JPH02103257U - - Google Patents
Info
- Publication number
- JPH02103257U JPH02103257U JP1078589U JP1078589U JPH02103257U JP H02103257 U JPH02103257 U JP H02103257U JP 1078589 U JP1078589 U JP 1078589U JP 1078589 U JP1078589 U JP 1078589U JP H02103257 U JPH02103257 U JP H02103257U
- Authority
- JP
- Japan
- Prior art keywords
- sample stage
- storage device
- metallic inclusions
- image information
- analysis device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003749 cleanliness Effects 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 238000000034 method Methods 0.000 claims description 2
- 239000013068 control sample Substances 0.000 claims 2
- 239000000463 material Substances 0.000 claims 2
- 239000000523 sample Substances 0.000 claims 2
- 229910000831 Steel Inorganic materials 0.000 claims 1
- 150000002739 metals Chemical class 0.000 claims 1
- 239000010959 steel Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1078589U JPH02103257U (enrdf_load_stackoverflow) | 1989-02-02 | 1989-02-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1078589U JPH02103257U (enrdf_load_stackoverflow) | 1989-02-02 | 1989-02-02 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02103257U true JPH02103257U (enrdf_load_stackoverflow) | 1990-08-16 |
Family
ID=31218751
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1078589U Pending JPH02103257U (enrdf_load_stackoverflow) | 1989-02-02 | 1989-02-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02103257U (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03269243A (ja) * | 1990-03-19 | 1991-11-29 | Toshiba Eng Co Ltd | 非金属介在物の検査装置 |
-
1989
- 1989-02-02 JP JP1078589U patent/JPH02103257U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03269243A (ja) * | 1990-03-19 | 1991-11-29 | Toshiba Eng Co Ltd | 非金属介在物の検査装置 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100969413B1 (ko) | 압흔 경도 시험 시스템 | |
| JP5132867B2 (ja) | 仮想顕微鏡スライドを形成し使用する方法および装置、ならびにプログラム | |
| KR910006221B1 (ko) | 자동조직해석처리장치 | |
| EP0928950A3 (en) | Method for detecting and examining slightly irregular surface states, and its use for fabricating liquid crystal display devices | |
| JP2960684B2 (ja) | 立体形状検出方法及びその装置 | |
| Hoy et al. | Surface quality assessment using computer vision methods | |
| JPS6117004A (ja) | 位置制御方法および装置 | |
| JPH02103257U (enrdf_load_stackoverflow) | ||
| JPH08505478A (ja) | 固体の１つの面の表面状態を制御する方法および関連する装置 | |
| JP3489275B2 (ja) | 硬度計 | |
| JP3132385B2 (ja) | 金属溶接部断面の検査位置決定方法 | |
| JPH0862503A (ja) | 顕微鏡装置 | |
| JP2002148200A (ja) | パーティクル計測方法及びこの計測装置 | |
| JP2000249640A (ja) | 硬度測定装置 | |
| JPH0334249A (ja) | 電子線マイクロアナライザー | |
| JP2939323B2 (ja) | 非金属介在物検査方法並びに非金属介在物検査装置 | |
| JPH084615Y2 (ja) | 非金属介在物の検査装置 | |
| JP2811345B2 (ja) | 非金属介在物の検査装置 | |
| JP4436523B2 (ja) | 基板検査装置 | |
| JPH0354064U (enrdf_load_stackoverflow) | ||
| CN223122850U (zh) | 一种高效的光学表面分析装置 | |
| CN218512325U (zh) | 一种检测拉丝模的固定装置 | |
| JP2869580B2 (ja) | 脱炭検査方法並びに脱炭検査装置 | |
| JPS6396536A (ja) | シヤルピ−試験片の破面率測定装置 | |
| JP2507254Y2 (ja) | 非金属介在物の検査装置 |