JPH0192858A - Test system for main memory unit - Google Patents

Abstract

PURPOSE:To prevent the logic of a test program from being complicated by providing a logical device itself with a storage means different from a main memory unit and storing the rest program for the main memory unit to be a device to be tested in the storage means. CONSTITUTION:An execution control means 11 reads out a test program loaded to the main memory unit (MMU) 20 through a signal line 55 and executes the test program. The test program transfers itself to the storage means 13 in the logical device (CPU) 10 through a signal line 57 and at the completion of the transfer, transfers control to a test routine in the MMU 20 itself. Then, an execution control means 11 reads out the test routine through a signal line 15 and executes the read test routine to execute the test of the MMU 20. Thus, program design can be easily executed.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a computer system, and particularly to a test method for a main memory device.

[Conventional technology]

Conventionally, in testing this type of main memory device, a test program of the main memory device is stored in the main memory device that is the device under test, and areas other than the area where the test program is stored are tested.

[Problem that the invention seeks to solve]

The conventional main memory test method described above stores the test program in the main memory itself, which is the device under test, and therefore has the disadvantage that it is not possible to test the part where the test program is stored. . Moreover, in order to solve this drawback, the test program is moved to another area within the main storage device, and then the test program is started again.

There is also a method of testing the part where the test program was previously stored. However, in order to employ this method, the test program must be made relocatable (relocatable), which has the disadvantage of complicating program design.

[Failure to solve the problem]

A test method for a main memory device according to the present invention includes: a storage means for storing a program; an execution control means for executing instructions based on the program stored in the storage means;
a logical device having bootloading means;

Main memory for storing programs.

and an input/output control device having means for storing data from an external storage device into the storage means or the main storage device based on instructions from the logical device.

The execution control means is characterized in that the test program stored in the main storage device stored in the external storage device is stored in the storage device and executed.

〔Example〕

Next, two embodiments of the present invention will be described with reference to the drawings.

Referring to FIG. 1, one embodiment of the present invention includes a logic device (
It has a CPU (hereinafter abbreviated as CPU) 10, a main storage device 20, an input/output control bag a 30, and an external storage device 40.

The CPU 10 includes an execution control means 11 that controls program execution, a boot load means 12, and a storage means 13. 14 is a control line for instructing boot loading means 12 from execution control means 11; 15 is a control line for reading a test program stored in storage means 13;

The data line 51 for execution is the boot load means 1
2 is a control line for instructing the input/output control device 30 to read the program loader stored in the external storage device 40; 52 is a data line for reading the program from the external storage device 40;

53 is a data line for transferring the program to the main storage device 20; 54 is a line from the external storage device 40 to the main storage device 20;
A control line 55 is a data line used by the execution control means 11 to read and write data from the main storage device 20, and 56 is a data line for the execution control means 11 to input. A control line 57 is used to instruct the output control device 30 to perform input/output operations, and a data line 57 is used to transfer data between the main storage device 20 and the storage means 11.

Next, the operation of the two embodiments will be explained.

Now, the external storage device 40 is sent to the CPU 10 from the outside.
Assume that an instruction is given to load a test program stored in the main memory (hereinafter referred to as "main memory") 20 into the MMU 20. The execution control means 11 of the CPU 10 is
The bootload means 12 is activated via the signal line 14.

The boot load means 12 is connected to an input/output control device (hereinafter referred to as an input/output control device) via a signal line 51.

The IOC 30 is instructed to load a program loader from the external storage device 40 into the MMU 20 . When the IOC 30 loads the program loader from the external storage device 40 to the MMU 20 via the signal lines 52 and 53, it reports the completion notification to the execution control means 11 via the signal line 54.

Next, the execution control means 11 reads the program loader loaded into the MMU 20 via the signal line 55 and executes it. The program loader instructs the I0C 30 via signal line 56 to load the test program from the external storage device 40 into the MMU 20 (7). IOC30 sends this test program to signal line 5.
2 and 53, the completion notification is reported to the execution control means 11 via the signal line 54.

Thereafter, the execution control means 11 reads the test program loaded into the MMU 20 via the signal line 55 and executes it. The test program once again transfers itself to the storage means 13 of the CPU 10 via the signal line 57, and when the transfer is completed, reads and executes the MMIJ 20 in itself to test the main storage device 20.

〔Effect of the invention〕

As explained above, one aspect of the present invention is to provide the logical device itself with a storage means separate from the main storage device, and to store and execute the test program for the main storage device, which is the device under test, in the storage means. This has the effect that it is possible to completely test the main memory, and to avoid complicating the logic of the test program.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing an embodiment of the present invention. 10...Logic device, 11...Execution control means, 12.
...Bootload means, 13...Storage means, 14...
- Control line, 15... Data line, 20... Main storage device, 30... Input/output control device, 40... External storage device, 51° 54.56... Control line, 52, 53 ,55,
57...Data line. Figure 1

Claims (1)

[Scope of Claims] 1. A logic device having a storage means for storing a program, an execution control means for executing instructions based on the program stored in the storage means, and a bootloading means, and a program. and an input/output control device having means for storing data from an external storage device into the storage means or the main storage device based on instructions from the logical device, A testing method for a main storage device, characterized in that the means stores a test program for the main storage device stored in the external storage device in the storage device and executes it.