JPH0187271U - - Google Patents

Info

Publication number
JPH0187271U
JPH0187271U JP18333587U JP18333587U JPH0187271U JP H0187271 U JPH0187271 U JP H0187271U JP 18333587 U JP18333587 U JP 18333587U JP 18333587 U JP18333587 U JP 18333587U JP H0187271 U JPH0187271 U JP H0187271U
Authority
JP
Japan
Prior art keywords
signal
calibration
drive
output
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18333587U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0736300Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987183335U priority Critical patent/JPH0736300Y2/ja
Publication of JPH0187271U publication Critical patent/JPH0187271U/ja
Application granted granted Critical
Publication of JPH0736300Y2 publication Critical patent/JPH0736300Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Tests Of Electronic Circuits (AREA)
JP1987183335U 1987-11-30 1987-11-30 タイミング校正装置 Expired - Lifetime JPH0736300Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987183335U JPH0736300Y2 (ja) 1987-11-30 1987-11-30 タイミング校正装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987183335U JPH0736300Y2 (ja) 1987-11-30 1987-11-30 タイミング校正装置

Publications (2)

Publication Number Publication Date
JPH0187271U true JPH0187271U (enrdf_load_html_response) 1989-06-08
JPH0736300Y2 JPH0736300Y2 (ja) 1995-08-16

Family

ID=31474757

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987183335U Expired - Lifetime JPH0736300Y2 (ja) 1987-11-30 1987-11-30 タイミング校正装置

Country Status (1)

Country Link
JP (1) JPH0736300Y2 (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001183432A (ja) * 1999-12-28 2001-07-06 Advantest Corp タイミング調整方法、半導体試験装置におけるタイミングキャリブレーション方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5915875A (ja) * 1982-05-25 1984-01-26 フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン 自動テスト装置に於けるインタ−フエ−ス回路の歪補正
JPS60138479A (ja) * 1983-12-26 1985-07-23 Advantest Corp 論理回路試験装置
JPS60151568A (ja) * 1984-01-20 1985-08-09 Hitachi Electronics Eng Co Ltd 集積回路用テスタ
JPS61286768A (ja) * 1985-06-13 1986-12-17 Hitachi Ltd テスト装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5915875A (ja) * 1982-05-25 1984-01-26 フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン 自動テスト装置に於けるインタ−フエ−ス回路の歪補正
JPS60138479A (ja) * 1983-12-26 1985-07-23 Advantest Corp 論理回路試験装置
JPS60151568A (ja) * 1984-01-20 1985-08-09 Hitachi Electronics Eng Co Ltd 集積回路用テスタ
JPS61286768A (ja) * 1985-06-13 1986-12-17 Hitachi Ltd テスト装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001183432A (ja) * 1999-12-28 2001-07-06 Advantest Corp タイミング調整方法、半導体試験装置におけるタイミングキャリブレーション方法

Also Published As

Publication number Publication date
JPH0736300Y2 (ja) 1995-08-16

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