JPH0197189U - - Google Patents

Info

Publication number
JPH0197189U
JPH0197189U JP19198687U JP19198687U JPH0197189U JP H0197189 U JPH0197189 U JP H0197189U JP 19198687 U JP19198687 U JP 19198687U JP 19198687 U JP19198687 U JP 19198687U JP H0197189 U JPH0197189 U JP H0197189U
Authority
JP
Japan
Prior art keywords
test chamber
chamber
test
temperature
cooling disk
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19198687U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19198687U priority Critical patent/JPH0197189U/ja
Priority to US07/284,547 priority patent/US4918928A/en
Publication of JPH0197189U publication Critical patent/JPH0197189U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP19198687U 1987-12-17 1987-12-17 Pending JPH0197189U (enExample)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP19198687U JPH0197189U (enExample) 1987-12-17 1987-12-17
US07/284,547 US4918928A (en) 1987-12-17 1988-12-15 Apparatus for testing IC devices at low temperature and cooling bag for use in testing IC devices at low temperature

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19198687U JPH0197189U (enExample) 1987-12-17 1987-12-17

Publications (1)

Publication Number Publication Date
JPH0197189U true JPH0197189U (enExample) 1989-06-28

Family

ID=31482868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19198687U Pending JPH0197189U (enExample) 1987-12-17 1987-12-17

Country Status (1)

Country Link
JP (1) JPH0197189U (enExample)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54115189A (en) * 1978-02-28 1979-09-07 Toshiba Corp Low temperature conveyor unit
JPS5717871A (en) * 1980-07-04 1982-01-29 Mitsubishi Electric Corp Environment test device
JPS5759450B2 (enExample) * 1975-12-17 1982-12-15 Sumitomo Electric Industries

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5759450B2 (enExample) * 1975-12-17 1982-12-15 Sumitomo Electric Industries
JPS54115189A (en) * 1978-02-28 1979-09-07 Toshiba Corp Low temperature conveyor unit
JPS5717871A (en) * 1980-07-04 1982-01-29 Mitsubishi Electric Corp Environment test device

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