
| JPS63109655U (instruction) | ||
| JPH04340471A (ja) | インサーキット・テスト用プローブ | |
| JPS633094Y2 (instruction) | ||
| JPS62106162U (instruction) | ||
| JPS60141563U (ja) | 導電塗膜抵抗値測定具 | |
| JPS60156466U (ja) | Icモジユ−ル検査装置 | |
| JPH04134074U (ja) | アダプタ |