JPH0192752U - - Google Patents
Info
- Publication number
- JPH0192752U JPH0192752U JP18852487U JP18852487U JPH0192752U JP H0192752 U JPH0192752 U JP H0192752U JP 18852487 U JP18852487 U JP 18852487U JP 18852487 U JP18852487 U JP 18852487U JP H0192752 U JPH0192752 U JP H0192752U
- Authority
- JP
- Japan
- Prior art keywords
- analysis tube
- sample
- time
- ion
- flight
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004458 analytical method Methods 0.000 claims description 4
- 238000010884 ion-beam technique Methods 0.000 claims description 2
- 230000007935 neutral effect Effects 0.000 claims description 2
- 239000003973 paint Substances 0.000 claims description 2
- 239000002245 particle Substances 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000004949 mass spectrometry Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 230000001052 transient effect Effects 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18852487U JPH0355239Y2 (US07321065-20080122-C00160.png) | 1987-12-11 | 1987-12-11 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18852487U JPH0355239Y2 (US07321065-20080122-C00160.png) | 1987-12-11 | 1987-12-11 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0192752U true JPH0192752U (US07321065-20080122-C00160.png) | 1989-06-19 |
| JPH0355239Y2 JPH0355239Y2 (US07321065-20080122-C00160.png) | 1991-12-09 |
Family
ID=31479611
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18852487U Expired JPH0355239Y2 (US07321065-20080122-C00160.png) | 1987-12-11 | 1987-12-11 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0355239Y2 (US07321065-20080122-C00160.png) |
-
1987
- 1987-12-11 JP JP18852487U patent/JPH0355239Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0355239Y2 (US07321065-20080122-C00160.png) | 1991-12-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6251144A (ja) | 質量分析計 | |
| JPS58110956U (ja) | 荷電粒子照射装置 | |
| JPH0192752U (US07321065-20080122-C00160.png) | ||
| GB1222577A (en) | Improvements in and relating to ion cyclotron resonance mass spectrometers | |
| JPH0229151U (US07321065-20080122-C00160.png) | ||
| GB1445963A (en) | Ion beam apparatus | |
| JPS5971158U (ja) | オ−ジエ電子分光装置 | |
| JPS6132954U (ja) | 荷電粒子線分析装置 | |
| JPS5857065U (ja) | 表面分析装置 | |
| JPH05251035A (ja) | スパッタ中性粒子質量分析装置 | |
| JP3055159B2 (ja) | 中性粒子質量分析装置 | |
| JPS6245423Y2 (US07321065-20080122-C00160.png) | ||
| JPS5986655U (ja) | 質量分析装置等用イオン源 | |
| JPH02118254U (US07321065-20080122-C00160.png) | ||
| JPS63106055U (US07321065-20080122-C00160.png) | ||
| JPH11185696A (ja) | 飛行時間型質量分析装置 | |
| JPH0189454U (US07321065-20080122-C00160.png) | ||
| JPS5835345B2 (ja) | マイクロプロ−ブ二次イオン質量分析計 | |
| JPH046257B2 (US07321065-20080122-C00160.png) | ||
| JPS6245424Y2 (US07321065-20080122-C00160.png) | ||
| JPS58157958U (ja) | 電子分光装置 | |
| JPS58172864U (ja) | イオンマイクロアナライザ−用試料室 | |
| JPS645745B2 (US07321065-20080122-C00160.png) | ||
| JPS6296259U (US07321065-20080122-C00160.png) | ||
| JPS59201357A (ja) | 二次イオン質量分析計 |
